Structural and Morphological Differences of Thin Films Obtained by Plasma Polymerization of Pyrrole (Ppy) and Thiophene (Pth)

2002 ◽  
Vol 725 ◽  
Author(s):  
Salvador Borrós ◽  
M.Paz Diago ◽  
Joan Esteve ◽  
Núria Agulló
Keyword(s):  
Thin Films ◽  
Electrical Conductivity ◽  
Photoelectron Spectroscopy ◽  
Plasma Polymerization ◽  
Morphological Characterization ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Morphological Differences

AbstractIn this work, thin films (thickness ∼ 0.5 μm) were obtained by plasma polymerization of pyrrole (Ppy) and thiophene (Pth) at 25-30 W and 0.1-0.2 mbar of pressure. Further doping with iodine was carried out to some of the Ppy and Pth films (Ppy/I2, Pth/I2) in order to enhance their electrical conductivity properties.Structural and morphological characterization of both Ppy and Pth as well as of Ppy/I2 and Pth/I2 was performed using Infrared Spectroscopy (IR), X-ray Photoelectron Spectroscopy (XPS) and Atomic Force Microscopy (AFM).In the light of the information given by IR, XPS and AFM techniques, exhaustive and accurate description of both undoped and I2/doped Ppy and Pth films obtained by Plasma Polymerization is attained.

Characterization of Multiple Functional Solid Line of Graphite Ink Surface Printed by Micro-Flexographic

2015 ◽  
Vol 752-753 ◽  
pp. 1379-1383
Author(s):  
M.I. Maksud ◽  
Mohd Sallehuddin Yusof ◽  
Zaidi Embong
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Printing Plate ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Flexographic Printing ◽  
Scanning Electron

The purpose of this paper is to study a ink surface morphology, quantify the chemical composition involved in processing of graphite ink printed by flexographic printing. The methodology is to use surface sensitive technique, X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) and Field Emission Scanning Electron Microscopy (FESEM). As a finding we successfully achieved 25 micron lines array using PDMS printing plate. The Originality and value of this work is surface sensitive techniques like XPS, AFM and FESEM were exclusively used in order to characterize graphite inks printed by flexographic method, using PDMS printing plate.

Synthesis and Characterization of Nb-Doped TiO2 Thin Films Prepared by RF Magnetron Sputtering

2015 ◽  
Vol 1117 ◽  
pp. 139-142 ◽  
Author(s):  
Marius Dobromir ◽  
Radu Paul Apetrei ◽  
A.V. Rogachev ◽  
Dmitry L. Kovalenko ◽  
Dumitru Luca
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Photoelectron Spectroscopy ◽  
Rf Magnetron Sputtering ◽  
X Ray ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Diffraction Patterns

Amorphous Nb-doped TiO2 thin films were deposited on (100) Si and glass substrates at room temperature by RF magnetron sputtering and a mosaic-type Nb2O5-TiO2 sputtering target. To adjust the amount of the niobium dopant in the film samples, appropriate numbers of Nb2O5 pellets were placed on the circular area of the magnetron target with intensive sputtering. By adjusting the discharge conditions and the number of niobium oxide pellets, films with dopant content varying between 0 and 16.2 at.% were prepared, as demonstrated by X-ray photoelectron spectroscopy data. The X-ray diffraction patterns of the as-deposited samples showed the lack of crystalline ordering in the samples. Surfaces roughness and energy band gap values increase with dopant concentration, as showed by atomic force microscopy and UV-Vis spectroscopy measurements.

scholarly journals Synthesis and Characterization of Strontium Titanate Nanoparticles as Potential High Temperature Oxygen Sensor Material

2006 ◽  
Vol 2006 ◽  
pp. 1-6 ◽  
Author(s):  
Florian Voigts ◽  
Tanja Damjanovic ◽  
Günter Borchardt ◽  
Christos Argirusis ◽  
Wolfgang Maus-Friedrichs
Keyword(s):  
High Temperature ◽  
Strontium Titanate ◽  
Photoelectron Spectroscopy ◽  
Oxygen Sensor ◽  
Ambient Conditions ◽  
X Ray ◽  
Sensor Material ◽  
Force Microscopy ◽  
Atomic Force

We present a simple and highly reproductive method for the preparation of thin films consisting of strontium titanate nanoparticles. The films are produced by spin coating of a sol on silicon targets and subsequent annealing under ambient conditions. Analysis by atomic force microscopy shows particles with typical sizes between 10 nm and 50 nm. X-ray photoelectron spectroscopy displays a stoichiometry of the films as anticipated from preliminary experiments with strontium titanate single crystals. Metastable-induced electron spectroscopy and ultraviolet photoelectron spectroscopy are used as tools to give evidence to the similar electronic properties of nanoparticle film and single crystal. These results support the prospect for an application of the nanoparticle films as high temperature oxygen sensor with superior properties.

CHARACTERIZATION OF ALUMINUM SURFACES AFTER DIFFERENT PRETREATMENTS AND EXPOSURE TO SILANE COUPLING AGENTS

2001 ◽  
Vol 08 (01n02) ◽  
pp. 43-50 ◽  
Author(s):  
M. KONO ◽  
X. SUN ◽  
R. LI ◽  
K. C. WONG ◽  
K. A. R. MITCHELL ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Coupling Agents ◽  
Chemical Compositions ◽  
Silane Coupling Agents ◽  
Oh Groups ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Aluminum Surfaces

X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM) and scanning electron microscopy (SEM) have been used to characterize surfaces of aluminum which have been pretreated by mechanical polishing, acid etching and alkaline etching, as well as given subsequent exposures to air and water. These surfaces can differ markedly with regard to their chemical compositions and topographical structures. Characterizations of these surfaces after exposures to three organosilanes, γ-GPS, BTSE and γ-APS, indicate that the amount of silane adsorbed in each case shows a tendency to increase both with the number of OH groups detected at the oxidized aluminum and with the surface roughness. The XPS data are consistent with the adhesion of γ-APS occurring through H bonding, especially via NH3+ groups.

Surface Characterization of Electrochemically Fabricated CuO Doped ZnO Thin Film

2005 ◽  
Vol 277-279 ◽  
pp. 972-976
Author(s):  
Jang Hee Yoon ◽  
Yoon Bo Shim ◽  
Chae Ryong Cho ◽  
Mi Sook Won
Keyword(s):  
Photoelectron Spectroscopy ◽  
Surface Characterization ◽  
Reference Electrode ◽  
Cathodic Current ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Zn Concentration ◽  
Solution Doping

In this study, ZnO and CuO doped zinc oxide thin films were cathodically deposited in aqueous zinc chloride solutions in the presence of oxygen on a Pt/Ti/SiO2/Si substrate through an electrochemical reaction. A mercurous sulfate electrode was used as a reference electrode and the counter electrode was a Pt spiral wire. Deposition was carried out in solutions containing Zn2+ ions introduced as ZnCl2 salt at concentrations ranging from 5.0 x 10-4 to 5.0 x 10-2 M. The bath temperatures were controlled from 65°C to 80°C. The oxygen gas was introduced from argon/oxygen mixtures allowing its partial pressure to be fixed along with its concentration in the solution. Doping of CuO was carried out in cupric nitrate or a cupric chloride/0.1M KCl solution. The influence of the Cu/Zn concentration, deposition temperature of a solution, applied cathodic potential and deposition time were optimized. After the potential was applied, the cathodic current reached a steady state within 5 min. The composition, and the characterization of the surface of the films were investigated through X-ray diffractometry, X-ray photoelectron spectroscopy, atomic force microscopy and scanning electron microscopy.

Characterization of thin films for X-ray and neutron waveguiding by X-ray reflectivity and atomic force microscopy

2013 ◽  
Vol 210 (11) ◽  
pp. 2416-2422 ◽  
Author(s):  
Daniele Pelliccia ◽  
Sasikaran Kandasamy ◽  
Michael James
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

Atomic force microscopy and X-ray photoelectron spectroscopy characterization of low-energy ion sputtered mica

2007 ◽  
Vol 601 (13) ◽  
pp. 2735-2739 ◽  
Author(s):  
Renato Buzio ◽  
Andrea Toma ◽  
Andrea Chincarini ◽  
Francesco Buatier de Mongeot ◽  
Corrado Boragno ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Photoelectron Spectroscopy ◽  
Low Energy ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Effects of Deposition Time on the Morphology, Structure, and Optical Properties of PbS Thin Films Prepared by Chemical Bath Deposition

2018 ◽  
Vol 2018 ◽  
pp. 1-8 ◽  
Author(s):  
B. Abdallah ◽  
A. Ismail ◽  
H. Kashoua ◽  
W. Zetoun
Keyword(s):  
Thin Films ◽  
Chemical Bath Deposition ◽  
Photoelectron Spectroscopy ◽  
Deposition Time ◽  
Optical Band Gap ◽  
Optical Transmittance ◽  
Xrd Analysis ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

Lead sulfide thin films were prepared by chemical bath deposition (CBD) on both glass and Si (100) substrates. XRD analysis of the PbS film deposited at 25°C showed that the prepared films have a polycrystalline structure with (200) preferential orientation. Larger grains could be obtained by increasing the deposition time. The prepared films were also chemically characterized using X-ray photoelectron spectroscopy (XPS), which confirmed the presence of lead and sulfur as PbS. While energy dispersive X-ray spectroscopy (EDX) technique was used to verify the stoichiometry of the prepared films. Atomic force microscopy (AFM) was used to study the change in the films’ morphology with the deposition time. The effect of the deposition time, on both optical transmittance in the UV-Vis-NIR region and the structure of the film, was studied. The obtained results demonstrated that the optical band gap decreased when the thickness increased.

scholarly journals Structure and Oligonucleotide Binding Efficiency of Differently Prepared Click Chemistry-Type DNA Microarray Slides Based on 3-Azidopropyltrimethoxysilane

Materials ◽  
2021 ◽  
Vol 14 (11) ◽  
pp. 2855
Author(s):  
Emilia Frydrych-Tomczak ◽  
Tomasz Ratajczak ◽  
Łukasz Kościński ◽  
Agnieszka Ranecka ◽  
Natalia Michalak ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Dna Microarrays ◽  
Structural Characteristics ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Glass Slides ◽  
Surface Modified ◽  
Oligonucleotide Binding

The structural characterization of glass slides surface-modified with 3-azidopropyltrimethoxysilane and used for anchoring nucleic acids, resulting in the so-called DNA microarrays, is presented. Depending on the silanization conditions, the slides were found to show different oligonucleotide binding efficiency, thus, an attempt was made to correlate this efficiency with the structural characteristics of the silane layers. Atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS) and X-ray reflectometry (XRR) measurements provided information on the surface topography, chemical composition and thickness of the silane films, respectively. The surface for which the best oligonucleotides binding efficiency is observed, has been found to consist of a densely-packed silane layer, decorated with a high-number of additional clusters that are believed to host exposed azide groups.

Sign in / Sign up

Export Citation Format

Share Document