Composition of uranium oxide surface layers analyzed by μ-Raman Spectroscopy
Keyword(s):
AbstractOxide thickness and composition averaged over a few square millimeter have been measured with nm thickness resolution by diffuse reflectance Fourier transform infrared (FTIR) spectroscopy. μ-Raman spectroscopy has been done on powders and bulk samples in the past, and can now be done on surfaces layers with μm lateral and depth resolution using con-focal microscopy. Here we apply con-focal-microscopy-based μ -Raman spectroscopy to a freshly polished/lightly oxidized and to heavily oxidized uranium to determine its sensitivity. The spectra show that μ-Raman spectroscopy does detect oxide thickness and oxide composition with high sensitivity.
1993 ◽
Vol 89
(11)
◽
pp. 1783
◽
Keyword(s):
1997 ◽
Vol 25
(6)
◽
pp. 417-427
◽
Keyword(s):
1993 ◽
Vol 48
(3)
◽
pp. 223-237
◽