Ion-Beam-Induced Structure Fragmentation and Dewetting in Au/Ti Films

2021 ◽  
Author(s):  
Camilla Ferreira de Sá Codeço ◽  
Sérgio Luiz de Abreu Melo ◽  
Bárbara da Fonseca Magnani ◽  
Marcelo Martins Sant'Anna
Keyword(s):  
Ion Beam ◽  
Induced Structure ◽  
Ti Films

Ion-beam-induced structure fragmentation and dewetting in Au/Ti films

Materialia ◽  
2021 ◽  
Vol 20 ◽  
pp. 101214
Author(s):  
C.F.S. Codeço ◽  
S.L.A. Mello ◽  
B.F. Magnani ◽  
M.M. Sant'Anna
Keyword(s):  
Ion Beam ◽  
Induced Structure ◽  
Ti Films

Ion beam mixing of hydrogenated multilayer FeTi and NiTi films

1987 ◽  
Vol 90 ◽  
pp. 13-19 ◽  
Author(s):  
J.-P. Hirvonen ◽  
M.A. Elve ◽  
J.W. Mayer ◽  
H.H. Johnson
Keyword(s):  
Ion Beam ◽  
Ion Beam Mixing ◽  
Ti Films

Ion Beam Analysis of the Annealing Behavior of Helium in Ti Films

2009 ◽  
Vol 26 (4) ◽  
pp. 042501
Author(s):  
He Zhi-Jiang ◽  
Shi Li-Qun ◽  
Liu Chao-Zhuo ◽  
Zhang Lei ◽  
Lu Yong-Fang ◽  
...  
Keyword(s):  
Ion Beam ◽  
Ion Beam Analysis ◽  
Annealing Behavior ◽  
Beam Analysis ◽  
Ti Films

Effect of Electron Beam Irradiation-Enhanced Diffusion on A W-Aluminum Oxide-Ti/Cu Multilayer

1998 ◽  
Vol 540 ◽  
Author(s):  
S. Ohta ◽  
H. Takahashi
Keyword(s):  
Aluminum Oxide ◽  
Electron Irradiation ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Oxide Phase ◽  
Rf Magnetron Sputtering ◽  
Cross Sectional ◽  
Thin Foils ◽  
Diffraction Patterns ◽  
Ti Films

AbstractTungsten, aluminum oxide and Ti films were deposited onto a Cu substrate by means of a rf magnetron sputtering method. TEM thin foils for cross-sectional irradiation were prepared using a focused ion beam (FIB). Electron irradiation was carried out in a Hitachi H- 1300 electron microscope at I MV. The specimen temperatures during irradiation were 300, 473, 623 and 703K. The phases of W, aluminum oxide and Ti films were identified from selected area diffraction patterns as bcc, amorphous and hcp phases, respectively. The phases of W and Ti did not change due to irradiation. However, the amorphous aluminum oxide phase transformed to crystalline γ-Aluminum oxide. Electron irradiation caused no change in the composition of the interface of W/aluminum oxide, but diffusion was enhanced on the interfaces of aluminum oxide/Ti and Ti/Cu.

Adhesion and Tribological Properties of Ag and Ag/Ti Films on Zro2 Ceramic Substrates After Heat Treatment at 250°C

1991 ◽  
Vol 239 ◽  
Author(s):  
J. H. Hsieh ◽  
O. O. Ajayi ◽  
A. Erdemir ◽  
F. A. Nichols
Keyword(s):  
Heat Treatment ◽  
Tribological Properties ◽  
Ion Beam ◽  
Negative Effects ◽  
Ceramic Substrates ◽  
Ion Beam Assisted Deposition ◽  
Before And After ◽  
Pin On Disc ◽  
The Relationship ◽  
Ti Films

ABSTRACTAg and Ag/Ti films were deposited on ZrO2 substrates by ion-beam-assisted deposition. Adhesion of these films was measured before and after heat treatment at 250°C in air. The results show that a graded interface between Ag and Ti was necessary for the Ag films to survive the heat treatment. Reciprocating pin-on-disc tests were performed at 150°C after heat treatment to investigate the relationship between adhesion and tribological properties. The failure of Ag and Ag/Ti (without graded interface) films was also observed during wear tests. However, this Ag film failure did not result in negative effects. All three Ag-coated substrates show better tribological behavior.

Microanalysis of Ti films on iron-base material by dynamic ion beam mixing

1995 ◽  
Vol 148 (2) ◽  
pp. 453-458
Author(s):  
N. K. Huang ◽  
Z. Lu ◽  
D. Z. Wang ◽  
L. B. Lin
Keyword(s):  
Ion Beam ◽  
Base Material ◽  
Ion Beam Mixing ◽  
Iron Base ◽  
Iron Base Material ◽  
Ti Films

scholarly journals Ion-Beam Mixing in Amorphous and Crystalline Fe-Ti

1988 ◽  
Vol 128 ◽  
Author(s):  
Udo Scheuer ◽  
Lynn E. Rehn ◽  
Pete Baldo
Keyword(s):  
Amorphous Materials ◽  
Ion Beam ◽  
Ion Beam Mixing ◽  
Rutherford Back Scattering ◽  
Enhanced Diffusion ◽  
Voltage Electron ◽  
Radiation Enhanced Diffusion ◽  
Bcc Phase ◽  
Ti Films

ABSTRACTCrystalline Fe and Fe-10at.%Ti and amorphous Fe-37at.%Ti films with Ag and Hf markers were produced by vapor deposition. Marker spreading during ion-beam mixing between 77 K and 580 K was measured using Rutherford Back-scattering (RBS). Marker spreading was also measured between temperatures of 300 K to 700 K after full crystallization of the Fe-37at.%Ti films. Microstructural changes during ion-beam mixing were studied in situ, in a High-Voltage Electron Microscope. Homogeneous nucleation of a metastable bcc phase, was observed at high temperatures. The results are discussed in terms of their relevance to “radiation-enhanced” diffusion in amorphous materials.

Effect of temperature on residual stress and mechanical properties of Ti films prepared by both ion implantation and ion beam assisted deposition

2009 ◽  
Vol 255 (8) ◽  
pp. 4484-4490 ◽  
Author(s):  
Yue He ◽  
Jizhong Zhang ◽  
Wenqing Yao ◽  
Dexing Li ◽  
Xu Teng
Keyword(s):  
Mechanical Properties ◽  
Residual Stress ◽  
Ion Implantation ◽  
Ion Beam ◽  
Effect Of Temperature ◽  
Ion Beam Assisted Deposition ◽  
Ti Films
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