scholarly journals Device Performance Analysis of Graphene Nanoribbon Field-Effect Transistor with Rare-Earth Oxide (La2O3) Based High-k Gate Dielectric

Author(s):  
M. K. Bera
2008 ◽  
Vol 93 (19) ◽  
pp. 193501 ◽  
Author(s):  
M. Ziaur Rahman Khan ◽  
D. G. Hasko ◽  
M. S. M. Saifullah ◽  
M. E. Welland

Sign in / Sign up

Export Citation Format

Share Document