DAC Testing Using Modulated Signals

2011 ◽  
Vol 18 (2) ◽  
pp. 283-294 ◽  
Author(s):  
Pavel Fexa ◽  
Josef Vedral ◽  
Jakub Svatoš
Keyword(s):  
Sine Wave ◽  
Test Methods ◽  
Testing Time ◽  
Effective Number ◽  
Signal To Noise ◽  
Frequency Signal ◽  
Digital To Analog Converters ◽  
Fm Signals ◽  
Dynamical Parameters ◽  
Modulated Signals

DAC Testing Using Modulated Signals This document analyses qualities of methods used for testing dynamical parameters of Digital-to-Analog Converters (DAC) using a multi-frequency signal. As the source for these signals, Amplitude Modulated (AM) and Frequency Modulated (FM) signals are used. These signals are often used in radio engineering. Results of the tests, like Effective Number of Bits (ENOB), Signal-to-Noise and Distortion (SINAD), are evaluated in the frequency domain and they are compared with standard results of Sine Wave FFT test methods. The aim of this research is firstly to test whether it is possible to test a DAC using modulated signals, secondly to reduce testing time, while estimating band performance of DAC.

DAC Testing Using Impulse Signals

2012 ◽  
Vol 19 (1) ◽  
pp. 105-114 ◽  
Author(s):  
Josef Vedral ◽  
Pavel Fexa
Keyword(s):  
Frequency Domain ◽  
Sine Wave ◽  
Testing Time ◽  
Dynamic Parameters ◽  
Effective Number ◽  
Signal To Noise ◽  
Crest Factor ◽  
Multiple Tests ◽  
Digital To Analog Converters ◽  
Band Signal

DAC Testing Using Impulse SignalsThe Multi-Tone (MT) signal with uniform amplitudes can be used for DAC testing. This paper shows an easier way to generate a MT signal using several impulse signals. The article also analyzes qualities of methods for testing the dynamic parameters of Digital to Analog Converters using an impulse signal. The MT, Damped Sine Wave (DSW) and Sinx/x (SINC) signals will be used as the source for these tests. The Effective Number of Bits (ENOB) and Signal to noise and distortion (SINAD) are evaluated in the frequency domain and they are modified using theCrest Factor(CF) correction and compared with the standard results of the Sine Wave FFT test. The first advantage of the test using an impulse signal is that you need fewer input parameters to create the band signal for testing the DAC. The second one is to reduce the testing time using a band signal in comparison with multiple tests using a single sine wave.

An Improved Acquisition Method for High-Order BOC-Modulated Signals Based on Fractal Geometry

2013 ◽  
Vol 846-847 ◽  
pp. 1185-1188 ◽  
Author(s):  
Hua Bing Wu ◽  
Jun Liang Liu ◽  
Yuan Zhang ◽  
Yong Hui Hu
Keyword(s):  
Fractal Geometry ◽  
Output Signal ◽  
Signal To Noise Ratio ◽  
High Order ◽  
Main Peak ◽  
Signal To Noise ◽  
Binary Offset Carrier ◽  
Simulation Results ◽  
Modulated Signals ◽  
Acquisition Method

This paper proposes an improved acquisition method for high-order binary-offset-carrier (BOC) modulated signals based on fractal geometry. We introduced the principle of our acquisition method, and outlined its framework. We increase the main peak to side peaks ratio in the BOC autocorrelation function (ACF), with a simple fractal geometry transform. The proposed scheme is applicable to both generic high-order sine-and cosine-phased BOC-modulated signals. Simulation results show that the proposed method increases output signal to noise ratio (SNR).

Denoising for full-waveform inversion with expanded prediction-error filters

Geophysics ◽  
2021 ◽  
pp. 1-54
Author(s):  
Milad Bader ◽  
Robert G. Clapp ◽  
Biondo Biondi
Keyword(s):  
High Frequency ◽  
Prediction Error ◽  
Signal To Noise Ratio ◽  
Waveform Inversion ◽  
Low Frequency ◽  
Full Waveform Inversion ◽  
Frequency Data ◽  
Signal To Noise ◽  
Frequency Signal ◽  
Full Waveform

Low-frequency data below 5 Hz are essential to the convergence of full-waveform inversion towards a useful solution. They help build the velocity model low wavenumbers and reduce the risk of cycle-skipping. In marine environments, low-frequency data are characterized by a low signal-to-noise ratio and can lead to erroneous models when inverted, especially if the noise contains coherent components. Often field data are high-pass filtered before any processing step, sacrificing weak but essential signal for full-waveform inversion. We propose to denoise the low-frequency data using prediction-error filters that we estimate from a high-frequency component with a high signal-to-noise ratio. The constructed filter captures the multi-dimensional spectrum of the high-frequency signal. We expand the filter's axes in the time-space domain to compress its spectrum towards the low frequencies and wavenumbers. The expanded filter becomes a predictor of the target low-frequency signal, and we incorporate it in a minimization scheme to attenuate noise. To account for data non-stationarity while retaining the simplicity of stationary filters, we divide the data into non-overlapping patches and linearly interpolate stationary filters at each data sample. We apply our method to synthetic stationary and non-stationary data, and we show it improves the full-waveform inversion results initialized at 2.5 Hz using the Marmousi model. We also demonstrate that the denoising attenuates non-stationary shear energy recorded by the vertical component of ocean-bottom nodes.

STOCHASTIC RESONANCE IN CHUA’S CIRCUIT DRIVEN BY AMPLITUDE OR FREQUENCY MODULATED SIGNALS

1994 ◽  
Vol 04 (02) ◽  
pp. 441-446 ◽  
Author(s):  
V.S. ANISHCHENKO ◽  
M.A. SAFONOVA ◽  
L.O. CHUA
Keyword(s):  
Numerical Simulation ◽  
Stochastic Resonance ◽  
Signal To Noise Ratio ◽  
Point Of View ◽  
Chua’S Circuit ◽  
Signal Distortion ◽  
Signal To Noise ◽  
Chua's Circuit ◽  
Noise Ratio ◽  
Modulated Signals

Using numerical simulation, we establish the possibility of realizing the stochastic resonance (SR) phenomenon in Chua’s circuit when it is excited by either an amplitude-modulated or a frequency-modulated signal. It is shown that the application of a frequency-modulated signal to a Chua’s circuit operating in a regime of dynamical intermittency is preferable over an amplitude-modulated signal from the point of view of minimizing the signal distortion and maximizing the signal-to-noise ratio (SNR).

A High Bandwidth Sigma-Delta Modulator Applied in Micro-Gyroscope

2013 ◽  
Vol 562-565 ◽  
pp. 369-373 ◽  
Author(s):  
Qiang Fu ◽  
Wei Ping Chen ◽  
Song Chen ◽  
Peng Fei Wang ◽  
Xiao Wei Liu
Keyword(s):  
Signal To Noise Ratio ◽  
System Simulation ◽  
Sampling Frequency ◽  
Effective Number ◽  
Signal To Noise ◽  
Sigma Delta Modulator ◽  
Sigma Delta ◽  
High Bandwidth ◽  
Oversampling Ratio ◽  
Input Level

In this paper a fourth-order single-loop sigma-delta modulator applied in micro-gyroscope is designed. The modulator system chose the fully feedforword structure. The signal bandwidth is 200KHz, oversampling ratio is 64 and sampling frequency is 25.6MHz. By system simulation result in Matlab, the signal to noise ratio (SNR) is 92.3dB and effective number of bits (ENOB) is 15.03bits. The whole circuit of modulator is designed and simulated in Cadence Spectre. It is gotten that the SNR is 78.6dB and changes linearly with input level. When input level is bigger than -4dBFs, the modulator becomes overload.

scholarly journals Research trends and challenges on DAC testing

ACTA IMEKO ◽  
2020 ◽  
Vol 9 (2) ◽  
pp. 46
Author(s):  
Eulalia Balestrieri ◽  
Pasquale Daponte ◽  
Luca De Vito ◽  
Francesco Picariello ◽  
Sergio Rapuano ◽  
...  
Keyword(s):  
Measurement Uncertainty ◽  
Research Work ◽  
Test Methods ◽  
Research Trends ◽  
Test Time ◽  
Essential Information ◽  
Digital To Analog Converters ◽  
Wide Range ◽  
Effective Performance ◽  
Self Test

<p class="Abstract"><span lang="EN-US">Today a very wide range of different applications relies on the Digital to Analog Converters (DACs). Different DAC architectures have been developed in the years and several different specifications exist to quantify their effective performance, essential information to verify the requirement fulfilling and the DAC suitability for the specific application.  As a result, DAC testing has assumed and continues to assume increasing importance. Main testing challenges include the reduction of the test time and cost, the measurement uncertainty computation and facing with the emerging Built-In Self-Test (BIST) solutions. To unambiguously clarify DAC terms, definitions and test methods the IEEE Std. 1658 has been developed and is currently under revision. To highlight the trends and issues also providing useful information for the revision of the standard, the paper presents an overview of the recent research work dealing with the DAC testing.</span></p><p class="Abstract"><span lang="EN-US"> </span></p>

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