A NOTE ON VACCINIUM BRASSII SLEUMER (ERICACEAE), RECORDING FILAMENTOUS WAX ON THE FLOWERS

Molecular Data ◽

Evolutionary Relationships ◽

Routine Identification ◽

Geographical Locations ◽

Routine identification of historical Vaccinium specimens at E revealed scurfy deposits on a specimen identified as Vaccinium brassii Sleumer. On examination with a Scanning Electron Microscope (SEM), these scurfy deposits turned out to be filamentous wax remarkably similar to that observed in Vaccinium ceraceum Argent. The disparity of the geographical locations of these two species is noted, together with the lack of molecular data to give insights into the evolutionary relationships.

Polyphyly and homoplasic structures in rhizosolenioid diatom genera: a review

Plant Ecology and Evolution ◽

10.5091/plecevo.2019.1599 ◽

2019 ◽

Vol 152 (2) ◽

pp. 142-149

Author(s):

Richard W. Jordan ◽

Matt P. Ashworth ◽

Yuki Uezato ◽

Schonna R. Manning

Keyword(s):

Electron Microscope ◽

Literature Review ◽

Strong Support ◽

Molecular Data ◽

Literature Survey ◽

Single Family ◽

The Family ◽

Family Level ◽

Background and aims – Traditionally, extant rhizosolenioid diatom genera have been placed in a single family, the Rhizosoleniaceae. However, preliminary molecular data suggested that the family might be polyphyletic. Therefore, a literature review of the morphological, ultrastructural and molecular data of the rhizosolenioid genera was undertaken. Methods – In addition to the literature survey, the location of the rimoportula in a number of rhizosolenioid genera was investigated by breaking the valves and observing the fragments in the scanning electron microscope. Key results – The data provides strong support for the previous separation of Proboscia and Rhizosolenia at the family level (Probosciaceae vs. Rhizosoleniaceae), with the rimoportula being located at the tip of the proboscis in Proboscia, or with an internal labia at the base of the hollow tubular rimoportula (= spine or process) in Rhizosolenia and Pseudosolenia. Conclusions – The data suggests that a number of rhizosolenioid genera should be transferred to other families, and that gene sequences of two genera (Dactyliosolen and Neocalyptrella) are needed as their morphological features differ markedly from those of the Rhizosoleniceae s. str. (Rhizosolenia, Guinardia, Pseudosolenia).

REDESCRIPTION OF PHARYNGOCIRRUS UCHIDAI (ANNELIDA: SACCOCIRRIDAE) USING SCANNING ELECTRON MICROSCOPE AND MOLECULAR DATA

MOLECULAR PHYLOGENETICS ◽

10.30826/molphy2018-64 ◽

2018 ◽

Author(s):

J. PARK ◽

◽

J. JUNG ◽

Keyword(s):

Electron Microscope ◽

Molecular Data ◽

Procamallanus spiculogubernaculus Agarwal, 1958 (Nematoda: Camallanidae) from Stinging catfish, Heteropneustes fossilis in India: morphological characterization and molecular data

Helminthologia ◽

10.1515/helm-2017-0010 ◽

2017 ◽

Vol 54 (1) ◽

pp. 68-76 ◽

Cited By ~ 3

Author(s):

A. Chaudhary ◽

C. Verma ◽

V. Tomar ◽

H. S. Singh

Keyword(s):

Electron Microscope ◽

Dna Sequences ◽

Molecular Data ◽

Morphological Characterization ◽

Systematic Evaluation ◽

Cox1 Gene ◽

Heteropneustes Fossilis ◽

Posterior Portion ◽

Summary The nematode, Procamallanus spiculogubernaculus Agarwal, 1958 was found from the Stinging catfish, Heteropneustes fossilis (Bloch, 1794) from Ghazipur, Delhi, India. Morphological characterization, including scanning electron microscope observation supplemented with DNA sequences is provided. Specimens recently found are characterized by the presence of an unlined buccal capsule having a small basal ring, esophagus muscular and glandular, vulva position is slightly post-equatorial, tail conical, long, and ending in three digit-like processes, phasmids present at about mid-length and cloaca located at the posterior end. In this study the species P. spiculogubernaculus is validated on the basis of molecular data after 47 years from its original description. In the scanning electron microscope examination, the topology of mouth and sensory pits in anterior portion, while the phasmids and digit like processes in posterior portion is clearly observed. Molecular data of the 18S ribosomal RNA and mitochondrial cytochrome c oxidase subunit 1 (cox1) gene were analyzed. Molecular phylogenetic analyses supported the validity of Procamallanus spiculogubernaculus and confirmed the paraphyletic status of the members of Procamallanus, Spirocamallanus, Camallanus and Paracamallanus. Taxonomic status of members of the family Camallanidae are briefly discussed along with the results of the systematic evaluation of P. spiculogubernaculus based on molecular data.

The Alteration of the Pore Spaces in Sandstones

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100071491 ◽

1973 ◽

Vol 31 ◽

pp. 210-211

Author(s):

R. E. Ferrell ◽

G. G. Paulson

Keyword(s):

Electron Microscope ◽

The Other ◽

Coarse Grained ◽

Depositional Fabric ◽

Soluble Components ◽

Scanning Electron ◽

Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100062002 ◽

1969 ◽

Vol 27 ◽

pp. 20-21

Author(s):

C. T. Nightingale ◽

S. E. Summers ◽

T. P. Turnbull

Keyword(s):

Electron Microscope ◽

Light Microscopy ◽

Surface Topography ◽

Great Depth ◽

Resolving Power ◽

Depth Of Field ◽

Pictorial Representations ◽

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100064189 ◽

1971 ◽

Vol 29 ◽

pp. 26-27

Author(s):

K. Shibatomi ◽

T. Yamanoto ◽

H. Koike

Keyword(s):

Electron Microscope ◽

Image Quality ◽

Chromatic Aberration ◽

Image Contrast ◽

Objective Lens ◽

Thick Specimen ◽

Transmission Electron ◽

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100068928 ◽

1970 ◽

Vol 28 ◽

pp. 386-387

Author(s):

S. Takashima ◽

H. Hashimoto ◽

S. Kimoto

Keyword(s):

Electron Microscope ◽

Chromatic Aberration ◽

Objective Lens ◽

Specimen Thickness ◽

Probe Diameter ◽

Transmission Electron ◽

Electron Image ◽

Conventional Transmission Electron Microscope ◽

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Characterization of Sputtered Films using the Scanning Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100070667 ◽

1973 ◽

Vol 31 ◽

pp. 44-45

Author(s):

R. F. Schneidmiller ◽

W. F. Thrower ◽

C. Ang

Keyword(s):

Electron Microscope ◽

Thin Film Deposition ◽

Film Deposition ◽

Sputtered Films ◽

Plasma Sputtering ◽

Microelectronic Devices ◽

Control Film ◽

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

Field Emission SEM Equipped With Noise Compensator

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100071958 ◽

1973 ◽

Vol 31 ◽

pp. 302-303

Author(s):

S. Saito ◽

H. Todokoro ◽

S. Nomura ◽

T. Komoda

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Field Emission ◽

Low Contrast ◽

Probe Current ◽

High Resolution Images ◽

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

Visualization of Internal Skin Structures with the Scanning Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100062130 ◽

1969 ◽

Vol 27 ◽

pp. 46-47

Author(s):

Emil Bernstein

Keyword(s):

Electron Microscope ◽

Great Depth ◽

Hair Follicles ◽

Depth Of Field ◽

Pig Skin ◽

Realistic Picture ◽

Main Components ◽

An interesting method for examining structures in g. pig skin has been developed. By modifying an existing technique for splitting skin into its two main components—epidermis and dermis—we can in effect create new surfaces which can be examined with the scanning electron microscope (SEM). Although this method is not offered as a complete substitute for sectioning, it provides the investigator with a means for examining certain structures such as hair follicles and glands intact. The great depth of field of the SEM complements the technique so that a very “realistic” picture of the organ is obtained.