scholarly journals Structured Probabilistic End-to-End Learning from Crowds

2020 ◽  
Author(s):  
Zhijun Chen ◽  
Huimin Wang ◽  
Hailong Sun ◽  
Pengpeng Chen ◽  
Tao Han ◽  
...  
Keyword(s):  
Neural Networks ◽  
Real World ◽  
Probabilistic Model ◽  
Deep Neural Networks ◽  
State Of The Art ◽  
Probabilistic Approach ◽  
Probabilistic Interpretation ◽  
End To End ◽  
Real World Datasets ◽  
The Relationship

End-to-end learning from crowds has recently been introduced as an EM-free approach to training deep neural networks directly from noisy crowdsourced annotations. It models the relationship between true labels and annotations with a specific type of neural layer, termed as the crowd layer, which can be trained using pure backpropagation. Parameters of the crowd layer, however, can hardly be interpreted as annotator reliability, as compared with the more principled probabilistic approach. The lack of probabilistic interpretation further prevents extensions of the approach to account for important factors of annotation processes, e.g., instance difficulty. This paper presents SpeeLFC, a structured probabilistic model that incorporates the constraints of probability axioms for parameters of the crowd layer, which allows to explicitly model annotator reliability while benefiting from the end-to-end training of neural networks. Moreover, we propose SpeeLFC-D, which further takes into account instance difficulty. Extensive validation on real-world datasets shows that our methods improve the state-of-the-art.

scholarly journals Label Distribution for Learning with Noisy Labels

2020 ◽  
Author(s):  
Yun-Peng Liu ◽  
Ning Xu ◽  
Yu Zhang ◽  
Xin Geng
Keyword(s):  
Neural Networks ◽  
Deep Neural Networks ◽  
Learning Algorithm ◽  
State Of The Art ◽  
Confidence Estimation ◽  
Novel Method ◽  
Real World Datasets ◽  
Label Distribution ◽  
Noisy Labels

The performances of deep neural networks (DNNs) crucially rely on the quality of labeling. In some situations, labels are easily corrupted, and therefore some labels become noisy labels. Thus, designing algorithms that deal with noisy labels is of great importance for learning robust DNNs. However, it is difficult to distinguish between clean labels and noisy labels, which becomes the bottleneck of many methods. To address the problem, this paper proposes a novel method named Label Distribution based Confidence Estimation (LDCE). LDCE estimates the confidence of the observed labels based on label distribution. Then, the boundary between clean labels and noisy labels becomes clear according to confidence scores. To verify the effectiveness of the method, LDCE is combined with the existing learning algorithm to train robust DNNs. Experiments on both synthetic and real-world datasets substantiate the superiority of the proposed algorithm against state-of-the-art methods.

End-to-end, sequence-to-sequence probabilistic visual odometry through deep neural networks

2017 ◽  
Vol 37 (4-5) ◽  
pp. 513-542 ◽  
Author(s):  
Sen Wang ◽  
Ronald Clark ◽  
Hongkai Wen ◽  
Niki Trigoni
Keyword(s):  
Neural Networks ◽  
Deep Learning ◽  
Convolutional Neural Networks ◽  
Deep Neural Networks ◽  
State Of The Art ◽  
Visual Odometry ◽  
Feature Representation ◽  
Geometric Information ◽  
Geometric Problem ◽  
End To End

This paper studies visual odometry (VO) from the perspective of deep learning. After tremendous efforts in the robotics and computer vision communities over the past few decades, state-of-the-art VO algorithms have demonstrated incredible performance. However, since the VO problem is typically formulated as a pure geometric problem, one of the key features still missing from current VO systems is the capability to automatically gain knowledge and improve performance through learning. In this paper, we investigate whether deep neural networks can be effective and beneficial to the VO problem. An end-to-end, sequence-to-sequence probabilistic visual odometry (ESP-VO) framework is proposed for the monocular VO based on deep recurrent convolutional neural networks. It is trained and deployed in an end-to-end manner, that is, directly inferring poses and uncertainties from a sequence of raw images (video) without adopting any modules from the conventional VO pipeline. It can not only automatically learn effective feature representation encapsulating geometric information through convolutional neural networks, but also implicitly model sequential dynamics and relation for VO using deep recurrent neural networks. Uncertainty is also derived along with the VO estimation without introducing much extra computation. Extensive experiments on several datasets representing driving, flying and walking scenarios show competitive performance of the proposed ESP-VO to the state-of-the-art methods, demonstrating a promising potential of the deep learning technique for VO and verifying that it can be a viable complement to current VO systems.

scholarly journals Studying the Evolution of Neural Activation Patterns During Training of Feed-Forward ReLU Networks

2021 ◽  
Vol 4 ◽  
Author(s):  
David Hartmann ◽  
Daniel Franzen ◽  
Sebastian Brodehl
Keyword(s):  
Neural Networks ◽  
Information Content ◽  
Real World ◽  
Deep Neural Networks ◽  
State Of The Art ◽  
Neural Activation ◽  
Activation Patterns ◽  
Continuous Structure ◽  
Reference Implementation ◽  
A New Technique

The ability of deep neural networks to form powerful emergent representations of complex statistical patterns in data is as remarkable as imperfectly understood. For deep ReLU networks, these are encoded in the mixed discrete–continuous structure of linear weight matrices and non-linear binary activations. Our article develops a new technique for instrumenting such networks to efficiently record activation statistics, such as information content (entropy) and similarity of patterns, in real-world training runs. We then study the evolution of activation patterns during training for networks of different architecture using different training and initialization strategies. As a result, we see characteristic- and general-related as well as architecture-related behavioral patterns: in particular, most architectures form bottom-up structure, with the exception of highly tuned state-of-the-art architectures and methods (PyramidNet and FixUp), where layers appear to converge more simultaneously. We also observe intermediate dips in entropy in conventional CNNs that are not visible in residual networks. A reference implementation is provided under a free license1.

scholarly journals Unsupervised Representation Learning by Predicting Random Distances

2020 ◽  
Author(s):  
Hu Wang ◽  
Guansong Pang ◽  
Chunhua Shen ◽  
Congbo Ma
Keyword(s):  
Neural Networks ◽  
Anomaly Detection ◽  
Unsupervised Learning ◽  
Large Scale ◽  
Deep Neural Networks ◽  
State Of The Art ◽  
Representation Learning ◽  
Great Success ◽  
Learning Tasks ◽  
Real World Datasets

Deep neural networks have gained great success in a broad range of tasks due to its remarkable capability to learn semantically rich features from high-dimensional data. However, they often require large-scale labelled data to successfully learn such features, which significantly hinders their adaption in unsupervised learning tasks, such as anomaly detection and clustering, and limits their applications to critical domains where obtaining massive labelled data is prohibitively expensive. To enable unsupervised learning on those domains, in this work we propose to learn features without using any labelled data by training neural networks to predict data distances in a randomly projected space. Random mapping is a theoretically proven approach to obtain approximately preserved distances. To well predict these distances, the representation learner is optimised to learn genuine class structures that are implicitly embedded in the randomly projected space. Empirical results on 19 real-world datasets show that our learned representations substantially outperform a few state-of-the-art methods for both anomaly detection and clustering tasks. Code is available at: \url{https://git.io/RDP}

scholarly journals Representing Deep Neural Networks Latent Space Geometries with Graphs

Algorithms ◽  
2021 ◽  
Vol 14 (2) ◽  
pp. 39
Author(s):  
Carlos Lassance ◽  
Vincent Gripon ◽  
Antonio Ortega
Keyword(s):  
Machine Learning ◽  
Neural Networks ◽  
Deep Learning ◽  
Objective Function ◽  
Learning Process ◽  
Deep Neural Networks ◽  
State Of The Art ◽  
The Core ◽  
Learning Tasks ◽  
Latent Space

Deep Learning (DL) has attracted a lot of attention for its ability to reach state-of-the-art performance in many machine learning tasks. The core principle of DL methods consists of training composite architectures in an end-to-end fashion, where inputs are associated with outputs trained to optimize an objective function. Because of their compositional nature, DL architectures naturally exhibit several intermediate representations of the inputs, which belong to so-called latent spaces. When treated individually, these intermediate representations are most of the time unconstrained during the learning process, as it is unclear which properties should be favored. However, when processing a batch of inputs concurrently, the corresponding set of intermediate representations exhibit relations (what we call a geometry) on which desired properties can be sought. In this work, we show that it is possible to introduce constraints on these latent geometries to address various problems. In more detail, we propose to represent geometries by constructing similarity graphs from the intermediate representations obtained when processing a batch of inputs. By constraining these Latent Geometry Graphs (LGGs), we address the three following problems: (i) reproducing the behavior of a teacher architecture is achieved by mimicking its geometry, (ii) designing efficient embeddings for classification is achieved by targeting specific geometries, and (iii) robustness to deviations on inputs is achieved via enforcing smooth variation of geometry between consecutive latent spaces. Using standard vision benchmarks, we demonstrate the ability of the proposed geometry-based methods in solving the considered problems.

scholarly journals Reconfigurable Binary Neural Network Accelerator with Adaptive Parallelism Scheme

Electronics ◽  
2021 ◽  
Vol 10 (3) ◽  
pp. 230
Author(s):  
Jaechan Cho ◽  
Yongchul Jung ◽  
Seongjoo Lee ◽  
Yunho Jung
Keyword(s):  
Neural Networks ◽  
High Throughput ◽  
Deep Neural Networks ◽  
State Of The Art ◽  
Throughput Performance ◽  
Adaptive Parallelism ◽  
Sensor Applications ◽  
Binary Neural Network ◽  
Target Layer ◽  
Network Topologies

Binary neural networks (BNNs) have attracted significant interest for the implementation of deep neural networks (DNNs) on resource-constrained edge devices, and various BNN accelerator architectures have been proposed to achieve higher efficiency. BNN accelerators can be divided into two categories: streaming and layer accelerators. Although streaming accelerators designed for a specific BNN network topology provide high throughput, they are infeasible for various sensor applications in edge AI because of their complexity and inflexibility. In contrast, layer accelerators with reasonable resources can support various network topologies, but they operate with the same parallelism for all the layers of the BNN, which degrades throughput performance at certain layers. To overcome this problem, we propose a BNN accelerator with adaptive parallelism that offers high throughput performance in all layers. The proposed accelerator analyzes target layer parameters and operates with optimal parallelism using reasonable resources. In addition, this architecture is able to fully compute all types of BNN layers thanks to its reconfigurability, and it can achieve a higher area–speed efficiency than existing accelerators. In performance evaluation using state-of-the-art BNN topologies, the designed BNN accelerator achieved an area–speed efficiency 9.69 times higher than previous FPGA implementations and 24% higher than existing VLSI implementations for BNNs.

An End-to-End Sleep Staging Simulator Based on Mixed Deep Neural Networks

2021 ◽  
Author(s):  
Zheng Chen ◽  
Ziwei Yang ◽  
Dong Wang ◽  
Ming Huang ◽  
Naoaki Ono ◽  
...  
Keyword(s):  
Neural Networks ◽  
Deep Neural Networks ◽  
Sleep Staging ◽  
End To End

Framework for TCAD augmented machine learning on multi- I–V characteristics using convolutional neural network and multiprocessing

2021 ◽  
Vol 42 (12) ◽  
pp. 124101
Author(s):  
Thomas Hirtz ◽  
Steyn Huurman ◽  
He Tian ◽  
Yi Yang ◽  
Tian-Ling Ren
Keyword(s):  
Machine Learning ◽  
Neural Networks ◽  
Information Technologies ◽  
Deep Neural Networks ◽  
State Of The Art ◽  
Data Driven ◽  
Sufficient Data ◽  
Learning Models ◽  
Simulation Tools ◽  
New Information

Abstract In a world where data is increasingly important for making breakthroughs, microelectronics is a field where data is sparse and hard to acquire. Only a few entities have the infrastructure that is required to automate the fabrication and testing of semiconductor devices. This infrastructure is crucial for generating sufficient data for the use of new information technologies. This situation generates a cleavage between most of the researchers and the industry. To address this issue, this paper will introduce a widely applicable approach for creating custom datasets using simulation tools and parallel computing. The multi-I–V curves that we obtained were processed simultaneously using convolutional neural networks, which gave us the ability to predict a full set of device characteristics with a single inference. We prove the potential of this approach through two concrete examples of useful deep learning models that were trained using the generated data. We believe that this work can act as a bridge between the state-of-the-art of data-driven methods and more classical semiconductor research, such as device engineering, yield engineering or process monitoring. Moreover, this research gives the opportunity to anybody to start experimenting with deep neural networks and machine learning in the field of microelectronics, without the need for expensive experimentation infrastructure.

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