The electrical Testing and Characterization of the devices built under research conditions
on silicon wafers, diced wafers, or package parts have hampered research since the beginning
of integrated circuits. The challenges of performing electrical characterization on devices
are to acquire useful and accurate data, the ease of use of the test platform, the portability
of the test equipment, the ability to automate quickly, to allow modifications to the platform,
the ability to change the configuration of the Device Under Test (DUT) or the Memristor Based
Design (MBD), and to do this within budget. The devices that this research is focused on are
memristors with unique test challenges. Some of the tests performed on memristors are Voltage
sweeps, pulsing of Voltages, and threshold Voltages. Standard methods of testing memristors
usually require hands-on experience, multiple bulky work stations, and hours of training.
This work reports a novel, low-cost, portable test and characterization platform for many types
of memristors with a voltage range from -10V to +10V, which is portable, low-cost, built with
off-the-shelf components, and with configurability through software and hardware. To demonstrate
the performance of the platform, the platform was able to take a virgin memristor from “forming”
to operation voltages, and then incrementally change resistances by Voltage Pulsing. The platform
within this work allows the researcher flexibility in electrical characterization by being able
to accept many memristor types and MBDs, and applying environmental conditions to the MBD, with
this flexibility of the platform the productivity of the researcher will increase.
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