Aplicación del refinamiento Rietveld para la identificación de fases del ZnO obtenido por precipitación química

Víctor Iván Landeros-Velázquez; Gabriel Herrera-Pérez; Rafael Vargas-Bernal; Esthela Ramos-Ramírez

doi:10.29057/icbi.v9iespecial2.8051

Aplicación del refinamiento Rietveld para la identificación de fases del ZnO obtenido por precipitación química

PÄDI Boletín Científico de Ciencias Básicas e Ingenierías del ICBI ◽

10.29057/icbi.v9iespecial2.8051 ◽

2021 ◽

Vol 9 (Especial2) ◽

pp. 90-96

Author(s):

Víctor Iván Landeros-Velázquez ◽

Gabriel Herrera-Pérez ◽

Rafael Vargas-Bernal ◽

Esthela Ramos-Ramírez

Keyword(s):

Diffraction Analysis

El óxido de zinc (ZnO), es un material semiconductor del tipo II-VI, el cual posee una energía de banda prohibida (Ebp) de 3.37 eV a 298.15 K y la estructura cristalina termodinámicamente más estable es la del tipo de la wurtzita (hexagonal). Con estas características, el ZnO es un candidato excelente para múltiples aplicaciones industriales tales como; la electrónica, magnética, fotocatalítica, optoelectrónica, metalúrgica, alimentaria, cosmética, farmacológica, cerámica, polimérica y muchas otras más. En el presente trabajo, se identificaron y cuantificaron las fases cristalinas presentes en muestras sólidas obtenidas por precipitación química, considerando la relación estequiométrica en medio alcalino. Para el análisis de las fases cristalinas presentes en los sólidos obtenidos se empleó la técnica de Difracción de rayos-X (DRX), los difractogramas se obtuvieron en un intervalo de 4 a 90 de 2θ, a una velocidad de paso de 0.02y de la aplicación del método de Refinamiento Rietveld se llevó a cabo con el empleo del software Materials Using Diffraction Analysis (MAUD). Los resultados cualitativos permitieron considerar la presencia predominante de fase wurtzita (ZnO), la smithsonita (ZnCO3), hidróxido de zinc (Zn(OH)2) y acetato de zinc (ZnC4H6O4). Los resultados del refinamiento permitieron identificar la presencia de fases secundarias de ZnO en estos sólidos, tales como la estructura de roca de sal (halita) y la blenda de zinc.

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Light Optical Diffraction Studies of Macromolecular Ultrastructure

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010006828x ◽

1970 ◽

Vol 28 ◽

pp. 258-259

Author(s):

Glen B. Haydon

Keyword(s):

High Resolution ◽

Diffraction Analysis ◽

Diffraction Pattern ◽

Electron Micrographs ◽

Optical Diffraction ◽

Electron Micrograph ◽

Its Analysis ◽

Resolution Electron ◽

Diffraction Patterns

Analysis of light optical diffraction patterns produced by electron micrographs can easily lead to much nonsense. Such diffraction patterns are referred to as optical transforms and are compared with transforms produced by a variety of mathematical manipulations. In the use of light optical diffraction patterns to study periodicities in macromolecular ultrastructures, a number of potential pitfalls have been rediscovered. The limitations apply to the formation of the electron micrograph as well as its analysis.(1) The high resolution electron micrograph is itself a complex diffraction pattern resulting from the specimen, its stain, and its supporting substrate. Cowley and Moodie (Proc. Phys. Soc. B, LXX 497, 1957) demonstrated changing image patterns with changes in focus. Similar defocus images have been subjected to further light optical diffraction analysis.

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Electron Diffraction Analysis of Microtwin Structures in Regrown (III) Silicon

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100054765 ◽

1982 ◽

Vol 40 ◽

pp. 460-461

Author(s):

P. Ling ◽

R. Gronsky ◽

J. Washburn

Keyword(s):

Electron Diffraction ◽

Ion Implantation ◽

Diffraction Analysis ◽

Diffraction Pattern ◽

Direct Consequence ◽

The Other ◽

Electron Diffraction Analysis ◽

Defect Microstructures ◽

Ion Implanted

The defect microstructures of Si arising from ion implantation and subsequent regrowth for a (111) substrate have been found to be dominated by microtwins. Figure 1(a) is a typical diffraction pattern of annealed ion-implanted (111) Si showing two groups of extra diffraction spots; one at positions (m, n integers), the other at adjacent positions between <000> and <220>. The object of the present paper is to show that these extra reflections are a direct consequence of the microtwins in the material.

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Computers and diffraction analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100152197 ◽

1989 ◽

Vol 47 ◽

pp. 44-45

Author(s):

J. A. Eades

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Electron Diffraction ◽

Diffraction Analysis ◽

Electron Diffraction Analysis ◽

Image Simulation ◽

Correct Interpretation ◽

High Profile ◽

High Resolution Images ◽

Image Simulations

For well over two decades computers have played an important role in electron microscopy; they now pervade the whole field - as indeed they do in so many other aspects of our lives. The initial use of computers was mainly for large (as it seemed then) off-line calculations for image simulations; for example, of dislocation images.Image simulation has continued to be one of the most notable uses of computers particularly since it is essential to the correct interpretation of high resolution images. In microanalysis, too, the computer has had a rather high profile. In this case because it has been a necessary part of the equipment delivered by manufacturers. By contrast the use of computers for electron diffraction analysis has been slow to prominence. This is not to say that there has been no activity, quite the contrary; however it has not had such a great impact on the field.

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Diffraction analysis of the lithium battery cathode material Li1.2Mn0.4Ni0.3Co0.1O2

Zeitschrift für Kristallographie ◽

10.1524/zkri.2007.2007.suppl_26.483 ◽

2007 ◽

Vol 2007 (suppl_26) ◽

pp. 483-488

Author(s):

P. S. Whitfield ◽

I. J. Davidson ◽

P. W. Stephens ◽

L. M. D. Cranswick ◽

I. P. Swainson

Keyword(s):

Cathode Material ◽

Diffraction Analysis ◽

Lithium Battery

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DIFFRACTION ANALYSIS OF DEFORMED METALS: Theory, Methods, Programs

10.31519/monography_1598 ◽

2019 ◽

Author(s):

Faina Satdarova

Keyword(s):

Experimental Design ◽

Dislocation Density ◽

Mathematical Models ◽

Diffraction Analysis ◽

Experimental Research ◽

Russian Federation ◽

Statistical Estimation ◽

X Rays ◽

National University ◽

The Russian Federation

General analysis of the distribution of crystals orientation and dislocation density in the polycrystalline system is presented. Recovered information in diffraction of X-rays adopting is new to structure states of polycrystal. Shear phase transformations in metals — at the macroscopic and microscopic levels — become a clear process. Visualizing the advances is produced by program included in package delivered. Mathematical models developing, experimental design, optimal statistical estimation, simulation the system under study and evolution process on loading serves as instrumentation. To reduce advanced methods to research and studies problem-oriented software will promote when installed. Automation programs passed a testing in the National University of Science and Technology “MISIS” (The Russian Federation, Moscow). You score an advantage in theoretical and experimental research in the field of physics of metals.

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