scholarly journals Research on Calibration Method of the Beam Direction the Point Laser Sensor Based on Standard Ball

Author(s):  
Chengwei Li ◽  
Jianguo Fang ◽  
Jingliang Liu ◽  
Fei Liu ◽  
Di Li
2021 ◽  
Vol 71 ◽  
pp. 102136
Author(s):  
Mingyang Li ◽  
Zhijiang Du ◽  
Xiaoxing Ma ◽  
Wei Dong ◽  
Yongzhuo Gao

Sensors ◽  
2018 ◽  
Vol 18 (10) ◽  
pp. 3485 ◽  
Author(s):  
Dongdong Chen ◽  
Peijiang Yuan ◽  
Tianmiao Wang ◽  
Ying Cai ◽  
Haiyang Tang

To enhance the perpendicularity accuracy in the robotic drilling system, a normal sensor calibration method is proposed to identify the errors of the zero point and laser beam direction of laser displacement sensors simultaneously. The procedure of normal adjustment of the robotic drilling system is introduced firstly. Next the measurement model of the zero point and laser beam direction on a datum plane is constructed based on the principle of the distance measurement for laser displacement sensors. An extended Kalman filter algorithm is used to identify the sensor errors. Then the surface normal measurement and attitude adjustments are presented to ensure that the axis of the drill bit coincides with the normal at drilling point. Finally, simulations are conducted to study the performance of the proposed calibration method and experiments are carried out on a robotic drilling system. The simulation and experimental results show that the perpendicularity of the hole is within 0.2°. They also demonstrate that the proposed calibration method has high accuracy of parameter identification and lays a basis for high-precision perpendicularity accuracy of drilling in the robotic drilling system.


Sensors ◽  
2019 ◽  
Vol 19 (5) ◽  
pp. 1083 ◽  
Author(s):  
Jiehu Kang ◽  
Bin Wu ◽  
Xiaodeng Duan ◽  
Ting Xue

The articulated laser sensor is a new kind of trans-scale and non-contact measurement instrument in regular-size space and industrial applications. These sensors overcome many deficiencies and application limitations of traditional measurement methods. The articulated laser sensor consists of two articulated laser sensing modules, and each module is made up of two rotary tables and one collimated laser. The three axes represent a non-orthogonal shaft architecture. The calibration method of system parameters for traditional instruments is no longer suitable. A novel high-accuracy calibration method of an articulated laser sensor for trans-scale 3D measurement is proposed. Based on perspective projection models and image processing techniques, the calibration method of the laser beam is the key innovative aspect of this study and is introduced in detail. The experimental results show that a maximum distance error of 0.05 mm was detected with the articulated laser sensor. We demonstrate that the proposed high-accuracy calibration method is feasible and effective, particularly for the calibration of laser beams.


2020 ◽  
Author(s):  
Jiangping Qin ◽  
Zhaolong Li ◽  
Bo Sun ◽  
Feng Yu ◽  
Yi Liu ◽  
...  

Abstract With the popularization of automounting robots in protein crystal diffraction experiment beamline stations, the coordinate calibration of the robot sample mounting position has become an inevitable task in the daily maintenance of the beamline station. In this method, the image features of the laser sensor spot and goniometer are extracted by color extraction and edge detection, respectively, and the noise is eliminated by median filtering. Then, after locating the pixel coordinates of the center of the circle through the Hough circle detection and the minimum closed circle fitting algorithm, the coordinates in the base coordinate system are obtained using the camera internal and external parameter matrices and the hand-eye relationship matrix. Finally, according to the deviation of the laser spot and the visual positioning coordinate of the goniometer, the position of the robot is compensated to improve the positioning accuracy, and the automatic calibration of the sample point is realized.


2017 ◽  
Vol 44 (4) ◽  
pp. 0410002
Author(s):  
王祎雯 Wang Yiwen ◽  
付鲁华 Fu Luhua ◽  
赵炎 Zhao Yan ◽  
张恒 Zhang Heng ◽  
曲兴华 Qu Xinghua ◽  
...  

2019 ◽  
Vol 1311 ◽  
pp. 012049
Author(s):  
Dong Li ◽  
Yang Li ◽  
Ke Zhang ◽  
Peng Zhou ◽  
Wenda Yu ◽  
...  

Author(s):  
K. Ishizuka

The technique of convergent-beam electron diffraction (CBED) has been established. However there is a distinct discrepancy concerning the CBED pattern symmetries associated with translation symmetries parallel to the incident beam direction: Buxton et al. assumed no detectable effects of translation components, while Goodman predicted no associated symmetries. In this report a procedure used by Gjønnes & Moodie1 to obtain dynamical extinction rules will be extended in order to derive the CBED pattern symmetries as well as the dynamical extinction rules.


Author(s):  
David C. Joy ◽  
Dennis M. Maher

High-resolution images of the surface topography of solid specimens can be obtained using the low-loss technique of Wells. If the specimen is placed inside a lens of the condenser/objective type, then it has been shown that the lens itself can be used to collect and filter the low-loss electrons. Since the probeforming lenses in TEM instruments fitted with scanning attachments are of this type, low-loss imaging should be possible.High-resolution, low-loss images have been obtained in a JEOL JEM 100B fitted with a scanning attachment and a thermal, fieldemission gun. No modifications were made to the instrument, but a wedge-shaped, specimen holder was made to fit the side-entry, goniometer stage. Thus the specimen is oriented initially at a glancing angle of about 30° to the beam direction. The instrument is set up in the conventional manner for STEM operation with all the lenses, including the projector, excited.


Author(s):  
Y. Cheng ◽  
J. Liu ◽  
M.B. Stearns ◽  
D.G. Steams

The Rh/Si multilayer (ML) thin films are promising optical elements for soft x-rays since they have a calculated normal incidence reflectivity of ∼60% at a x-ray wavelength of ∼13 nm. However, a reflectivity of only 28% has been attained to date for ML fabricated by dc magnetron sputtering. In order to determine the cause of this degraded reflectivity the microstructure of this ML was examined on cross-sectional specimens with two high-resolution electron microscopy (HREM and HAADF) techniques.Cross-sectional specimens were made from an as-prepared ML sample and from the same ML annealed at 298 °C for 1 and 100 hours. The specimens were imaged using a JEM-4000EX TEM operating at 400 kV with a point-to-point resolution of better than 0.17 nm. The specimens were viewed along Si [110] projection of the substrate, with the (001) Si surface plane parallel to the beam direction.


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