scholarly journals Renyi’s Entropy Based Multilevel Thresholding Using a Novel Meta-Heuristics Algorithm

2020 ◽  
Vol 10 (9) ◽  
pp. 3225
Author(s):  
Wei Liu ◽  
Yongkun Huang ◽  
Zhiwei Ye ◽  
Wencheng Cai ◽  
Shuai Yang ◽  
...  
Keyword(s):  
Image Segmentation ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Evolutionary Algorithms ◽  
Optimization Algorithm ◽  
Whale Optimization ◽  
Renyi’S Entropy ◽  
Multi Level ◽  
Heuristics Algorithm ◽  
Scanning Electron

Multi-level image thresholding is the most direct and effective method for image segmentation, which is a key step for image analysis and computer vision, however, as the number of threshold values increases, exhaustive search does not work efficiently and effectively and evolutionary algorithms often fall into a local optimal solution. In the paper, a meta-heuristics algorithm based on the breeding mechanism of Chinese hybrid rice is proposed to seek the optimal multi-level thresholds for image segmentation and Renyi’s entropy is utilized as the fitness function. Experiments have been run on four scanning electron microscope images of cement and four standard images, moreover, it is compared with other six classical and novel evolutionary algorithms: genetic algorithm, particle swarm optimization algorithm, differential evolution algorithm, ant lion optimization algorithm, whale optimization algorithm, and salp swarm algorithm. Meanwhile, some indicators, including the average fitness values, standard deviation, peak signal to noise ratio, and structural similarity index are used as evaluation criteria in the experiments. The experimental results show that the proposed method prevails over the other algorithms involved in the paper on most indicators and it can segment cement scanning electron microscope image effectively.

Multi-level Image Segmentation using Randomized Spiral-based Whale Optimization Algorithm

2020 ◽  
Vol 14 ◽  
Author(s):  
Basu Dev Shivahare ◽  
S.K. Gupta
Keyword(s):  
Image Segmentation ◽  
Optimization Algorithm ◽  
Objective Evaluation ◽  
Whale Optimization Algorithm ◽  
Segmentation Method ◽  
Segmentation Methods ◽  
Whale Optimization ◽  
Novel Variant ◽  
Multiple Regions ◽  
Multi Level

Abstract: Segmenting an image into multiple regions is a pre-processing phase of computer vision. For the same, determining an optimal set of thresholds is challenging problem. This paper introduces a novel multi-level thresholding based image segmentation method. The presented method uses a novel variant of whale optimization algorithm to determine the optimal thresholds. For experimental validation of the proposed variant, twenty-three benchmark functions are considered. To analysis the efficacy of new multi-level image segmentation method, images from Berkeley Segmentation Dataset and Benchmark (BSDS300) have been considered and tested against recent multi-level image segmentation methods. The segmentation results are validated in terms of subjective and objective evaluation. Experiments arm that the presented method is efficient and competitive than the existing multi-level image segmentation methods

scholarly journals Image Processing Tool Quantifying Auto-Tempered Carbides in As-Quenched Low Carbon Martensitic Steels

Metals ◽  
2020 ◽  
Vol 10 (2) ◽  
pp. 171 ◽  
Author(s):  
Shashank Ramesh Babu ◽  
Thomas Paul Davis ◽  
Tim Haas ◽  
Antti Jarvenpää ◽  
Jukka Kömi ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Image Processing ◽  
Image Segmentation ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Volume Fraction ◽  
Low Carbon ◽  
Martensitic Steels ◽  
Color Map ◽  
Scanning Electron

As-quenched low-carbon martensitic steels (<0.2 wt.% C) contain auto-tempered carbides. Auto-tempering improves the work hardening and upper-shelf impact energy; however, an efficient characterization method to determine the degree of auto-tempering has not been available. This paper demonstrates an efficient image processing tool that calculates the relative auto-tempered carbide fraction by analyzing scanning electron microscope micrographs. By the process of image segmentation, the qualitative volume fraction of auto-tempered carbides can be determined, and an associated color map produced, which distinguished the levels of auto-tempering. This image processing tool could become useful for the optimization of new low-carbon steel’s mechanical properties.

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

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