scholarly journals Non-Destructive and Micro-Invasive Techniques for Characterizing the Ancient Roman Mosaic Fragments

2020 ◽  
Vol 10 (11) ◽  
pp. 3781 ◽  
Author(s):  
Rodica Mariana Ion ◽  
Bulat A. Bakirov ◽  
Sergey E. Kichanov ◽  
Denis P. Kozlenko ◽  
Alexander V. Belushkin ◽  
...  
Keyword(s):  
Neutron Diffraction ◽  
Spatial Arrangement ◽  
Diffraction Field ◽  
Neutron Tomography ◽  
Three Dimension ◽  
Iron Hydroxides ◽  
X Ray ◽  
Polluted Atmosphere ◽  
Invasive Techniques ◽  
Non Destructive

The color characteristics, vibration spectra, phase and mineral composition, internal structural organization of several fragments of the ancient Roman mosaics from the Roman Mosaic Museum, Constanta, Romania were studied by non-destructive (Chromatic analysis, Neutron Diffraction, Neutron Tomography) and micro-invasive techniques (Optical Microscopy, X-ray Diffraction, Field Emission Scanning Electron Microscopy–Energy Dispersive X-ray Spectroscopy, Raman Spectroscopy, Wavelength Dispersion X-ray Fluorescence). These investigations were performed in order to characterize the original Roman mosaic fragments. The major and minor phase components of the studied mosaic fragments were determined, the crystal structure of the main phases was analyzed, and their three-dimension spatial arrangement was reconstructed. The similar composition of the major phases of all mosaic fragments can indicate a generic recipe for making mosaic elements, but minor phases were presumably added for coloring of mosaic pieces. Some degradation areas inside the volume of the mosaic fragments were found by means of neutron diffraction and neutron tomography methods. These degradation areas are probably related to the formation of iron hydroxides during chemical interactions of mosaic fragments with the sea and urban polluted atmosphere.

Three-dimensional welding residual stresses evaluation based on the eigenstrain methodology via X-ray measurements at the surface

2014 ◽  
Vol 03 (04) ◽  
pp. 1450023
Author(s):  
Masaru Ogawa
Keyword(s):  
Neutron Diffraction ◽  
Residual Stresses ◽  
Three Dimensional ◽  
Strain Gauges ◽  
X Ray Diffraction ◽  
Stress Evaluation ◽  
X Ray ◽  
Residual Strains ◽  
Non Destructive ◽  
Evaluation Accuracy

In order to assure structural integrity for operating welded structures, it is necessary to evaluate crack growth rate and crack propagation direction for each observed crack non-destructively. Here, three dimensional (3D) welding residual stresses must be evaluated to predict crack propagation. Today, X-ray diffraction is used and the ultrasonic method has been proposed as non-destructive method to measure residual stresses. However, it is impossible to determine residual stress distributions in the thickness direction. Although residual stresses through a depth of several tens of millimeters can be evaluated non-destructively by neutron diffraction, it cannot be used as an on-site measurement technique. This is because neutron diffraction is only available in special irradiation facilities. Author pays attention to the bead flush method based on the eigenstrain methodology. In this method, 3D welding residual stresses are calculated by an elastic Finite Element Method (FEM) analysis from eigenstrains which are evaluated by an inverse analysis from released strains by strain gauges in the removal of the reinforcement of the weld. Here, the removal of the excess metal can be regarded as non-destructive treatment because toe of weld which may become crack starters can be eliminated. The effectiveness of the method has been proven for welded plates and pipes even with relatively lower bead height. In actual measurements, stress evaluation accuracy becomes poorer because measured values of strain gauges are affected by processing strains on the machined surface. In the previous studies, the author has developed the bead flush method that is free from the influence of the affecting strains by using residual strains on surface by X-ray diffraction. However, stress evaluation accuracy is not good enough because of relatively poor measurement accuracy of X-ray diffraction. In this study, a method to improve the estimation accuracy of residual stresses in this method is formulated, and it is shown numerically that inner welding residual stresses can be estimated accurately from the residual strains measured by X-ray diffraction.

scholarly journals Non-Destructive Residual Stress Investigations of Natural Polycrystalline Diamonds

2014 ◽  
Vol 996 ◽  
pp. 969-974 ◽  
Author(s):  
Andrew M. Venter ◽  
Vladimir Luzin ◽  
Marco A.G. Andreoli ◽  
Sandra Piazolo ◽  
Tshegofatso Moipolai
Keyword(s):  
Residual Stress ◽  
Neutron Diffraction ◽  
Environmental Contamination ◽  
Polycrystalline Diamond ◽  
X Ray ◽  
Diamond Phase ◽  
The World ◽  
Mechanisms Of Formation ◽  
Non Destructive ◽  
Stress Analyses

Three natural polycrystalline diamond samples have been investigated non-destructively in their raw as-discovered forms. The samples originate from different locations in the world and possibly have different mechanisms of formation. The study reveals that the stones are primarily composed of cubic diamond with varying amounts of impurities that emanate from their excessive porosities and entrapped environmental contamination from the areas they were formed and subsequently discovered. Residual stress analyses with X-ray and neutron diffraction techniques of the diamond phase in the interior regions of the diamonds revealed low stress values.

Technological Analysis of the Calcite Beads from the Great Temple of Tenochtitlan

2014 ◽  
Vol 1618 ◽  
pp. 97-107
Author(s):  
Emiliano R. Melgar Tísoc ◽  
José Luis Ruvalcaba
Keyword(s):  
Raw Materials ◽  
Colonial Period ◽  
X Ray ◽  
Basin Of Mexico ◽  
The Government ◽  
Invasive Techniques ◽  
The Temple ◽  
Non Destructive ◽  
Technological Analysis ◽  
Optic Microscopy

ABSTRACTIn the Great Temple at Tenochtitlan, the archaeologists found more than 150 offerings with thousands of pieces, most of them made on foreign raw materials to the Basin of Mexico. Among these votive contexts, the Chamber III of stage IVa (AD 1440-1469), buried during the government of Moctezuma I, is one of the most richness offerings of the temple. Inside this context, the quantity of greenstone beads is huge, and among them, there is a group of translucent appearance that resembles the green calcite objects from the Huastec region. The purpose of this research is to confirm or discard this probable cultural origin and technological manufacture of these beads. To do that, we perform different analysis with neither non-destructive nor invasive techniques like X-Ray Fluorescence (XRF), Fourier Transform Infrared Spectroscopy (FTIR), Raman, Optic Microscopy (OM), and Scanning Electron Microscopy (SEM). By this way we could confirm the similarities among Huastec pieces and these beads, both at mineralogical and technological levels. Based on that, and supported with some written sources from the Colonial period, we propose that these pieces could be war prizes and looted objects by pillage during the Aztec campaigns against Huastec sites; furthermore some of these goods were deposited as victory´s gifts to the gods at the Great Temple of Tenochtitlan.

Texture measurements in Al2O3 using BEKP

1994 ◽  
Vol 52 ◽  
pp. 608-609
Author(s):  
M. D. Vaudin ◽  
J. P. Cline
Keyword(s):  
Neutron Diffraction ◽  
Rapid Method ◽  
Crystallographic Orientation ◽  
Specimen Surface ◽  
X Ray Diffraction ◽  
Anisotropic Crystal ◽  
X Ray ◽  
Verification Method ◽  
Crystal Properties ◽  
Backscattered Electron

The study of preferred crystallographic orientation (texture) in ceramics is assuming greater importance as their anisotropic crystal properties are being used to advantage in an increasing number of applications. The quantification of texture by a reliable and rapid method is required. Analysis of backscattered electron Kikuchi patterns (BEKPs) can be used to provide the crystallographic orientation of as many grains as time and resources allow. The technique is relatively slow, particularly for noncubic materials, but the data are more accurate than any comparable technique when a sufficient number of grains are analyzed. Thus, BEKP is well-suited as a verification method for data obtained in faster ways, such as x-ray or neutron diffraction. We have compared texture data obtained using BEKP, x-ray diffraction and neutron diffraction. Alumina specimens displaying differing levels of axisymmetric (0001) texture normal to the specimen surface were investigated.BEKP patterns were obtained from about a hundred grains selected at random in each specimen.

Highlights in the history of X-ray topography1

1995 ◽  
Vol 210 (6) ◽  
Author(s):  
A. R. Lang
Keyword(s):  
Magnetic Domain ◽  
Diffraction Theory ◽  
Dislocation Loops ◽  
X Ray Diffraction ◽  
X Ray ◽  
Domain Structures ◽  
Structure Factors ◽  
History Of ◽  
Dislocation Sources ◽  
Non Destructive

AbstractX-ray topography provides a non-destructive method of mapping point-by-point variations in orientation and reflecting power within crystals. The discovery, made by several workers independently, that in nearly perfect crystals it was possible to detect individual dislocations by X-ray diffraction contrast started an epoch of rapid exploitation of X-ray topography as a new, general method for assessing crystal perfection. Another discovery, that of X-ray Pendellösung, led to important theoretical developments in X-ray diffraction theory and to a new and precise method for measuring structure factors on an absolute scale. Other highlights picked out for mention are studies of Frank-Read dislocation sources, the discovery of long dislocation helices and lines of coaxial dislocation loops in aluminium, of internal magnetic domain structures in Fe-3 wt.% Si, and of stacking faults in silicon and natural diamonds.

Stoichiometric Determination of Graphite Intercalation Compounds Using Rutherford Backscatiering Spectrometry

1983 ◽  
Vol 27 ◽  
Author(s):  
L. Salamanca-Riba ◽  
B.S. Elman ◽  
M.S. Dresselhaus ◽  
T. Venkatesan
Keyword(s):  
Experimental Error ◽  
Rutherford Backscattering Spectrometry ◽  
Rutherford Backscattering ◽  
Intercalation Compounds ◽  
Graphite Intercalation Compounds ◽  
X Ray ◽  
Donor And Acceptor ◽  
Graphite Intercalation ◽  
Non Destructive

ABSTRACTRutherford backscattering spectrometry (RBS) is used to characterize the stoichiometry of graphite intercalation compounds (GIC). Specific application is made to several stages of different donor and acceptor compounds and to commensurate and incommensurate intercalants. A deviation from the theoretical stoichiometry is measured for most of the compounds using this non-destructive method. Within experimental error, the RBS results agree with those obtained from analysis of the (00ℓ) x-ray diffractograms and weight uptake measurements on the same samples.

X-Ray Tomography for Electronic Packages

2000 ◽  
Author(s):  
Deepak Goyal
Keyword(s):  
3D Imaging ◽  
Development Time ◽  
Analytical Techniques ◽  
Electronic Packages ◽  
X Ray ◽  
Imaging Capability ◽  
Imaging Results ◽  
Key Drivers ◽  
Analytical Tools ◽  
Non Destructive

Abstract Next generation assembly/package development challenges are primarily increased interconnect complexity and density with ever shorter development time. The results of this trend present some distinct challenges for the analytical tools/techniques to support this technical roadmap. The key challenge in the analytical tools/techniques is the development of non-destructive imaging for improved time to information. This paper will present the key drivers for the non-destructive imaging, results of literature search and evaluation of key analytical techniques currently available. Based on these studies requirements of a 3D imaging capability will be discussed. Critical breakthroughs required for development of such a capability are also summarized.

X-Ray Nanotomography (XRMT) Tool for Non-Destructive High-Resolution Imaging of ICs

2001 ◽  
Author(s):  
Wenbing Yun ◽  
Steve Wang ◽  
David Scott ◽  
Kenneth W. Nill ◽  
Waleed S. Haddad
Keyword(s):  
High Resolution ◽  
Process Development ◽  
3D Visualization ◽  
Tomographic Reconstruction ◽  
Reconstruction Algorithms ◽  
X Ray ◽  
Visualization Software ◽  
Volumetric Reconstruction ◽  
Resolution Imaging ◽  
Non Destructive

Abstract A high-resolution table-sized x-ray nanotomography (XRMT) tool has been constructed that shows the promise of nondestructively imaging the internal structure of a full IC stack with a spatial resolution better than 100 nm. Such a tool can be used to detect, localize, and characterize buried defects in the IC. By collecting a set of X-ray projections through the full IC (which may include tens of micrometers of silicon substrate and several layers of Cu interconnects) and applying tomographic reconstruction algorithms to these projections, a 3D volumetric reconstruction can be obtained, and analyzed for defects using 3D visualization software. XRMT is a powerful technique that will find use in failure analysis and IC process development, and may facilitate or supplant investigations using SEM, TEM, and FIB tools, which generally require destructive sample preparation and a vacuum environment.

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