scholarly journals Optical System for the Transit Spectral Observation of Exoplanet-Atmosphere Characteristics

2021 ◽  
Vol 11 (12) ◽  
pp. 5508
Author(s):  
Fang Wang ◽  
Xuewu Fan ◽  
Hu Wang ◽  
Yue Pan ◽  
Yang Shen ◽  
...  
Keyword(s):  
Optical System ◽  
Signal To Noise Ratio ◽  
Optical Systems ◽  
Optical Parameters ◽  
Optical Index ◽  
Dual Channel ◽  
Performance Requirements ◽  
Reliable Performance ◽  
Parameter Ranges

Optical instrumentation with reliable performance is essential for the research of exoplanet atmosphere characteristics. However, due to long distances and weak signals, exoplanets are difficult to be imaged by traditional optical systems. To this end, a novel optical system based on transit spectroscopy is proposed in this paper. On the basis of the principle of the transit-spectroscopy method and the astronomical parameters of observed targets, the optional parameter ranges of a dedicated optical system are analyzed. The transit signal-to-noise ratio (SNR) is introduced for the determination of telescope aperture and throughput. Furthermore, an example of the optical system with a space telescope and spectrometer is proposed according to the above optical index, which is proven to meet the performance requirements. The optical system is required to cover the wavelength of 0.5–8 m and the field of view (FOV) of 27.9′′ within the diffraction limit. The collecting aperture should be greater than 2 m, and spectral resolutions of two spectrometer channels should approximately be 100 (2–4 m) and 30 (4–8 m). The point-spread function (PSF) of each channel at the minimal wavelength should cover 2 pixels. The telescope and dichroic system provide diffraction-limited input beams with the required aperture, FOV, and wavelength for the spectrometer slits. The simulation results of the optical system show that the spectral resolutions of the dual-channel spectrometer were 111–200 and 43–94. The image points of the spectrometer in each wavelength were smaller than the Airy spot within the slit FOV, and the full width at half-maximum (FWHM) of PSF at λmin provided 2 pixels of 18 m sampling. The feasibility of the demonstrated optical parameters is proven by the design.

Computer-Assisted High-Re Solution TEM

1990 ◽  
Vol 48 (1) ◽  
pp. 162-163
Author(s):  
F.A. Ponce ◽  
H. Hikashi
Keyword(s):  
Signal To Noise Ratio ◽  
Accurate Determination ◽  
Computer Software ◽  
Video Camera ◽  
Image Contrast ◽  
Objective Lens ◽  
Computer Assisted ◽  
Optical Parameters ◽  
Astigmatism Correction

The determination of the atomic positions from HRTEM micrographs is only possible if the optical parameters are known to a certain accuracy, and reliable through-focus series are available to match the experimental images with calculated images of possible atomic models. The main limitation in interpreting images at the atomic level is the knowledge of the optical parameters such as beam alignment, astigmatism correction and defocus value. Under ordinary conditions, the uncertainty in these values is sufficiently large to prevent the accurate determination of the atomic positions. Therefore, in order to achieve the resolution power of the microscope (under 0.2nm) it is necessary to take extraordinary measures. The use of on line computers has been proposed [e.g.: 2-5] and used with certain amount of success.We have built a system that can perform operations in the range of one frame stored and analyzed per second. A schematic diagram of the system is shown in figure 1. A JEOL 4000EX microscope equipped with an external computer interface is directly linked to a SUN-3 computer. All electrical parameters in the microscope can be changed via this interface by the use of a set of commands. The image is received from a video camera. A commercial image processor improves the signal-to-noise ratio by recursively averaging with a time constant, usually set at 0.25 sec. The computer software is based on a multi-window system and is entirely mouse-driven. All operations can be performed by clicking the mouse on the appropiate windows and buttons. This capability leads to extreme friendliness, ease of operation, and high operator speeds. Image analysis can be done in various ways. Here, we have measured the image contrast and used it to optimize certain parameters. The system is designed to have instant access to: (a) x- and y- alignment coils, (b) x- and y- astigmatism correction coils, and (c) objective lens current. The algorithm is shown in figure 2. Figure 3 shows an example taken from a thin CdTe crystal. The image contrast is displayed for changing objective lens current (defocus value). The display is calibrated in angstroms. Images are stored on the disk and are accessible by clicking the data points in the graph. Some of the frame-store images are displayed in Fig. 4.

Comparison of Design and Spatial Stability of Two Kinds of Optical Systems for Stereoscopic Mapping Camera

2013 ◽  
Vol 760-762 ◽  
pp. 368-372
Author(s):  
Tian Jin Tang ◽  
Wei Jun Gao
Keyword(s):  
Optical System ◽  
Linear Array ◽  
Focal Length ◽  
Optical Systems ◽  
Modulation Transfer ◽  
Working Temperature ◽  
Edge Field ◽  
Performance Requirements ◽  
And Performance ◽  
Structure Layout

To achieve a certain precision when mapping in accord with a particular proportion or scale with stereo mapping camera, the change of chief ray height of the edge field due to the fluctuation of working temperature is required to be within the range of microns, and at the meantime the size and structure layout of three-linear array stereo mapping camera are determined directly by the configuration of optical system. Based on the requirements of refractive optical system with long focal length, academic calculation and actual optical designs based on two typical configurations for stereoscopic mapping camera are made,the actual working temperature and performance requirements are also taken into consideration, the results including the modulation transfer function, distortion and stability comparison are also given.

Determination of the Best Emulsion for the Microscopy of Crystals

1981 ◽  
Vol 39 ◽  
pp. 32-33
Author(s):  
David A. Grano ◽  
Kenneth H. Downing
Keyword(s):  
Spatial Frequency ◽  
Information Transfer ◽  
Signal To Noise Ratio ◽  
Experimental Situation ◽  
Photographic Emulsion ◽  
Modulation Transfer ◽  
Signal To Noise ◽  
Frequency Space ◽  
Noise Ratio

The retrieval of high-resolution information from images of biological crystals depends, in part, on the use of the correct photographic emulsion. We have been investigating the information transfer properties of twelve emulsions with a view toward 1) characterizing the emulsions by a few, measurable quantities, and 2) identifying the “best” emulsion of those we have studied for use in any given experimental situation. Because our interests lie in the examination of crystalline specimens, we've chosen to evaluate an emulsion's signal-to-noise ratio (SNR) as a function of spatial frequency and use this as our critereon for determining the best emulsion.The signal-to-noise ratio in frequency space depends on several factors. First, the signal depends on the speed of the emulsion and its modulation transfer function (MTF). By procedures outlined in, MTF's have been found for all the emulsions tested and can be fit by an analytic expression 1/(1+(S/S0)2). Figure 1 shows the experimental data and fitted curve for an emulsion with a better than average MTF. A single parameter, the spatial frequency at which the transfer falls to 50% (S0), characterizes this curve.

Information and estimation in image processing

1987 ◽  
Vol 45 ◽  
pp. 14-17
Author(s):  
B. Roy Frieden
Keyword(s):  
Image Processing ◽  
Optical System ◽  
Large Amplitude ◽  
Communication Theory ◽  
Image Data ◽  
Direct Approach ◽  
Ill Posed

Despite the skill and determination of electro-optical system designers, the images acquired using their best designs often suffer from blur and noise. The aim of an “image enhancer” such as myself is to improve these poor images, usually by digital means, such that they better resemble the true, “optical object,” input to the system. This problem is notoriously “ill-posed,” i.e. any direct approach at inversion of the image data suffers strongly from the presence of even a small amount of noise in the data. In fact, the fluctuations engendered in neighboring output values tend to be strongly negative-correlated, so that the output spatially oscillates up and down, with large amplitude, about the true object. What can be done about this situation? As we shall see, various concepts taken from statistical communication theory have proven to be of real use in attacking this problem. We offer below a brief summary of these concepts.

Atomic Resolution in Crystal Aperture Stem

1990 ◽  
Vol 48 (1) ◽  
pp. 236-237
Author(s):  
J T Fourie
Keyword(s):  
Optical System ◽  
Spherical Aberration ◽  
Three Dimensional ◽  
Transmission Function ◽  
Optical Systems ◽  
Bragg Angle ◽  
Electron Optical System ◽  
Intimate Contact ◽  
Diffraction Effects ◽  
Design Aspect

The attempts at improvement of electron optical systems to date, have largely been directed towards the design aspect of magnetic lenses and towards the establishment of ideal lens combinations. In the present work the emphasis has been placed on the utilization of a unique three-dimensional crystal objective aperture within a standard electron optical system with the aim to reduce the spherical aberration without introducing diffraction effects. A brief summary of this work together with a description of results obtained recently, will be given.The concept of utilizing a crystal as aperture in an electron optical system was introduced by Fourie who employed a {111} crystal foil as a collector aperture, by mounting the sample directly on top of the foil and in intimate contact with the foil. In the present work the sample was mounted on the bottom of the foil so that the crystal would function as an objective or probe forming aperture. The transmission function of such a crystal aperture depends on the thickness, t, and the orientation of the foil. The expression for calculating the transmission function was derived by Hashimoto, Howie and Whelan on the basis of the electron equivalent of the Borrmann anomalous absorption effect in crystals. In Fig. 1 the functions for a g220 diffraction vector and t = 0.53 and 1.0 μm are shown. Here n= Θ‒ΘB, where Θ is the angle between the incident ray and the (hkl) planes, and ΘB is the Bragg angle.

STEM and ELS Observation of Early Oxide Formation on the Surface of Cr Thin Films

1980 ◽  
Vol 38 ◽  
pp. 412-413
Author(s):  
Fumio Watari ◽  
J. M. Cowley
Keyword(s):  
Thin Films ◽  
Optical System ◽  
Room Temperature ◽  
Oxide Formation ◽  
Initial Nucleation ◽  
Diffraction Patterns ◽  
Relationship Of ◽  
Multiple Twinning ◽  
Moderately High Temperature

STEM coupled with the optical system was used for the investigation of the early oxidation on the surface of Cr. Cr thin films (30 – 1000Å) were prepared by evaporation onto the polished or air-cleaved NaCl substrates at room temperature and 45°C in a vacuum of 10−6 Torr with an evaporation speed 0.3Å/sec. Rather thick specimens (200 – 1000Å) with various preferred orientations were used for the investigation of the oxidation at moderately high temperature (600 − 1100°C). Selected area diffraction patterns in these specimens are usually very much complicated by the existence of the different kinds of oxides and their multiple twinning. The determination of the epitaxial orientation relationship of the oxides formed on the Cr surface was made possible by intensive use of the optical system and microdiffraction techniques. Prior to the formation of the known rhombohedral Cr2O3, a thin spinel oxide, probably analogous to γ -Al203 or γ -Fe203, was formed. Fig. 1a shows the distinct epitaxial growth of the spinel (001) as well as the rhombohedral (125) on the well-oriented Cr(001) surface. In the case of the Cr specimen with the (001) preferred orientation (Fig. 1b), the rings explainable by spinel structure appeared as well as the well defined epitaxial spots of the spinel (001). The microdif fraction from 20A areas (Fig. 2a) clearly shows the same pattern as Fig. Ia with the weaker oxide spots among the more intense Cr spots, indicating that the thickness of the oxide is much less than that of Cr. The rhombohedral Cr2O3 was nucleated preferably at the Cr(011) sites provided by the polycrystalline nature of the present specimens with the relation Cr2O3 (001)//Cr(011), and by further oxidation it grew into full coverage of the rest of the Cr surface with the orientation determined by the initial nucleation.

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