scholarly journals Selection of CVD Diamond Crystals for X-ray Monochromator Applications Using X-ray Diffraction Imaging

Crystals ◽  
2019 ◽  
Vol 9 (8) ◽  
pp. 396 ◽  
Author(s):  
Stanislav Stoupin ◽  
Thomas Krawczyk ◽  
Zunping Liu ◽  
Carl Franck
Keyword(s):  
Spline Interpolation ◽  
Cvd Diamond ◽  
Effective Radius ◽  
Radius Of Curvature ◽  
X Ray Diffraction ◽  
Average Width ◽  
Rocking Curve ◽  
X Ray ◽  
Single Crystal Diamond ◽  
Diffraction Imaging

A set of 20 single crystal diamond plates synthesized using chemical vapor deposition (CVD) was studied using X-ray diffraction imaging to determine their applicability as side-bounce (single-reflection) Laue monochromators for synchrotron radiation. The crystal plates were of optical grade (as provided by the supplier) with (001) nominal surface orientation. High dislocation density was found for all samples. Distortions in the crystal lattice were quantified for low-index Laue reflections of interests using rocking curve topography. Maps of effective radius of curvature in the scattering plane were calculated using spline interpolation of the rocking curve peak position across the studied plates. For several selected plates, nearly flat regions with large effective radius of curvature were found ( R 0 ≳ 30 - 70 m, some regions as large as 1 × 4 mm 2 ). The average width of the rocking curve for these regions was found to be about 150 μ rad (r.m.s.). These observations suggest that the selected CVD diamond plates could be used as intermediate-bandwidth monochromators refocusing the radiation source to a specific location downstream with close to 1:1 distance ratio.

Microstructural characterization using x-ray diffraction imaging

1993 ◽  
Vol 51 ◽  
pp. 504-505
Author(s):  
David R. Black
Keyword(s):  
Lattice Spacing ◽  
Microstructural Characterization ◽  
Perfect Crystal ◽  
Angular Range ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Diffraction Imaging ◽  
Point To Point ◽  
Different Parts

X-ray diffraction imaging, also known as x-ray topography, is a powerful tool to study the defect microstructure of single crystals. As the name implies, this technique is based on recording an image of the diffracted x-ray beam from a crystal. Contrast in the image results from point-to-point variation in the diffracted intensity through the crystal. An example of a diffraction image is shown in figure 1. That this image is in some way a topographic representation of the sample can be seen in the impression of differing elevations and textures in different parts of the image. However, since this image is a result of diffraction from the sample the interpretation of the image is much more complex.Diffraction contrast is usually separated into two types: mosaic contrast and extinction contrast. Mosaic contrast occurs for crystals considered to be formed from a collection of small perfect crystal blocks. These blocks have a well defined rocking curve width, the angular range over which they will diffract, and may be slightly misoriented with respect to each other and/or may have different lattice spacing.

X-ray diffraction properties of curved crystal diffractors

1992 ◽  
Vol 50 (2) ◽  
pp. 1734-1735
Author(s):  
W. Z. Chang ◽  
D. B. Wittry
Keyword(s):  
Diffraction Theory ◽  
X Rays ◽  
Diffraction Image ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Bent Crystal ◽  
Diffraction Geometry ◽  
Crystal Parameter ◽  
Quantitative Procedure

Since Du Mond and Kirkpatrick first discussed the principle of a bent crystal spectrograph in 1930, curved single crystals have been widely utilized as spectrometric monochromators as well as diffractors for focusing x rays diverging from a point. Curved crystal diffraction theory predicts that the diffraction parameters - the rocking curve width w, and the peak reflection coefficient r of curved crystals will certainly deviate from those of their flat form. Due to a lack of curved crystal parameter data in current literature and the need for optimizing the choice of diffraction geometry and crystal materials for various applications, we have continued the investigation of our technique presented at the last conference. In the present abstract, we describe a more rigorous and quantitative procedure for measuring the parameters of curved crystals.The diffraction image of a singly bent crystal under study can be obtained by using the Johann geometry with an x-ray point source.

Development of a novel apparatus for experiments in soft X-ray diffraction imaging and diffraction tomography

2003 ◽  
Vol 104 ◽  
pp. 27-30 ◽  
Author(s):  
T. Beetz ◽  
C. Jacobsen ◽  
C.-C. Kao ◽  
J. Kirz ◽  
O. Mentes ◽  
...  
Keyword(s):  
Diffraction Tomography ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Imaging

scholarly journals Simultaneous Multi-Bragg Peak Coherent X-ray Diffraction Imaging

Crystals ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 312
Author(s):  
Florian Lauraux ◽  
Stéphane Labat ◽  
Sarah Yehya ◽  
Marie-Ingrid Richard ◽  
Steven J. Leake ◽  
...  
Keyword(s):  
Bragg Reflection ◽  
Volume Ratio ◽  
X Ray Diffraction ◽  
X Ray ◽  
Crystal Substrate ◽  
In Series ◽  
Diffraction Imaging ◽  
Diffraction Patterns ◽  
Lattice Planes ◽  
Oriented Parallel

The simultaneous measurement of two Bragg reflections by Bragg coherent X-ray diffraction is demonstrated on a twinned Au crystal, which was prepared by the solid-state dewetting of a 30 nm thin gold film on a sapphire substrate. The crystal was oriented on a goniometer so that two lattice planes fulfill the Bragg condition at the same time. The Au 111 and Au 200 Bragg peaks were measured simultaneously by scanning the energy of the incident X-ray beam and recording the diffraction patterns with two two-dimensional detectors. While the former Bragg reflection is not sensitive to the twin boundary, which is oriented parallel to the crystal–substrate interface, the latter reflection is only sensitive to one part of the crystal. The volume ratio between the two parts of the twinned crystal is about 1:9, which is also confirmed by Laue microdiffraction of the same crystal. The parallel measurement of multiple Bragg reflections is essential for future in situ and operando studies, which are so far limited to either a single Bragg reflection or several in series, to facilitate the precise monitoring of both the strain field and defects during the application of external stimuli.

scholarly journals X-ray imaging of silicon die within fully packaged semiconductor devices

2021 ◽  
pp. 1-7
Author(s):  
Brian K. Tanner ◽  
Patrick J. McNally ◽  
Andreas N. Danilewsky
Keyword(s):  
Synchrotron Radiation ◽  
Feasibility Studies ◽  
Monochromatic Radiation ◽  
X Ray Diffraction ◽  
Divergent Beam ◽  
X Ray ◽  
X Ray Imaging ◽  
Setting Process ◽  
Diffraction Imaging ◽  
Lattice Planes

X-ray diffraction imaging (XRDI) (topography) measurements of silicon die warpage within fully packaged commercial quad-flat no-lead devices are described. Using synchrotron radiation, it has been shown that the tilt of the lattice planes in the Analog Devices AD9253 die initially falls, but after 100 °C, it rises again. The twist across the die wafer falls linearly with an increase in temperature. At 200 °C, the tilt varies approximately linearly with position, that is, displacement varies quadratically along the die. The warpage is approximately reversible on cooling, suggesting that it has a simple paraboloidal form prior to encapsulation; the complex tilt and twisting result from the polymer setting process. Feasibility studies are reported, which demonstrate that a divergent beam and quasi-monochromatic radiation from a sealed X-ray tube can be used to perform warpage measurements by XRDI in the laboratory. Existing tools have limitations because of the geometry of the X-ray optics, resulting in applicability only to simple warpage structures. The necessary modifications required for use in situations of complex warpage, for example, in multiple die interconnected packages are specified.

Experimental Qualification of a Novel X-Ray Diffraction Imaging Setup Based on Polycapillary X-Ray Optics

2010 ◽  
Vol 57 (5) ◽  
pp. 2564-2570 ◽  
Author(s):  
A. Castoldi ◽  
C. Ozkan ◽  
C. Guazzoni ◽  
A. Bjeoumikhov ◽  
R. Hartmann
Keyword(s):  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Diffraction Imaging ◽  
Imaging Setup

Full-field X-ray diffraction microscopy using polymeric compound refractive lenses

2014 ◽  
Vol 47 (6) ◽  
pp. 1882-1888 ◽  
Author(s):  
J. Hilhorst ◽  
F. Marschall ◽  
T. N. Tran Thi ◽  
A. Last ◽  
T. U. Schülli
Keyword(s):  
Imaging Techniques ◽  
Light And Electron Microscopy ◽  
Added Value ◽  
Acquisition Time ◽  
Imaging Method ◽  
X Ray Diffraction ◽  
Polymeric Compound ◽  
Full Field ◽  
X Ray ◽  
Diffraction Imaging

Diffraction imaging is the science of imaging samples under diffraction conditions. Diffraction imaging techniques are well established in visible light and electron microscopy, and have also been widely employed in X-ray science in the form of X-ray topography. Over the past two decades, interest in X-ray diffraction imaging has taken flight and resulted in a wide variety of methods. This article discusses a new full-field imaging method, which uses polymer compound refractive lenses as a microscope objective to capture a diffracted X-ray beam coming from a large illuminated area on a sample. This produces an image of the diffracting parts of the sample on a camera. It is shown that this technique has added value in the field, owing to its high imaging speed, while being competitive in resolution and level of detail of obtained information. Using a model sample, it is shown that lattice tilts and strain in single crystals can be resolved simultaneously down to 10−3° and Δa/a= 10−5, respectively, with submicrometre resolution over an area of 100 × 100 µm and a total image acquisition time of less than 60 s.

Development of Diamond-Based X-ray Detection for High Flux Beamline Diagnostics

2009 ◽  
Vol 1203 ◽  
Author(s):  
Jen Bohon ◽  
John Smedley ◽  
Erik M. Muller ◽  
Jeffrey W. Keister
Keyword(s):  
Single Crystal ◽  
Linear Response ◽  
Voltage Dependence ◽  
Cvd Diamond ◽  
High Flux ◽  
National Synchrotron Light Source ◽  
X Ray ◽  
Single Crystal Diamond ◽  
Synchrotron Light ◽  
Pulse Structure

AbstractHigh quality single crystal and polycrystalline CVD diamond detectors with platinum contacts have been tested at the white beam X28C beamline at the National Synchrotron Light Source under high-flux conditions. The voltage dependence of these devices has been measured under DC and pulsed-bias conditions, establishing the presence or absence of photoconductive gain in each device. Linear response has been achieved over eleven orders of magnitude when combined with previous low flux studies. Temporal measurements with single crystal diamond detectors have resolved the ns scale pulse structure of the NSLS.

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