Effects of Stripe Rust Infection on the Levels of Redox Balance and Photosynthetic Capacities in Wheat

Wheat stripe rust (Puccinia striiformis f. sp. tritici, Pst) is the most destructive wheat disease and a major problem for the productivity of wheat in the world. To obtain a better understanding about different effects of redox homeostasis and photosystem (PS) to Pst infection in wheat, we investigated the differences in photosynthesis and the antioxidant defense system in wheat cultivar Chuanmai42 (CM42) in response to two Chinese Pst races known as CYR32 and V26. The results showed that V26-infected wheat accumulated a higher reactive oxygen species (ROS), cell death, and energy dissipation than CYR32-infected wheat when compared with the control. Furthermore, we found that the activities of three antioxidant enzymes (APX, GR, and GPX) and four resistance-related enzymes in CYR32-infected wheat were significantly higher than that in V26-infected wheat. In addition, quantitative RT-PCR indicated that the expression levels of two genes associated with resistant stripe rust in CYR32-infected wheat were clearly higher than that in V26-infected wheat. Compared with CYR32-infected wheat, lower photochemical efficiencies were observed in V26-infected wheat at the adult stage. Meanwhile, only a marked decline in D1 protein was observed in V26-infected wheat. We therefore deduced that wheat with stripe rust resistance could maintain high resistance and photosynthetic capacity by regulating the antioxidant system, disease-resistant related enzymes and genes, and the levels of PSII reaction center proteins.

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Rapid identification of a stripe rust resistance gene YrXK in Chinese wheat line Xike01015 using specific locus amplified fragment (SLAF) sequencing

Plant Disease ◽

10.1094/pdis-12-20-2648-re ◽

2021 ◽

Author(s):

Cai Sun ◽

Yike Liu ◽

Qiang Li ◽

Baotong Wang ◽

Shuhui Chen ◽

...

Keyword(s):

Stripe Rust ◽

Puccinia Striiformis ◽

Gene Annotation ◽

Dominant Gene ◽

Rapid Identification ◽

Wheat Breeding ◽

Stripe Rust Resistance ◽

Phenotypic Variance ◽

F2 Population ◽

Chinese Wheat

Wheat stripe rust, an airborne fungal disease and caused by Puccinia striiformis Westend. f. sp. tritici (Pst), is one of the most devastating diseases on wheat. It is the most effective and economical measure for the diseases control to identify high-level resistance genes and apply in wheat breeding. Chinese wheat cultivar Xike01015 presents high levels of all stage resistance (ASR) to the current predominant Pst race CYR33. In this study, a single dominant gene, designated as YrXk, was identified in Xike01015 conferring resistance to CYR33 with genetic analysis of F2 and BC1 population from cross of Mingxian169 (susceptible) and Xike01015. The specific length amplified fragment sequencing (SLAF-seq) strategy was used to construct linkage map in the F2 population. QTL analysis mapped YrXk to a 12.4 Mb segment on chromosome1BS, explaining over 86.96% phenotypic variance. Gene annotation in the QTL region identified three differential expressed candidate genes , TraesCS1B02G168600.1, TraesCS1B02G170200.1, and TraesCS1B02G172400.1. The qRT-PCR results displayed that TraesCS1B02G170200.1 and TraesCS1B02G168600.1 significantly up-regulated and down-regulated, respectively, and TraesCS1B02G170200.1 slightly up-regulated after changed with CYR33 in the seedling stage, which indicating these genes may function in wheat resistance to stripe rust. The results of this study can be used in wheat breeding for improving resistance to stripe rust.

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Distribution of Puccinia striiformis f. sp. tritici races and virulence in wheat growing regions of Kenya from 1970 TO 2014

Plant Disease ◽

10.1094/pdis-11-20-2341-re ◽

2021 ◽

Author(s):

Mercy Wamalwa ◽

Ruth Wanyera ◽

Julian Rodriguez-Algaba ◽

Lesley Boyd ◽

James Owuoche ◽

...

Keyword(s):

Stripe Rust ◽

Fungal Pathogen ◽

Puccinia Striiformis ◽

Yellow Rust ◽

Stripe Rust Resistance ◽

Scar Markers ◽

Seedling Resistance ◽

Sequence Characterized Amplified Region ◽

Triticum Spp ◽

Virulence Diversity

Stripe rust, caused by the fungal pathogen Puccinia striiformis f. sp. tritici (Pst), is a major threat to wheat (Triticum spp.) production worldwide. The objective of this study was to determine the virulence of Pst races prevalent in the main wheat growing regions of Kenya, which includes Mt. Kenya, Eastern Kenya, and the Rift Valley (Central, Southern, and Northern Rift). Fifty Pst isolates collected from 1970 to 1992 and from 2009 to 2014 were virulence phenotyped using stripe rust differential sets, and 45 isolates were genotyped with sequence characterized amplified region (SCAR) markers to differentiate among the isolates and identify aggressive strains PstS1 and PstS2. Virulence corresponding to stripe rust resistance genes Yr1, Yr2, Yr3, Yr6, Yr7, Yr8, Yr9, Yr17, Yr25, Yr27 and the seedling resistance in genotype Avocet S were detected. Ten races were detected in the Pst samples obtained from 1970 to 1992, and three additional races were detected from 2009 to 2014, with a single race being detected in both periods. The SCAR markers detected both Pst1 and Pst2 strains in the collection. Increasing Pst virulence was found in the Kenyan Pst population, and that diverse Pst race groups dominated different wheat growing regions. Moreover, recent Pst races in east Africa indicated possible migration of some race groups into Kenya from other regions. This study is important in understanding Pst evolution and virulence diversity and useful in breeding wheat cultivars with effective resistance to stripe rust. Keywords: pathogenicity, Puccinia f. sp. tritici stripe (yellow) rust, Triticum aestivum

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Emerging Yr26-Virulent Races of Puccinia striiformis f. tritici Are Threatening Wheat Production in the Sichuan Basin, China

Plant Disease ◽

10.1094/pdis-08-14-0865-re ◽

2015 ◽

Vol 99 (6) ◽

pp. 754-760 ◽

Cited By ~ 45

Author(s):

D. J. Han ◽

Q. L. Wang ◽

X. M. Chen ◽

Q. D. Zeng ◽

J. H. Wu ◽

...

Keyword(s):

Stripe Rust ◽

Sichuan Basin ◽

Puccinia Striiformis ◽

Field Tests ◽

Wheat Breeding ◽

Stripe Rust Resistance ◽

Breeding Lines ◽

Wheat Production ◽

Stripe Rust Resistance Gene ◽

The Sichuan Basin

Stripe rust, caused by Puccinia striiformis f. tritici, is one of the most destructive diseases of wheat in the world. The Sichuan Basin is one of the most important regions of wheat production and stripe rust epidemics in China. Stripe rust resistance gene Yr26 (the same gene as Yr24) has been widely used in wheat breeding programs and in many cultivars grown in this region since the gene was discovered in the early 1990s. Virulence to Yr26 has increased in frequency since its first detection in 2008. The objective of this study was to assess the vulnerability of the wheat cultivars and breeding lines in the Sichuan Basin to Yr26-virulent races. In total, 85 wheat accessions were tested with Yr26-avirulent races CYR32, CYR33, and Su11-4 and two Yr26-virulent races, V26/CM42 and V26/Gui22. DNA markers for Yr26 were used to determine the presence and absence of Yr26 in the wheat accessions. Of the 85 wheat accessions, only 5 were resistant and 19 susceptible to all races tested, and the remaining 61 were resistant to at least one or more races tested in seedling stage. In all, 65 (76.5%) accessions were susceptible to the emerging Yr26-virulent race V26/Gui22. In field tests, susceptible accessions increased from 31.8% in a nursery inoculated with predominant and Yr26-avirulent races to 61.2% in the nursery inoculated with the predominant races mixed with V26/Gui22. Based on the results of the molecular marker and race tests, 33 (38.8%) accessions were determined to have Yr26, showing that the Yr26 virulence is a major threat to wheat production in the Sichuan Basin and potentially in other regions of China.

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Molecular Mapping of YrSP and Its Relationship with Other Genes for Stripe Rust Resistance in Wheat Chromosome 2BL

Phytopathology ◽

10.1094/phyto-03-15-0060-r ◽

2015 ◽

Vol 105 (9) ◽

pp. 1206-1213 ◽

Cited By ~ 18

Author(s):

J. Y. Feng ◽

M. N. Wang ◽

X. M. Chen ◽

D. R. See ◽

Y. L. Zheng ◽

...

Keyword(s):

Stripe Rust ◽

Chromosomal Location ◽

Molecular Mapping ◽

Puccinia Striiformis ◽

Dominant Gene ◽

The United States ◽

Stripe Rust Resistance ◽

Recurrent Parent ◽

Isogenic Line ◽

Sts Markers

Stripe rust, caused by Puccinia striiformis f. sp. tritici, is an important disease of wheat worldwide. Resistance is the best way to control the disease. YrSP, a gene originally from ‘Spaldings Prolific’ wheat and providing resistance to a broad spectrum of races, is used for differentiating P. striiformis f. sp. tritici races but its chromosomal location is not clear. To map YrSP, a near-isogenic line (AvSYrSPNIL) was backcrossed to the recurrent parent, Avocet S. Genetic analysis of the BC7F1, BC8, BC7F2, and BC7F3 progenies confirmed a single dominant gene for resistance. In total, 182 BC7F2 plants and their derived BC7F3 lines were phenotyped with an avirulent P. striiformis f. sp. tritici race and genotyped with simple-sequence repeat (SSR), single-nucleotide polymorphism (SNP), and sequence-tagged site (STS) markers. A linkage map was constructed with 3 SSR, 17 SNP, and 3 STS markers covering 23.3 centimorgans (cM). Markers IWA638 and dp269 were 0.6 cM proximal and 1.5 cM distal, respectively, to YrSP. The gene was mapped in chromosome bin 2BL-C-0.5, physically within the proximal 50% of the chromosome 2BL arm. Allelism tests based on F2 phenotypes indicated that YrSP is closely linked to but not allelic with genes Yr5, Yr7, Yr43, Yr44, and Yr53. Infection type data from tests with 10 historical and currently predominant P. striiformis f. sp. tritici races in the United States also demonstrated differences in specificity between YrSP and the other genes. The specificity of YrSP is useful in differentiating P. striiformis f. sp. tritici races and studying the plant–pathogen interactions, and the information of chromosomal location of the gene and its tightly linked markers should be useful in developing resistant cultivars when combined with other genes for resistance to stripe rust.

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Construction of a hexaploid wheat (Triticum aestivumL.) bacterial artificial chromosome library for cloning genes for stripe rust resistance

Genome ◽

10.1139/g05-078 ◽

2005 ◽

Vol 48 (6) ◽

pp. 1028-1036 ◽

Cited By ~ 13

Author(s):

P Ling ◽

X M Chen

Keyword(s):

Triticum Aestivum ◽

Stripe Rust ◽

Hexaploid Wheat ◽

Rust Resistance ◽

Puccinia Striiformis ◽

Bac Library ◽

Artificial Chromosome ◽

Stripe Rust Resistance ◽

Insert Size ◽

Bac Clones

A hexaploid wheat (Triticum aestivum L.) bacterial artificial chromosome (BAC) library was constructed for cloning Yr5 and other genes conferring resistance to stripe rust (Puccinia striiformis f. sp. tritici). Intact nuclei from a Yr5 near-isogenic line were used to isolate high molecular weight DNA, which was partially cleaved with HindIII and cloned into pECBAC1 and pIndigoBAC-5 vectors. The wheat BAC library consisted of 422 400 clones arrayed in 1100 micro-titer plates (each plate with 384 wells). Random sampling of 300 BAC clones indicated an average insert size of 140 kb, with a size range from 25 to 365 kb. Ninety percent of the clones in the library had an insert size greater than 100 kb and fewer than 5% of the clones did not contain inserts. Based on an estimated genome size of 15 966 Mb for hexaploid wheat, the BAC library was estimated to have a total coverage of 3.58× wheat genome equivalents, giving approximately 96% probability of identifying a clone representing any given wheat DNA sequence. Twelve BAC clones containing an Yr5 locus-specific marker (Yr5STS7/8) were successfully selected by PCR screening of 3-dimensional BAC pools. The results demonstrated that the T. aestivum BAC library is a valuable genomic resource for positional cloning of Yr5. The library also should be useful in cloning other genes for stripe rust resistance and other traits of interest in hexaploid wheat.Key words: BAC library, BAC pools, hexaploid wheat, Puccinia striiformis f. sp. tritici, resistance gene, stripe rust, Triticum aestivum.

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High-temperature adult-plant resistance to stripe rust in facultative winter wheat

Crop and Pasture Science ◽

10.1071/cp16073 ◽

2016 ◽

Vol 67 (10) ◽

pp. 1064 ◽

Cited By ~ 2

Author(s):

Beyhan Akin ◽

Xian Ming Chen ◽

Alex Morgunov ◽

Nusret Zencirci ◽

Anmin Wan ◽

...

Keyword(s):

Molecular Markers ◽

High Temperature ◽

Winter Wheat ◽

Stripe Rust ◽

Field Experiments ◽

Puccinia Striiformis ◽

Yellow Rust ◽

Stripe Rust Resistance ◽

Adult Plant ◽

Improvement Program

Stripe (yellow) rust, caused by Puccinia striiformis Westend. f. sp. tritici Erikss., is one of the most damaging diseases in wheat and is especially damaging for winter and facultative wheat. The objective of this study was to understand stripe rust resistance in 100 wheat and facultative wheat entries from the International Winter Wheat Improvement Program by conducting experiments in a greenhouse and in four field environments in Washington State, USA, and by genotyping molecular markers linked to Yr genes. Percentages of entries resistant to the rust races at the seedling stage were: PST-17, 44%; PST-37, 32%; PST-43, 45%; PST-45, 49%; PST-116, 18%; PST-100, 17%; and PST-127, 8%. Molecular markers were positive for genes Yr9, Yr17, and Yr18 and negative for Yr5, Yr10, and Yr15. Yr18 was present in 44 entries (44%). By using the highly virulent races PST-127 and PST-100 under controlled conditions, 16 entries were shown to have high-temperature adult-plant (HTAP) resistance and resistant–moderately resistant field reactions at all four field sites. Resistant entries, especially those with HTAP resistance, were also identified in the field experiments.

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Development of resistance gene analog polymorphism markers for the Yr9 gene resistance to wheat stripe rust

Genome ◽

10.1139/g01-028 ◽

2001 ◽

Vol 44 (4) ◽

pp. 509-516 ◽

Cited By ~ 34

Author(s):

Z X Shi ◽

X M Chen ◽

R F Line ◽

H Leung ◽

C R Wellings

Keyword(s):

Molecular Markers ◽

Resistance Gene ◽

Stripe Rust ◽

Puccinia Striiformis ◽

Resistance Gene Analog ◽

Stripe Rust Resistance ◽

Isogenic Line ◽

Wheat Cultivars ◽

Development Of Resistance ◽

Rye Translocations

The Yr9 gene, which confers resistance to stripe rust caused by Puccinia striiformis f.sp. tritici (P. s. tritici) and originated from rye, is present in many wheat cultivars. To develop molecular markers for Yr9, a Yr9 near-isogenic line, near-isogenic lines with nine other Yr genes, and the recurrent wheat parent 'Avocet Susceptible' were evaluated for resistance in the seedling stage to North American P. s. tritici races under controlled temperature in the greenhouse. The resistance gene analog polymorphism (RGAP) technique was used to identify molecular markers for Yr9. The BC7:F2 and BC7:F3 progeny, which were developed by backcrossing the Yr9 donor wheat cultivar Clement with 'Avocet Susceptible', were evaluated for resistance to stripe rust races. Genomic DNA was extracted from 203 BC7:F2 plants and used for cosegregation analysis. Of 16 RGAP markers confirmed by cosegregation analysis, 4 were coincident with Yr9 and 12 were closely linked to Yr9 with a genetic distance ranging from 1 to 18 cM. Analyses of nulli-tetrasomic 'Chinese Spring' lines with the codominant RGAP marker Xwgp13 confirmed that the markers and Yr9 were located on chromosome 1B. Six wheat cultivars reported to have 1B/1R wheat-rye translocations and, presumably, Yr9, and two rye cultivars were inoculated with four races of P. s. tritici and tested with 9 of the 16 RGAP markers. Results of these tests indicate that 'Clement', 'Aurora', 'Lovrin 10', 'Lovrin 13', and 'Riebesel 47/51' have Yr9 and that 'Weique' does not have Yr9. The genetic information and molecular markers obtained from this study should be useful in cloning Yr9, in identifying germplasm that may have Yr9, and in using marker-assisted selection for combining Yr9 with other stripe rust resistance genes.Key words: molecular markers, Puccinia striiformis f.sp. tritici, resistance gene analog polymorphism, Triticum aestivum.

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Genetic and Molecular Mapping of Stripe Rust Resistance Gene in Wheat–Psathyrostachys huashanica Translocation Line H9020-1-6-8-3

Plant Disease ◽

10.1094/pdis-03-11-0204-re ◽

2012 ◽

Vol 96 (10) ◽

pp. 1482-1487 ◽

Cited By ~ 19

Author(s):

Qiang Li ◽

Jing Huang ◽

Lu Hou ◽

Pei Liu ◽

Jinxue Jing ◽

...

Keyword(s):

Resistance Gene ◽

Stripe Rust ◽

Rust Resistance ◽

Puccinia Striiformis ◽

Durable Resistance ◽

Rust Resistance Gene ◽

Stripe Rust Resistance ◽

Translocation Line ◽

Psathyrostachys Huashanica ◽

Stripe Rust Resistance Gene

Stripe rust, caused by Puccinia striiformis f. sp. tritici, is one of the most important diseases of wheat worldwide. The best strategy to control stripe rust is to grow resistant cultivars, but only a few effective genes are available. The wheat accession H9020-1-6-8-3 is a translocation line previously developed from interspecific hybridization between wheat genotype 7182 and Psathyrostachys huashanica, and is resistant to most Chinese Puccinia striiformis f. sp. tritici races. To identify the resistance genes in the translocation line, H9020-1-6-8-3 was crossed with susceptible genotype Mingxian 169, and seedlings of parents and F1, F2, and F3 progenies were tested with prevalent Chinese P. striiformis f. sp. tritici races CYR32 and CYR33 under controlled greenhouse conditions. The genetic results indicated that two single dominant genes in H9020-1-6-8-3 confer resistance to CYR32 and CYR33, respectively. The gene for resistance to CYR33 was temporarily designated as YrH9020. Six simple-sequence repeat markers were used to map the resistance gene to the short arm of wheat chromosome 2D, using 329 F2 plants tested with CYR33 in the greenhouse. The genetic distances of the two closest flanking markers, Xgwm261 and Xgwm455, were 4.4 and 5.8 centimorgans, respectively. Disease assessments and polymorphic tests of the flanking markers among the Psathyrostachys huashanica line and wheat lines 7182, H9020-1-6-8-3, and Mingxian169 suggested that the resistance gene YrH9020 in H9020-1-6-8-3 was originally from P. huashanica. The exotic stripe rust resistance gene and linked molecular markers should be useful for pyramiding with other genes to develop wheat cultivars with high-level and durable resistance to stripe rust.

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Quantitative Trait Loci Mapping of Adult Plant and Seedling Resistance to Stripe Rust (Puccinia striiformis Westend.) in a Multiparent Advanced Generation Intercross Wheat Population

Frontiers in Plant Science ◽

10.3389/fpls.2021.684671 ◽

2021 ◽

Vol 12 ◽

Author(s):

Sandra Rollar ◽

Manuel Geyer ◽

Lorenz Hartl ◽

Volker Mohler ◽

Frank Ordon ◽

...

Keyword(s):

Stripe Rust ◽

Resistance Genes ◽

Quantitative Trait ◽

Rust Resistance ◽

Puccinia Striiformis ◽

Stripe Rust Resistance ◽

Adult Plant ◽

Seedling Resistance ◽

Wheat Population ◽

Advanced Generation

Stripe rust caused by the biotrophic fungus Puccinia striiformis Westend. is one of the most important diseases of wheat worldwide, causing high yield and quality losses. Growing resistant cultivars is the most efficient way to control stripe rust, both economically and ecologically. Known resistance genes are already present in numerous cultivars worldwide. However, their effectiveness is limited to certain races within a rust population and the emergence of stripe rust races being virulent against common resistance genes forces the demand for new sources of resistance. Multiparent advanced generation intercross (MAGIC) populations have proven to be a powerful tool to carry out genetic studies on economically important traits. In this study, interval mapping was performed to map quantitative trait loci (QTL) for stripe rust resistance in the Bavarian MAGIC wheat population, comprising 394 F6 : 8 recombinant inbred lines (RILs). Phenotypic evaluation of the RILs was carried out for adult plant resistance in field trials at three locations across three years and for seedling resistance in a growth chamber. In total, 21 QTL for stripe rust resistance corresponding to 13 distinct chromosomal regions were detected, of which two may represent putatively new QTL located on wheat chromosomes 3D and 7D.

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Defining the genetic architecture of stripe rust resistance in the barley accession HOR 1428

10.1101/093773 ◽

2016 ◽

Author(s):

Shaun Clare ◽

William Kitcher ◽

Matthew Gardiner ◽

Phon Green ◽

Amelia Hubbard ◽

...

Keyword(s):

Stripe Rust ◽

Genetic Architecture ◽

Genetic Resource ◽

Puccinia Striiformis ◽

Stripe Rust Resistance ◽

Seedling Resistance ◽

Major Constraint ◽

Barley Stripe Rust ◽

Kasp Marker ◽

Mapping Information

ABSTRACTPuccinia striiformis f. sp. hordei, the causal agent of barley stripe rust, is a destructive fungal pathogen that significantly affects barley cultivation. A major constraint in breeding resistant cultivars is the lack of mapping information of resistance (R) genes and their introgression into adapted germplasm. A considerable number of R genes have been described in barley to P. striiformis f. sp. hordei, but only a few loci have been mapped. Previously, Chen and Line (1999) reported two recessive seedling resistance loci in the Ethiopian landrace HOR 1428. In this study, we map two loci that confer resistance to P. striiformis f. sp. hordei in HOR 1428, which are located on chromosomes 3H and 5H. Both loci act as additive effect QTLs, each explaining approximately 20% of the phenotypic variation. We backcrossed HOR 1428 to the cv. Manchuria and selected based on markers flanking the RpsHOR128-5H locus. Saturation of the RpsHOR1428-5H locus with markers in the region found KASP marker K_1_0292 in complete coupling with resistance to P. striiformis f. sp. hordei and was designated Rps9. Isolation of Rps9 and flanking markers will facilitate the deployment of this genetic resource into existing programs for P. striiformis f. sp. hordei resistance.

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