scholarly journals A Fast and Implantation-Free Sample Production Method for Large Scale Electron-Transparent Metallic Samples Destined for MEMS-Based In Situ S/TEM Experiments

Materials ◽  
2021 ◽  
Vol 14 (5) ◽  
pp. 1085
Author(s):  
Matheus A. Tunes ◽  
Cameron R. Quick ◽  
Lukas Stemper ◽  
Diego S. R. Coradini ◽  
Jakob Grasserbauer ◽  
...  
Keyword(s):  
Sample Preparation ◽  
Large Scale ◽  
Microelectromechanical Systems ◽  
Materials Science ◽  
Basic Research ◽  
Production Method ◽  
Chip Experiment ◽  
In Situ Experiments ◽  
Electron Microscopes

Microelectromechanical systems (MEMS) are currently supporting ground-breaking basic research in materials science and metallurgy as they allow in situ experiments on materials at the nanoscale within electron microscopes in a wide variety of different conditions such as extreme materials dynamics under ultrafast heating and quenching rates as well as in complex electro-chemical environments. Electron-transparent sample preparation for MEMS e-chips remains a challenge for this technology as the existing methodologies can introduce contaminants, thus disrupting the experiments and the analysis of results. Herein we introduce a methodology for simple and fast electron-transparent sample preparation for MEMS e-chips without significant contamination. The quality of the samples as well as their performance during a MEMS e-chip experiment in situ within an electron microscope are evaluated during a heat treatment of a crossover AlMgZn(Cu) alloy.

In Situ Transmission Electron Microscope Studies of Ion Irradiation-Induced and Irradiation-Enhanced Phase Changes

1991 ◽  
Vol 235 ◽  
Author(s):  
Charles W. Allen
Keyword(s):  
Materials Science ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Phase Changes ◽  
In Situ Tem ◽  
Irradiation Effects ◽  
Transmission Electron ◽  
In Situ Experiments ◽  
Electron Microscopes

ABSTRACTMotivated at least initially by materials needs for nuclear reactor development, extensive irradiation effects studies employing transmission electron microscopes (TEM) have been performed for several decades, involving irradiation-induced and irradiation-enhanced microstructural changes, including phase transformations such as precipitation, dissolution, crystallization, amorphization, and order-disorder phenomena. From the introduction of commercial high voltage electron microscopes (HVEM) in the mid-1960s, studies of electron irradiation effects have constituted a major aspect of HVEM application in materials science. For irradiation effects studies two additional developments have had particularly significant impact; (1) the development of TEM specimen holders in which specimen temperature can be controlled in the range 10–2200 K and (2) the interfacing of ion accelerators which allows in situ TEM studies of irradiation effects and the ion beam modification of materials within this broad temperature range. This paper treats several aspects of in situ studies of electron and ion beam-induced and enhanced phase changes and presents two case studies involving in situ experiments performed in an HVEM to illustrate the strategies of such an approach of the materials research of irradiation effects.

Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

1996 ◽  
Vol 54 ◽  
pp. 384-385
Author(s):  
M.A. O’Keefe ◽  
J. Taylor ◽  
D. Owen ◽  
B. Crowley ◽  
K.H. Westmacott ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
User Interface ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Materials Science ◽  
Transmission Electron ◽  
On Line ◽  
Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

scholarly journals In Situ Ion Beam Research In Argonne's Intermediate Voltage Electron Microscope

1996 ◽  
Vol 439 ◽  
Author(s):  
Charles W. Allen ◽  
Edward A. Ryan
Keyword(s):  
Electron Microscope ◽  
Ion Irradiation ◽  
Noble Gas ◽  
Ion Beam ◽  
Voltage Electron ◽  
In Situ Experiments ◽  
User Facility ◽  
New Instrumentation ◽  
Electron Microscopes

AbstractSince Fall 1995, a state-of-the-art intermediate voltage electron microscope (IVEM) has been operational in the HVEM-Tandem Facility with in situ ion irradiation capabilities similar to those of the HVEM of the Facility. A 300 kV Hitachi H-9000NAR is interfaced to the two ion accelerators of the Facility, with a demonstrated point-topoint spatial resolution for imaging of 0.25 nm with the ion beamline attached to the microscope. The IVEM incorporates a Faraday cup system for ion dosimetry with measurement aperture 6.5 cm from the TEM specimen, which was described in Symposium A of the 1995 MRS Fall Meeting. The IVEM is now employed for a variety of in situ ion beam studies ranging from low dose ion damage experiments with GaAs, in which damage zones individual displacement cascades are observed, to implantation studies in metals, in which irradiation-induced noble gas precipitate mobility is studied in real time. In this presentation, the new instrumentation and its specifications will be described briefly, several basic concepts relating to in situ experiments in transmission electron microscopes will be summarized and examples of in situ experiments will be presented which exploit the experimental capabilities of this new user facility instrumentation.

scholarly journals Quantitative In Situ Mechanical Testing in Electron Microscopes

MRS Bulletin ◽  
2010 ◽  
Vol 35 (5) ◽  
pp. 354-360 ◽  
Author(s):  
M. Legros ◽  
D.S. Gianola ◽  
C. Motz
Keyword(s):  
Electron Microscopy ◽  
Plastic Deformation ◽  
Sample Preparation ◽  
Mechanical Testing ◽  
Digital Image ◽  
Recent Progress ◽  
Image Acquisition ◽  
In Situ Mechanical Testing ◽  
Electron Microscopes

AbstractThis article is devoted to recent progress in the area of in situ electron microscopy (scanning and transmission) and will focus on quantitative aspects of these techniques as applied to the deformation of materials. Selected recent experiments are chosen to illustrate how these techniques have benefited from improvements ranging from sample preparation to digital image acquisition. Known for its ability to capture the underlying phenomena of plastic deformation as they occur, in situ electron microscopy has evolved to a level where fully instrumented micro- and nanomechanical tests can be performed simultaneously.

scholarly journals The Role of Electron Microscopy in Materials Science

1982 ◽  
Vol 35 (6) ◽  
pp. 727 ◽  
Author(s):  
PB Hirsch
Keyword(s):  
Electron Microscopy ◽  
Materials Science ◽  
Optical Techniques ◽  
Bulk Properties ◽  
In Situ Experiments ◽  
Powerful Means ◽  
Appropriate Scale ◽  
Powerful Electron

The properties of the materials in a component or a device depend on structure and composition often on a scale of 10-10 to 10-6 m. Electron microscopy and microanalytical techniques provide a powerful means for determining the structure and composition on the appropriate scale, lead to an understanding of basic mechanisms, and by correlation or in situ experiments to explanations of bulk properties. Examples are given of the application of a variety of powerful electron optical techniques to a number of materials problems.

Defect fine Structures as observed by in situ experiments

1990 ◽  
Vol 48 (4) ◽  
pp. 458-459
Author(s):  
H. Saka
Keyword(s):  
Tensile Stress ◽  
Materials Science ◽  
External Stress ◽  
Dislocation Loops ◽  
Irradiation Creep ◽  
In Situ Experiment ◽  
In Situ Experiments ◽  
Fine Structures ◽  
Edge Dislocations

An in-situ experiment in an electron microscope is now a well established and useful technique in materials science. In this review recent contributions of in-situ experiments, especially of straining and heating experiments, to materials science will be high-lighted.The earlier works have been reviewed by Saka and Imura.It is believed that an external stress gives rise to an anistropy in the rate at which point defects are absorbed by edge dislocations; this mechanism is considered to explain the irradiation creep. A combined in situ tensile/irradiation experiment in a HVEM has been carried out to study effects of applied stress on the growth of dislocation loops. Fig. 1 shows typical microstructures of Ag irradiated at 403K for 10 min with 1MV electrons in the absence (a), and in the presence of an external stress of 5.5 kg/mm2 (b). Frank loops of interstial type, formed by electron irradiation, grew more rapidly in the direction of the external tensile stress than in the others. These results show that an external tensile stress has a profound effect on climb rates of Frank loops of interstitial type. However, detailed analysis of the results indicates that there is a considerable discrepancy between experiment and theory.

Applications of In-situ Sample Preparation and Modeling of SEM-STEM Imaging

2008 ◽  
Author(s):  
R.J. Young ◽  
A. Buxbaum ◽  
B. Peterson ◽  
R. Schampers
Keyword(s):  
Sample Preparation ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Dual Beam ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Preparation Techniques

Abstract Scanning transmission electron microscopy with scanning electron microscopes (SEM-STEM) has become increasing used in both SEM and dual-beam focused ion beam (FIB)-SEM systems. This paper describes modeling undertaken to simulate the contrast seen in such images. Such modeling provides the ability to help understand and optimize imaging conditions and also support improved sample preparation techniques.

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