scholarly journals Compared EC-AFM Analysis of Laser-Induced Graphene and Graphite Electrodes in Sulfuric Acid Electrolyte

Molecules ◽  
2021 ◽  
Vol 26 (23) ◽  
pp. 7333
Author(s):  
Claudia Filoni ◽  
Bahram Shirzadi ◽  
Marco Menegazzo ◽  
Eugenio Martinelli ◽  
Corrado Di Natale ◽  
...  
Keyword(s):  
Ex Situ ◽  
Oxidation Reactions ◽  
Acid Electrolyte ◽  
Spectroscopy Analysis ◽  
Graphite Electrodes ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Analysis ◽  
And Performance

Flexible and economic sensor devices are the focus of increasing interest for their potential and wide applications in medicine, food analysis, pollution, water quality, etc. In these areas, the possibility of using stable, reproducible, and pocket devices can simplify the acquisition of data. Among recent prototypes, sensors based on laser-induced graphene (LIGE) on Kapton represent a feasible choice. In particular, LIGE devices are also exploited as electrodes for sensing in liquids. Despite a characterization with electrochemical (EC) methods in the literature, a closer comparison with traditional graphite electrodes is still missing. In this study, we combine atomic force microscopy with an EC cell (EC-AFM) to study, in situ, electrode oxidation reactions when LIGE or other graphite samples are used as anodes inside an acid electrolyte. This investigation shows the quality and performance of the LIGE electrode with respect to other samples. Finally, an ex situ Raman spectroscopy analysis allows a detailed chemical analysis of the employed electrodes.

In situ X-ray Scattering Study of the Formation of Au Nano Crystals During Thermal Annealing

2007 ◽  
Vol 1027 ◽  
Author(s):  
Do Young Noh ◽  
Ki-Hyun Ryu ◽  
Hyon Chol Kang
Keyword(s):  
Thermal Annealing ◽  
Bragg Reflection ◽  
Ex Situ ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Au Thin Films ◽  
Ray Scattering

AbstractThe transformation of Au thin films grown on sapphire (0001) substrates into nano crystals during thermal annealing was investigated by in situ synchrotron x-ray scattering and ex situ atomic force microscopy (AFM). By monitoring the Au(111) Bragg reflection and the low Q reflectivity and comparing them with ex situ AFM images, we found that polygonal-shape holes were nucleated and grow initially. As the holes grow larger and contact each other, their boundary turns into Au nano crystals. The Au nano crystals have a well-defined (111) flat top surface and facets in the in-plane direction.

Coupling In-Situ Techniques to Analyze Zinc Deposition and Dissolution for Energy Storage Applications

2013 ◽  
Vol 1491 ◽  
Author(s):  
Jayme Keist ◽  
Christine Orme ◽  
Frances Ross ◽  
Dan Steingart ◽  
Paul Wright ◽  
...  
Keyword(s):  
Liquid Electrolyte ◽  
Scattering Data ◽  
Zinc Deposition ◽  
Ionic Liquid Electrolyte ◽  
Force Microscopy ◽  
In Situ Techniques ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Afm Analysis

ABSTRACTThis investigation describes preliminary results of in-situ analysis of zinc deposition within an ionic liquid electrolyte utilizing electrochemical atomic force microscopy (EC AFM). From the AFM analysis, the morphology of the zinc deposition was analyzed by quantifying the surface roughness using height-height correlation functions. These results will be used to analyze the scattering data obtained from zinc deposition analysis utilizing an electrochemical ultra-small angle x-ray scattering (EC USAXS). The goal of this research is to link the early nucleation and growth behavior to the formation of detrimental morphologies.

Ex Situ and In Situ Thermal Transformations of M-50 Pitch Revealed by Non-contact Atomic Force Microscopy

2021 ◽  
Author(s):  
Pengcheng Chen ◽  
Jordan N. Metz ◽  
Adam S. Gross ◽  
Stuart E. Smith ◽  
Steven P. Rucker ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ex Situ ◽  
Thermal Transformations ◽  
Force Microscopy ◽  
Atomic Force

(G03 Best Paper Award Winner) Analysis of Sn Behavior During Ni/GeSn Solid-State Reaction by Correlated X-ray Diffraction, Atomic Force Microscopy, and Ex-situ/In-situ Transmission Electron Microscopy

2020 ◽  
Vol MA2020-02 (24) ◽  
pp. 1750-1750
Author(s):  
Andrea Quintero Colmenares ◽  
Patrice Gergaud ◽  
Jean-Michel Hartmann ◽  
Vincent Delaye ◽  
Nicolas Bernier ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Ex Situ ◽  
Paper Award ◽  
X Ray Diffraction ◽  
Award Winner ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron

Nanoindentation Assisted Self-Assembly of Quantum Dots

2006 ◽  
Author(s):  
Curtis Taylor ◽  
Eric Stach ◽  
Gregory Salamo ◽  
Ajay Malshe
Keyword(s):  
Quantum Dots ◽  
Self Assembly ◽  
Surface Strain ◽  
Ex Situ ◽  
Atomic Step ◽  
Uniform Size ◽  
Force Microscopy ◽  
Atomic Force ◽  
And Performance ◽  
Spatial Positioning

The ability to pattern quantum dots with high spatial positioning and uniform size is critical for the realization of future electronic devices with novel properties and performance that surpass present technology. This work discusses the exploration of an innovative nanopatterning technique to direct the self-assembly of nanostructures. The technique focuses on perturbing surface strain energy by nanoindentation in order to mechanically bias quantum dot nucleation. Growth of InAs quantum dots on nanoindent templates is performed using molecular beam epitaxy (MBE). The effect of indent spacing and size on the patterned growth is investigated. The structural analysis of the quantum dots including spatial ordering, size, and shape are characterized by ex-situ atomic force microscopy (AFM). Results reveal that the indent patterns clearly bias nucleation with dot structures selectively growing on top of each indent. It is speculated that the biased nucleation is due to a combination of favorable surface strain attributed to subsurface dislocation strain fields and/or multi-atomic step formation at the indent sites, which leads to increased adatom diffusion on the patterned area.

Surface Structural Characterization and Mechanical Testing by Nanoindentation Measurements of Hybrid Polymer/clay Nanostructured Multilayer Films

2002 ◽  
Vol 17 (7) ◽  
pp. 1622-1633 ◽  
Author(s):  
Xiaowu Fan ◽  
Mi-Kyoung Park ◽  
Chuanjun Xia ◽  
Rigoberto Advincula
Keyword(s):  
Thin Films ◽  
Quartz Crystal ◽  
Ex Situ ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Diallyldimethylammonium Chloride

Nanostructured montmorillonite/poly(diallyldimethylammonium chloride) multilayer thin films were fabricated up to 100 layers thick by stepwise alternating polyelectrolyte and clay deposition from solution. The structure and morphology of the films were characterized by x-ray diffraction, ellipsometry, atomic force microscopy, and quartz crystal microbalance ex situ and in situ measurements. The mechanical properties were tested by nanoindentation. The hardness of the multilayer thin film was 0.46 GPa. The thin film's modulus was correlated to its ordering and anisotropic structure. Both hardness and modulus of this composite film were higher than those of several other types of polymer thin films.

Electromigration of Silicon Adatoms on Silicon (111) Surface

2011 ◽  
Vol 6 (2) ◽  
pp. 65-76
Author(s):  
Ekaterina E. Rodyakina ◽  
Sergey S. Kosolobov ◽  
Aleksandr V. Latyshev
Keyword(s):  
Electron Microscopy ◽  
Experimental Data ◽  
Effective Charge ◽  
Ex Situ ◽  
Equilibrium Conditions ◽  
Force Microscopy ◽  
Homoepitaxial Growth ◽  
Atomic Force ◽  
Reflection Electron Microscopy

Existence of adatom gradient concentration on surface between step bunches was shown under sublimation, homoepitaxial growth and near equilibrium conditions on silicon (111) surface at above 900 ºС by means of in situ ultrahigh vacuum reflection electron microscopy and ex situ atomic force microscopy. It is experimentally confirmed that adatom have negative (at 1 100 ºС) and positive (at 1 300 ºС) effective charge. We found out the sign of adatom effective charge independent on the supersaturation volume on the surface. On the hasement of experimental data we evaluated the effective charge of adatom at 1 280ºС; this quantity is placed between 0,07 ± 0,01 and 0,17 ± 0,02 of electron unit

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