scholarly journals Advanced Surface Probing Using a Dual-Mode NSOM–AFM Silicon-Based Photosensor

Nanomaterials ◽  
2019 ◽  
Vol 9 (12) ◽  
pp. 1792
Author(s):  
Matityahu Karelits ◽  
Emanuel Lozitsky ◽  
Avraham Chelly ◽  
Zeev Zalevsky ◽  
Avi Karsenty
Keyword(s):  
Surface Characterization ◽  
Near Field ◽  
Optical Microscope ◽  
Dual Mode ◽  
Atomic Force ◽  
Reflected Light ◽  
Afm Imaging ◽  
Silicon Cantilever ◽  
Afm Cantilever ◽  
Silicon Based

A feasibility analysis is performed for the development and integration of a near-field scanning optical microscope (NSOM) tip–photodetector operating in the visible wavelength domain of an atomic force microscope (AFM) cantilever, involving simulation, processing, and measurement. The new tip–photodetector consists of a platinum–silicon truncated conical photodetector sharing a subwavelength aperture, and processing uses advanced nanotechnology tools on a commercial silicon cantilever. Such a combined device enables a dual-mode usage of both AFM and NSOM measurements when collecting the reflected light directly from the scanned surface, while having a more efficient light collection process. In addition to its quite simple fabrication process, it is demonstrated that the AFM tip on which the photodetector is processed remains operational (i.e., the AFM imaging capability is not altered by the process). The AFM–NSOM capability of the processed tip is presented, and preliminary results show that AFM capability is not significantly affected and there is an improvement in surface characterization in the scanning proof of concept.

scholarly journals Multiple regimes of operation in bimodal AFM: understanding the energy of cantilever eigenmodes

2013 ◽  
Vol 4 ◽  
pp. 385-393 ◽  
Author(s):  
Daniel Kiracofe ◽  
Arvind Raman ◽  
Dalia Yablon
Keyword(s):  
Single Frequency ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Imaging ◽  
Multiple Regimes ◽  
Nanoscale Imaging ◽  
Relative Kinetic ◽  
Series Of Experiments ◽  
Tapping Mode Afm ◽  
Afm Cantilever

One of the key goals in atomic force microscopy (AFM) imaging is to enhance material property contrast with high resolution. Bimodal AFM, where two eigenmodes are simultaneously excited, confers significant advantages over conventional single-frequency tapping mode AFM due to its ability to provide contrast between regions with different material properties under gentle imaging conditions. Bimodal AFM traditionally uses the first two eigenmodes of the AFM cantilever. In this work, the authors explore the use of higher eigenmodes in bimodal AFM (e.g., exciting the first and fourth eigenmodes). It is found that such operation leads to interesting contrast reversals compared to traditional bimodal AFM. A series of experiments and numerical simulations shows that the primary cause of the contrast reversals is not the choice of eigenmode itself (e.g., second versus fourth), but rather the relative kinetic energy between the higher eigenmode and the first eigenmode. This leads to the identification of three distinct imaging regimes in bimodal AFM. This result, which is applicable even to traditional bimodal AFM, should allow researchers to choose cantilever and operating parameters in a more rational manner in order to optimize resolution and contrast during nanoscale imaging of materials.

scholarly journals AFM investigation of hyaline cartilage’s surface destruction

2016 ◽  
Author(s):  
Mikhail Ihnatouski ◽  
Dmitriy Karev ◽  
Boris Karev ◽  
Jolanta Pauk ◽  
Kristina Daunoravičienė
Keyword(s):  
Video Camera ◽  
Optical Microscope ◽  
Collagen Fibers ◽  
Force Microscopy ◽  
Digital Video Camera ◽  
Atomic Force ◽  
Reflected Light ◽  
Longitudinal Orientation ◽  
Chronic Progressive Disease ◽  
Surface Destruction

Introduction: Osteoarthritis is a chronic, progressive disease. The aim of this paper is presenting the AFM investigation of cartilage in relation to the assessment of degenerative changes in the surface of hyaline cartilage. It can be useful in choosing the most effective methods of therapy. Methods: Samples were taken from the cartilage surface of the femoral head after its removal during total hip arthroplasty. Images of the surface of the sample were obtained using an optical microscope equipped with a digital video camera, in the reflected light and by atomic force microscopy. Results: The longitudinal orientation of the collagen fibers and sub-fibers beams on the surface, up to a diameter of 50 nm are identified in non-destroyed area sites. Conclusions: Images of the destroyed areas displaying separately passing collagen fibers, strongly exposed to the surface: the size measured and found substructure.

Scanning Near-Field Optical Microscope Study of Ag Nanoprotrusions Fabricated by Nano-oxidation with Atomic Force Microscope

2003 ◽  
Vol 42 (Part 1, No. 12) ◽  
pp. 7635-7639 ◽  
Author(s):  
JunHo Kim ◽  
Jeongyong Kim ◽  
K.-B. Song ◽  
S.-Q. Lee ◽  
E.-K. Kim ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Microscope Study ◽  
Near Field ◽  
Optical Microscope ◽  
Atomic Force

Young’s Modulus Measurement of Electroplated Nickel Using AFM

2006 ◽  
Author(s):  
Sang-Hyun Kim ◽  
James G. Boyd
Keyword(s):  
Elastic Modulus ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Beam Theory ◽  
Spring Constant ◽  
Time Step ◽  
Simple Method ◽  
Atomic Force ◽  
Silicon Cantilever ◽  
Afm Cantilever

This paper addresses a relatively simple method of measuring Young's modulus of electroplated nickel using Atomic Force Microscope. Thin layer of nickel to be measured is electroplated onto the tip side of AFM silicon cantilever, whose Young's modulus and the geometric dimensions are defined from manufacturer. The resonant frequency and the quality factor of the electroplated AFM cantilever are measured by the tapping mode of AFM and its spring constant is calculated using Sader's method. The spring constant of the electroplated cantilever is also calculated by using the laminar composite beam theory. Comparing two spring constants, Young's modulus of the electroplated nickel is determined. The measured elastic modulus of nickel in each time step is in the range of between and the average elastic modulus is with relative uncertainty of less than 5%

Atomic-force-regulated near-field scanning optical microscope

1992 ◽  
Author(s):  
Ricardo Toledo-Crow ◽  
Yue Chen ◽  
Mehdi Vaez-Iravani
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Atomic Force ◽  
Near Field Scanning

scholarly journals Nano polarimetry: enhanced AFM-NSOM triple-mode polarimeter tip

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Matityahu Karelits ◽  
Zeev Zalevsky ◽  
Avi Karsenty
Keyword(s):  
Polarization State ◽  
Added Value ◽  
Optical Data ◽  
Scanning System ◽  
New Device ◽  
Atomic Force ◽  
Subwavelength Apertures ◽  
Silicon Cantilever ◽  
Afm Cantilever ◽  
Triple Mode

Abstract A novel application of a combined and enhanced NSOM-AFM tip-photodetector system resulted in a nanoscale Polarimeter, generated by four different holes, each sharing a different shape, and enabling that the four photonic readouts forming the tip will be the four Stokes coefficients, this in order to place the polarization state in the Poincare sphere. The new system has been built on standard Atomic Force Microscope (AFM) cantilever, in order to serve as a triple-mode scanning system, sharing complementary scanning topography, optical data analysis and polarization states. This new device, which has been designed and simulated using Comsol Multi-Physics software package, consists in a Platinum-Silicon drilled conical photodetector, sharing subwavelength apertures, and has been processed using advanced nanotechnology tools on a commercial silicon cantilever. After a comparison study of drilled versus filled tips advantages, and of several optics phenomena such as interferences, the article presents the added value of multiple-apertures scanning tip for nano-polarimetry.

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