scholarly journals Nano polarimetry: enhanced AFM-NSOM triple-mode polarimeter tip

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Matityahu Karelits ◽  
Zeev Zalevsky ◽  
Avi Karsenty
Keyword(s):  
Polarization State ◽  
Added Value ◽  
Optical Data ◽  
Scanning System ◽  
New Device ◽  
Atomic Force ◽  
Subwavelength Apertures ◽  
Silicon Cantilever ◽  
Afm Cantilever ◽  
Triple Mode

Abstract A novel application of a combined and enhanced NSOM-AFM tip-photodetector system resulted in a nanoscale Polarimeter, generated by four different holes, each sharing a different shape, and enabling that the four photonic readouts forming the tip will be the four Stokes coefficients, this in order to place the polarization state in the Poincare sphere. The new system has been built on standard Atomic Force Microscope (AFM) cantilever, in order to serve as a triple-mode scanning system, sharing complementary scanning topography, optical data analysis and polarization states. This new device, which has been designed and simulated using Comsol Multi-Physics software package, consists in a Platinum-Silicon drilled conical photodetector, sharing subwavelength apertures, and has been processed using advanced nanotechnology tools on a commercial silicon cantilever. After a comparison study of drilled versus filled tips advantages, and of several optics phenomena such as interferences, the article presents the added value of multiple-apertures scanning tip for nano-polarimetry.

scholarly journals Advanced Surface Probing Using a Dual-Mode NSOM–AFM Silicon-Based Photosensor

Nanomaterials ◽  
2019 ◽  
Vol 9 (12) ◽  
pp. 1792
Author(s):  
Matityahu Karelits ◽  
Emanuel Lozitsky ◽  
Avraham Chelly ◽  
Zeev Zalevsky ◽  
Avi Karsenty
Keyword(s):  
Surface Characterization ◽  
Near Field ◽  
Optical Microscope ◽  
Dual Mode ◽  
Atomic Force ◽  
Reflected Light ◽  
Afm Imaging ◽  
Silicon Cantilever ◽  
Afm Cantilever ◽  
Silicon Based

A feasibility analysis is performed for the development and integration of a near-field scanning optical microscope (NSOM) tip–photodetector operating in the visible wavelength domain of an atomic force microscope (AFM) cantilever, involving simulation, processing, and measurement. The new tip–photodetector consists of a platinum–silicon truncated conical photodetector sharing a subwavelength aperture, and processing uses advanced nanotechnology tools on a commercial silicon cantilever. Such a combined device enables a dual-mode usage of both AFM and NSOM measurements when collecting the reflected light directly from the scanned surface, while having a more efficient light collection process. In addition to its quite simple fabrication process, it is demonstrated that the AFM tip on which the photodetector is processed remains operational (i.e., the AFM imaging capability is not altered by the process). The AFM–NSOM capability of the processed tip is presented, and preliminary results show that AFM capability is not significantly affected and there is an improvement in surface characterization in the scanning proof of concept.

Young’s Modulus Measurement of Electroplated Nickel Using AFM

2006 ◽  
Author(s):  
Sang-Hyun Kim ◽  
James G. Boyd
Keyword(s):  
Elastic Modulus ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Beam Theory ◽  
Spring Constant ◽  
Time Step ◽  
Simple Method ◽  
Atomic Force ◽  
Silicon Cantilever ◽  
Afm Cantilever

This paper addresses a relatively simple method of measuring Young's modulus of electroplated nickel using Atomic Force Microscope. Thin layer of nickel to be measured is electroplated onto the tip side of AFM silicon cantilever, whose Young's modulus and the geometric dimensions are defined from manufacturer. The resonant frequency and the quality factor of the electroplated AFM cantilever are measured by the tapping mode of AFM and its spring constant is calculated using Sader's method. The spring constant of the electroplated cantilever is also calculated by using the laminar composite beam theory. Comparing two spring constants, Young's modulus of the electroplated nickel is determined. The measured elastic modulus of nickel in each time step is in the range of between and the average elastic modulus is with relative uncertainty of less than 5%

Size-Related Plasticity Effects in AFM Silicon Cantilever Tips

2006 ◽  
Vol 924 ◽  
Author(s):  
Malgorzata Kopycinska-Mueller ◽  
Roy H. Geiss ◽  
Donna C. Hurley
Keyword(s):  
Sample Surface ◽  
Acoustic Microscopy ◽  
Static Loads ◽  
Theoretical Yield ◽  
Atomic Force ◽  
Silicon Cantilever ◽  
Afm Cantilever ◽  
The Individual ◽  
Tip Radius ◽  
The Impact

ABSTRACTWe are developing dynamic atomic force microscopy (AFM) techniques to determine nanoscale elastic properties. Atomic force acoustic microscopy (AFAM) makes use of the resonant frequencies of an AFM cantilever while its tip contacts the sample surface at a given static load. Our methods involve nanosized silicon probes with tip radius R ranging from approximately 10 nm to 150 nm. The resulting radius of contact between the tip and the sample is less than 20 nm. However, the contact stress can be greater than a few tens of GPa, exceeding the theoretical yield strength of silicon by a factor of two to four. Our AFAM experiments indicate that, contrary to expectation, tips can sometimes withstand such stresses without fracture. We subjected ten tips to the same sequence of AFAM experiments. Each tip was brought into contact with a fused quartz sample at different static loads. The load was systematically increased from about 0.4 μN to 6 μN. Changes in tip geometry were observed in images acquired in a scanning electron microscope (SEM) between the individual AFAM experiments. All of the tips with R < 10 nm broke during the first AFAM experiments at static loads less than 1.6 μN. Tips with R > 40 nm plastically deformed under such loads. However, a group of tips with R from 25 nm to 30 nm neither broke nor deformed during the tests. In order to reach higher contact stresses, two additional tips with similar values of R were used in identical experiments on nickel and sapphire samples. Although the estimated stresses exceeded 40 GPa, we did not observe any tip fracture events. Our qualitative observations agree with more systematic studies performed by other groups on various nanostructures. The results emphasize the necessity of understanding the mechanics of nanometer-scaled bodies and the impact of size effects on measurements of mechanical properties on such scales.

Simulation of Micromechanical Measurement of Mass Accretion: Quantifying the Importance of Material Selection and Geometry on Performance

2013 ◽  
Vol 136 (2) ◽  
Author(s):  
Michael James Martin
Keyword(s):  
Natural Frequency ◽  
System Performance ◽  
Elastic Moduli ◽  
Material Selection ◽  
Optimal Thickness ◽  
Force Microscopy ◽  
Atomic Force ◽  
Functionalized Surfaces ◽  
Silicon Cantilever ◽  
Afm Cantilever

Micro- and nanomechanical resonators operating in liquid have been used to measure the change in the mass of either cells or functionalized surfaces attached to the resonator. As the system accretes mass, the natural frequency of the system changes, which can be measured experimentally. The current work extends methods previously developed for simulation of an atomic force microscope operating in liquid to study this phenomenon. A silicon cantilever with a 10 micron width, an 800 nm thickness, and a length of 30 microns was selected as a baseline configuration. The change in resonant frequency as the system accretes mass was determined through simulation. The results show that the change in natural frequency as mass accretes on the resonator is predictable through simulation. The geometry and material of the cantilever were varied to optimize the system. The results show that shorter cantilevers yield large gains in system performance. The width does not have a large impact on the system performance. Selecting the optimal thickness requires balancing the increase in overall system mass with the improvement in frequency response as the structure becomes thicker. Because there is no limit to the maximum system stiffness, the optimal materials will be those with higher elastic moduli. Based on these criteria, the optimum resonator for mass accretion measurements will be significantly different than an optimized atomic-force microscopy (AFM) cantilever.

Quantifying the Work of Adhesion Between an AFM Cantilever Tip and MEMS Test Structures After Packaging

2004 ◽  
Author(s):  
E. J. Thoreson ◽  
N. A. Burnham ◽  
J. Martin
Keyword(s):  
Adhesion Force ◽  
Mechanical Systems ◽  
Work Of Adhesion ◽  
Native Oxide ◽  
Micro Electro Mechanical Systems ◽  
Atomic Force ◽  
Die Attach ◽  
Silicon Cantilever ◽  
Afm Cantilever ◽  
And Performance

Abstract Adhesion is important to the yield and performance of MEMS (Micro-Electro-Mechanical Systems) and NEMS (Nano- Electro-Mechanical Systems). Measuring the work of adhesion, with an AFM (Atomic-Force Microscope), allows one to study surface interactions from an energy perspective as opposed to an adhesion (force) perspective. The works of adhesion were measured with different AFM tip radii on multiple types of samples. Two sample variables were examined: four die attach conditions (no attachment, silicone, polyimide silicone, and silver glass), and two surface conditions (native oxide with and without a few angstroms of vapor-deposited diphenyl siloxane). For a normal silicon cantilever, the work of adhesion seems to be slightly less for the treated surfaces than the untreated, except for the silverglass die attach material. There were at least three orders of magnitude difference in the works of adhesion for the different AFM tip radii. Presumably, the trend is due to some combination of material properties, interfacial roughness, and torque on the AFM cantilever.

Lorentz Contact Resonance Imaging for Atomic Force Microscopes: Probing Mechanical and Thermal Properties on the Nanoscale

2013 ◽  
Vol 21 (6) ◽  
pp. 18-24 ◽  
Author(s):  
Eoghan Dillon ◽  
Kevin Kjoller ◽  
Craig Prater
Keyword(s):  
Viscoelastic Properties ◽  
Contact Stiffness ◽  
Mechanical And Thermal Properties ◽  
Resonance Modes ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Other Information ◽  
Afm Cantilever ◽  
Stiffness And Damping ◽  
Contact Resonance

Atomic force microscopy (AFM) has been widely used in both industry and academia for imaging the surface topography of a material with nanoscale resolution. However, often little other information is obtained. Contact resonance AFM (CR-AFM) is a technique that can provide information about the viscoelastic properties of a material in contact with an AFM probe by measuring the contact stiffness between the probe and sample. In CR-AFM, an AFM cantilever is oscillated, and the amplitude and frequency of the resonance modes of the cantilever are monitored. When a probe or sample is oscillated, the tip sample interaction can be approximated as an ideal spring-dashpot system using the Voigt-Kelvin model shown in Figure 1. Contact resonance frequencies of the AFM cantilever will shift depending on the contact stiffness, k, between the tip and sample. The damping effect on the system comes from dissipative tip sample forces such as viscosity and adhesion. Damping, η, is observed in a CR-AFM system by monitoring the amplitude and Q factor of the resonant modes of the cantilever. This contact stiffness and damping information can then be used to obtain information about the viscoelastic properties of the material when fit to an applicable model.

scholarly journals Multiple regimes of operation in bimodal AFM: understanding the energy of cantilever eigenmodes

2013 ◽  
Vol 4 ◽  
pp. 385-393 ◽  
Author(s):  
Daniel Kiracofe ◽  
Arvind Raman ◽  
Dalia Yablon
Keyword(s):  
Single Frequency ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Imaging ◽  
Multiple Regimes ◽  
Nanoscale Imaging ◽  
Relative Kinetic ◽  
Series Of Experiments ◽  
Tapping Mode Afm ◽  
Afm Cantilever

One of the key goals in atomic force microscopy (AFM) imaging is to enhance material property contrast with high resolution. Bimodal AFM, where two eigenmodes are simultaneously excited, confers significant advantages over conventional single-frequency tapping mode AFM due to its ability to provide contrast between regions with different material properties under gentle imaging conditions. Bimodal AFM traditionally uses the first two eigenmodes of the AFM cantilever. In this work, the authors explore the use of higher eigenmodes in bimodal AFM (e.g., exciting the first and fourth eigenmodes). It is found that such operation leads to interesting contrast reversals compared to traditional bimodal AFM. A series of experiments and numerical simulations shows that the primary cause of the contrast reversals is not the choice of eigenmode itself (e.g., second versus fourth), but rather the relative kinetic energy between the higher eigenmode and the first eigenmode. This leads to the identification of three distinct imaging regimes in bimodal AFM. This result, which is applicable even to traditional bimodal AFM, should allow researchers to choose cantilever and operating parameters in a more rational manner in order to optimize resolution and contrast during nanoscale imaging of materials.

Epitaxial BaTiO3 Thin Films on Different Substrates for Optical Waveguide Applications

1999 ◽  
Vol 597 ◽  
Author(s):  
M. Siegert ◽  
Judit G. Lisoni ◽  
C. H. Lei ◽  
A. Eckau ◽  
W. Zander ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Waveguides ◽  
Rutherford Backscattering Spectrometry ◽  
Optical Data ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Ion Channeling ◽  
Atomic Force ◽  
Transmission Electron

AbstractIn the process of developing thin film electro-optical waveguides we investigated the influence of different substrates on the optical and structural properties of epitaxial BaTiO3 thin films. These films are grown by on-axis pulsed laser deposition (PLD) on MgO(100), MgAl2O4(100), SrTiO3(100) and MgO buffered A12O3(1102) substrates. The waveguide losses and the refractive indices were measured with a prism coupling setup. The optical data are correlated to the results of Rutherford backscattering spectrometry/ion channeling (RBS/C). X-ray diffraction (XRD), atomic force microscopy (AFM) and transmission electron microscopy (TEM). BaTiO3 films on MgO(100) substrates show planar waveguide losses of 3 dB/cm and ridge waveguide losses of 5 dB/cm at a wavelength of 633 nm.

scholarly journals Assessment of Multi-Scale SMOS and SMAP Soil Moisture Products across the Iberian Peninsula

2020 ◽  
Vol 12 (3) ◽  
pp. 570 ◽  
Author(s):  
Gerard Portal ◽  
Thomas Jagdhuber ◽  
Mercè Vall-llossera ◽  
Adriano Camps ◽  
Miriam Pablos ◽  
...  
Keyword(s):  
Soil Moisture ◽  
Iberian Peninsula ◽  
Spatial Scale ◽  
Temporal Dynamics ◽  
Microwave Radiometer ◽  
Added Value ◽  
Optical Data ◽  
Enhanced Resolution ◽  
The Impact

In the last decade, technological advances led to the launch of two satellite missions dedicated to measure the Earth’s surface soil moisture (SSM): the ESA’s Soil Moisture and Ocean Salinity (SMOS) launched in 2009, and the NASA’s Soil Moisture Active Passive (SMAP) launched in 2015. The two satellites have an L-band microwave radiometer on-board to measure the Earth’s surface emission. These measurements (brightness temperatures TB) are then used to generate global maps of SSM every three days with a spatial resolution of about 30–40 km and a target accuracy of 0.04 m3/m3. To meet local applications needs, different approaches have been proposed to spatially disaggregate SMOS and SMAP TB or their SSM products. They rely on synergies between multi-sensor observations and are built upon different physical assumptions. In this study, temporal and spatial characteristics of six operational SSM products derived from SMOS and SMAP are assessed in order to diagnose their distinct features, and the rationale behind them. The study is focused on the Iberian Peninsula and covers the period from April 2015 to December 2017. A temporal inter-comparison analysis is carried out using in situ SSM data from the Soil Moisture Measurements Station Network of the University of Salamanca (REMEDHUS) to evaluate the impact of the spatial scale of the different products (1, 3, 9, 25, and 36 km), and their correspondence in terms of temporal dynamics. A spatial analysis is conducted for the whole Iberian Peninsula with emphasis on the added-value that the enhanced resolution products provide based on the microwave-optical (SMOS/ERA5/MODIS) or the active–passive microwave (SMAP/Sentinel-1) sensor fusion. Our results show overall agreement among time series of the products regardless their spatial scale when compared to in situ measurements. Still, higher spatial resolutions would be needed to capture local features such as small irrigated areas that are not dominant at the 1-km pixel scale. The degree to which spatial features are resolved by the enhanced resolution products depend on the multi-sensor synergies employed (at TB or soil moisture level), and on the nature of the fine-scale information used. The largest disparities between these products occur in forested areas, which may be related to the reduced sensitivity of high-resolution active microwave and optical data to soil properties under dense vegetation.

scholarly journals Isolation and Characterization of Nanofibrillar Cellulose from Agave tequilana Weber Bagasse

2019 ◽  
Vol 2019 ◽  
pp. 1-7 ◽  
Author(s):  
Hasbleidy Palacios Hinestroza ◽  
Javier A. Hernández Diaz ◽  
Marianelly Esquivel Alfaro ◽  
Guillermo Toriz ◽  
Orlando J. Rojas ◽  
...  
Keyword(s):  
Cellulose Nanofibers ◽  
Average Diameter ◽  
Added Value ◽  
Advanced Materials ◽  
Degree Of Crystallinity ◽  
Agave Tequilana ◽  
Force Microscopy ◽  
Nanofibrillar Cellulose ◽  
Isolation And Characterization ◽  
Atomic Force

The bagasse of Agave tequilana Weber is one of the most abundant agroindustrial wastes in the state of Jalisco. However, at the present time, there is no technical use for this waste, and its high availability makes it an environmental problem. The objective of this research was to take advantage of this waste and give it an added value to be used in the elaboration of advanced materials. In this sense, the agave bagasse cellulose was obtained using an organosolv method. To obtain the nanofibrils, the cellulose was passed through 6 cycles of a microfluidizer. The material was classified by FTIR, confirming the presence of the functional groups (O-H, C-H, C-C, and C-O-C), characteristics of cellulose, and the elimination of hemicellulose and lignin present in agave bagasse without treatment. The X-ray diffraction technique allowed the determination of the degree of crystallinity of the cellulose nanofibers, which was 68.5%, with a negative zeta potential of −42 mV. The images from the atomic force microscopy helped for the observation of the degree of fibrillation in the cellulose, and with the software ImageJ, the average diameter of the nanofibers was determined to be 75 ± 5 nm with a relatively uniform length of 1.0–1.2 μm. Finally, by means of thermogravimetric analysis, it was found that the obtained cellulose nanofibers (CNFs) supported high temperatures of thermal decomposition, so it was concluded that due to the diameter of the fibrils, the high resistance to pressure, and elasticity, the nanofibrils obtained in this investigation can be used in the elaboration of advanced materials.

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