scholarly journals Frequency Selective Auto-Encoder for Smart Meter Data Compression

Sensors ◽  
2021 ◽  
Vol 21 (4) ◽  
pp. 1521
Author(s):  
Jihoon Lee ◽  
Seungwook Yoon ◽  
Euiseok Hwang
Keyword(s):  
Data Compression ◽  
High Frequency ◽  
Spectral Properties ◽  
Situational Awareness ◽  
Time Windows ◽  
Low Frequency ◽  
Smart Meters ◽  
Compression Performance ◽  
Reconstruction Performance ◽  
Frequency Selective

With the development of the internet of things (IoT), the power grid has become intelligent using massive IoT sensors, such as smart meters. Generally, installed smart meters can collect large amounts of data to improve grid visibility and situational awareness. However, the limited storage and communication capacities can restrain their infrastructure in the IoT environment. To alleviate these problems, efficient and various compression techniques are required. Deep learning-based compression techniques such as auto-encoders (AEs) have recently been deployed for this purpose. However, the compression performance of the existing models can be limited when the spectral properties of high-frequency sampled power data are widely varying over time. This paper proposes an AE compression model, based on a frequency selection method, which improves the reconstruction quality while maintaining the compression ratio (CR). For efficient data compression, the proposed method selectively applies customized compression models, depending on the spectral properties of the corresponding time windows. The framework of the proposed method involves two primary steps: (i) division of the power data into a series of time windows with specified spectral properties (high-frequency, medium-frequency, and low-frequency dominance) and (ii) separate training and selective application of the AE models, which prepares them for the power data compression that best suits the characteristics of each frequency. In simulations on the Dutch residential energy dataset, the frequency-selective AE model shows significantly higher reconstruction performance than the existing model with the same CR. In addition, the proposed model reduces the computational complexity involved in the analysis of the learning process.

scholarly journals Radio spectral properties of cores and extended regions in blazars in the MHz regime

2019 ◽  
Vol 490 (4) ◽  
pp. 5798-5806 ◽  
Author(s):  
D d’Antonio ◽  
M Giroletti ◽  
G Giovannini ◽  
A Maini
Keyword(s):  
Radio Frequency ◽  
Active Galactic Nuclei ◽  
High Frequency ◽  
Spectral Properties ◽  
Gamma Ray ◽  
Angular Resolution ◽  
Low Frequency ◽  
Galactic Nuclei ◽  
High Angular Resolution ◽  
Murchison Widefield Array

ABSTRACT Low-frequency radio surveys allow in-depth studies and new analyses of classes of sources that were previously known and characterized only in other bands. In recent years, low radio frequency observations of blazars have become available as a result of new surveys, such as the GaLactic and Extragalactic All-sky Murchison Widefield Array (MWA) survey (GLEAM). We search for gamma-ray blazars in a low-frequency (ν < 240 MHz) survey, to characterize the spectral properties of the spatial components. We cross-correlate GLEAM with the fourth catalogue of active galactic nuclei (4LAC) detected by the Fermi satellite. This improves on previous works by using a low-frequency catalogue that is wider and deeper, with a better spectral coverage and the latest and most sensitive gamma-ray source list. Compared with a previous study based on the commissioning survey, the detection rate increased from 35 to 70 per cent. We include data from the Australia Telescope 20-GHz (AT20G) survey in order to extract high-frequency high-angular resolution information about the radio cores of blazars. We find low radio frequency counterparts for 1274 out of 1827 blazars in the range of 72–231 MHz. Blazars have flat spectra at the ∼100-MHz regime, with a mean spectral index α = −0.44 ± 0.01 (assuming Sν ∝ να). Low synchrotron peaked objects have a flatter spectrum than high synchrotron peaked objects. Low frequency radio and gamma-ray emissions show a significant but scattered correlation. The ratio between lobe and core radio emission in gamma-ray blazars is smaller than previously estimated.

Simulations of high-resolution images of amorphous silicon films

1986 ◽  
Vol 44 ◽  
pp. 544-545
Author(s):  
G. Y. Fan ◽  
J. M. Cowley
Keyword(s):  
Electron Microscope ◽  
High Frequency ◽  
Fourier Transformation ◽  
Amorphous Materials ◽  
Low Frequency ◽  
Chromatic Aberration ◽  
Structure Information ◽  
Frequency Components ◽  
High Resolution Images ◽  
Spatial Frequency Spectrum

It is well known that the structure information on the specimen is not always faithfully transferred through the electron microscope. Firstly, the spatial frequency spectrum is modulated by the transfer function (TF) at the focal plane. Secondly, the spectrum suffers high frequency cut-off by the aperture (or effectively damping terms such as chromatic aberration). While these do not have essential effect on imaging crystal periodicity as long as the low order Bragg spots are inside the aperture, although the contrast may be reversed, they may change the appearance of images of amorphous materials completely. Because the spectrum of amorphous materials is continuous, modulation of it emphasizes some components while weakening others. Especially the cut-off of high frequency components, which contribute to amorphous image just as strongly as low frequency components can have a fundamental effect. This can be illustrated through computer simulation. Imaging of a whitenoise object with an electron microscope without TF limitation gives Fig. 1a, which is obtained by Fourier transformation of a constant amplitude combined with random phases generated by computer.

SEM image sharpness analysis

1996 ◽  
Vol 54 ◽  
pp. 142-143
Author(s):  
M. T. Postek ◽  
A. E. Vladar
Keyword(s):  
High Frequency ◽  
Low Frequency ◽  
Quantitative Information ◽  
Primary Electron ◽  
Image Sharpness ◽  
Critical Dimensions ◽  
Sem Image ◽  
Frequency Changes ◽  
Electron Microscopes ◽  
Scanning Electron

Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. The industry requires that an automated instrument must be routinely capable of 5 nm resolution (or better) at 1.0 kV accelerating voltage for the measurement of nominal 0.25-0.35 micrometer semiconductor critical dimensions. Testing and proving that the instrument is performing at this level on a day-by-day basis is an industry need and concern which has been the object of a study at NIST and the fundamentals and results are discussed in this paper.In scanning electron microscopy, two of the most important instrument parameters are the size and shape of the primary electron beam and any image taken in a scanning electron microscope is the result of the sample and electron probe interaction. The low frequency changes in the video signal, collected from the sample, contains information about the larger features and the high frequency changes carry information of finer details. The sharper the image, the larger the number of high frequency components making up that image. Fast Fourier Transform (FFT) analysis of an SEM image can be employed to provide qualitiative and ultimately quantitative information regarding the SEM image quality.

Real Ear Sound Pressure Levels Developed by Three Portable Stereo System Earphones

1992 ◽  
Vol 1 (4) ◽  
pp. 52-55 ◽  
Author(s):  
Gail L. MacLean ◽  
Andrew Stuart ◽  
Robert Stenstrom
Keyword(s):  
High Frequency ◽  
Sound Pressure ◽  
Low Frequency ◽  
Test System ◽  
Output Frequency ◽  
Frequency Effects ◽  
Adult Men ◽  
Frequency Responses ◽  
Significant Difference ◽  
Sound Pressure Levels

Differences in real ear sound pressure levels (SPLs) with three portable stereo system (PSS) earphones (supraaural [Sony Model MDR-44], semiaural [Sony Model MDR-A15L], and insert [Sony Model MDR-E225]) were investigated. Twelve adult men served as subjects. Frequency response, high frequency average (HFA) output, peak output, peak output frequency, and overall RMS output for each PSS earphone were obtained with a probe tube microphone system (Fonix 6500 Hearing Aid Test System). Results indicated a significant difference in mean RMS outputs with nonsignificant differences in mean HFA outputs, peak outputs, and peak output frequencies among PSS earphones. Differences in mean overall RMS outputs were attributed to differences in low-frequency effects that were observed among the frequency responses of the three PSS earphones. It is suggested that one cannot assume equivalent real ear SPLs, with equivalent inputs, among different styles of PSS earphones.

Evaluation of Special Hearing Aids for Deaf Children

1971 ◽  
Vol 36 (4) ◽  
pp. 527-537 ◽  
Author(s):  
Norman P. Erber
Keyword(s):  
Hearing Aids ◽  
High Frequency ◽  
Hearing Aid ◽  
Low Frequency ◽  
Acoustic Stimulation ◽  
Deaf Children ◽  
Frequency Range ◽  
Frequency Limit ◽  
Unpublished Studies ◽  
Published Research

Two types of special hearing aid have been developed recently to improve the reception of speech by profoundly deaf children. In a different way, each special system provides greater low-frequency acoustic stimulation to deaf ears than does a conventional hearing aid. One of the devices extends the low-frequency limit of amplification; the other shifts high-frequency energy to a lower frequency range. In general, previous evaluations of these special hearing aids have obtained inconsistent or inconclusive results. This paper reviews most of the published research on the use of special hearing aids by deaf children, summarizes several unpublished studies, and suggests a set of guidelines for future evaluations of special and conventional amplification systems.

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