scholarly journals Contactless Determination of Electric Field in Metal–Insulator–Semiconductor Interfaces by Using Constant DC-Reflectivity Photoreflectance

Solids ◽  
2021 ◽  
Vol 2 (2) ◽  
pp. 129-138
Author(s):  
Eiichi Kobayashi ◽  
Koya Satta ◽  
Ryoga Inoue ◽  
Ken Suzuki ◽  
Takayuki Makino

We applied photoreflectance (PR) spectroscopy for contactless determination of the electric field strength at buried interfaces in metal–insulator–semiconductor (MIS) structures. The PR is an all-optical version of an electromodulated reflectance spectroscopy. The tradeoff of this adoption is that this requires an additional feedback system to eliminate background problems induced by scattered pump light and/or photoluminescence. A microcomputer-based feedback system has been developed for this elimination. Despite the very tiny signal intensity, we successfully attained a sufficiently good signal–noise ratio to determine the electric field strength in oxide-based MIS interfaces that exhibits a large, unwanted photoluminescence signal. The field strength was evaluated to be ca. 0.25 kV/cm.






2021 ◽  
pp. 83-90
Author(s):  
E. V. Leun ◽  

The article discusses the principles and possibilities of using jet-drop optical measuring systems for monitoring the electric field strength (EFS). Two applied techniques are considered. First, the deflection of flying charged droplets (balls, hollow granules) used as micro-objects sensitive to EFS and deviating from a given rectilinear trajectory of motion, like an electron in a kinescope. Secondly, stroboscopic determination of the position and/or displacement of drops by pulsed illumination of the side of the deflected drop by the optical flow and measurement of the reflection angle for it. The possibilities of implementing the differential method of EFS measurements are discussed. The features of the use of liquids with the addition of metal nanopowders or based on liquid metals, as well as hollow droplets in the form of microspheres or hollow granules are considered



2016 ◽  
Vol 25 (5) ◽  
pp. 054002 ◽  
Author(s):  
P Böhm ◽  
M Kettlitz ◽  
R Brandenburg ◽  
H Höft ◽  
U Czarnetzki


2017 ◽  
Vol 19 (32) ◽  
pp. 21696-21706 ◽  
Author(s):  
Ji Xing ◽  
Sitong Lu ◽  
Chi Zhang ◽  
Min Yin ◽  
Dongdong Li ◽  
...  

The electric field strength during aluminum anodization was clarified, and this work can shed some light on the self-ordering mechanism of porous anodic alumina.



1996 ◽  
Vol 35 (Part 1, No. 3) ◽  
pp. 1696-1700 ◽  
Author(s):  
Tadashi Saitoh ◽  
Kensaku Nakamura ◽  
Hideki Hasegawa ◽  
Yi-Ming Xiong


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