Electrically induced change in HfO2/1-monolayer TiO2/SiO2 metal-oxide-semiconductor stacks: capacitance-voltage and hard x-ray photoelectron spectroscopy studies
2014 ◽
Vol 6
(9)
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pp. 1020-1023
2011 ◽
Vol 679-680
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pp. 338-341
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2015 ◽
Vol 416
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pp. 118-125
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2018 ◽
Vol 6
(44)
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pp. 12079-12085
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