High electron mobility in nearly-dislocation-free hexagonal InN
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Abstract We demonstrate a recorded directed-probed electron mobility of ~4850 cm2/Vs in nearly-dislocation-free hexagonal InN at room temperature by Hall-effect measurement. Those extremely high quality InN are achieved through droplet-assisted epitaxy on GaN/sapphire template by molecular beam epitaxy. They behave as crystals with diameter of several micrometers, being confirmed to be nearly free of threading dislocation by transmission electron microscopy. The achievement of such high mobility InN provides promising opportunities for fabricating high speed electronic device.
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1998 ◽
Vol 31
(2)
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pp. 159-164
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2002 ◽
Vol 49
(3)
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pp. 354-360
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1997 ◽
Vol 36
(Part 2, No. 7B)
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pp. L906-L908
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