scholarly journals Surface excitations in the modelling of electron transport for electron-beam-induced deposition experiments

2015 ◽  
Vol 6 ◽  
pp. 1260-1267 ◽  
Author(s):  
Francesc Salvat-Pujol ◽  
Roser Valentí ◽  
Wolfgang S Werner

The aim of the present overview article is to raise awareness of an essential aspect that is usually not accounted for in the modelling of electron transport for focused-electron-beam-induced deposition (FEBID) of nanostructures: Surface excitations are on the one hand responsible for a sizeable fraction of the intensity in reflection-electron-energy-loss spectra for primary electron energies of up to a few kiloelectronvolts and, on the other hand, they play a key role in the emission of secondary electrons from solids, regardless of the primary energy. In this overview work we present a general perspective of recent works on the subject of surface excitations and on low-energy electron transport, highlighting the most relevant aspects for the modelling of electron transport in FEBID simulations.

2013 ◽  
Vol 4 ◽  
pp. 781-792 ◽  
Author(s):  
Francesc Salvat-Pujol ◽  
Harald O Jeschke ◽  
Roser Valentí

We present a numerical investigation of energy and charge distributions during electron-beam-induced growth of tungsten nanostructures on SiO2 substrates by using a Monte Carlo simulation of the electron transport. This study gives a quantitative insight into the deposition of energy and charge in the substrate and in the already existing metallic nanostructures in the presence of the electron beam. We analyze electron trajectories, inelastic mean free paths, and the distribution of backscattered electrons in different compositions and at different depths of the deposit. We find that, while in the early stages of the nanostructure growth a significant fraction of electron trajectories still interacts with the substrate, when the nanostructure becomes thicker the transport takes place almost exclusively in the nanostructure. In particular, a larger deposit density leads to enhanced electron backscattering. This work shows how mesoscopic radiation-transport techniques can contribute to a model that addresses the multi-scale nature of the electron-beam-induced deposition (EBID) process. Furthermore, similar simulations can help to understand the role that is played by backscattered electrons and emitted secondary electrons in the change of structural properties of nanostructured materials during post-growth electron-beam treatments.


2011 ◽  
Vol 50 (6) ◽  
pp. 06GG14
Author(s):  
Fujio Wakaya ◽  
Kunio Takamoto ◽  
Tsuyoshi Teraoka ◽  
Katsuhisa Murakami ◽  
Satoshi Abo ◽  
...  

Author(s):  
C.T. Schamp ◽  
Y. Suzuki ◽  
J. Fuse ◽  
K. Ito ◽  
H. Tanaka ◽  
...  

Abstract In transmission electron microscopy (TEM), one typically considers bright-field or dark-field imaging signals, which utilize the transmitted and scattered electrons, respectively. Analytical signals such as characteristic X-Rays or primary electron beam energy losses from inelastic scattering events give rise to the energy dispersive X-Ray spectroscopy and electron energy loss spectroscopy techniques, respectively. In this paper, the detection of the electron beam absorbed current (EBAC) and electron beam induced current (EBIC) signals is reported using a specially designed scanning TEM holder and associated amplification electronics. By utilizing thin TEM samples where the beam-sample interaction volume is controlled more through the incident electron probe size, the EBAC and EBIC signal resolution is improved to the point where implant regions and Schottky junction depletion zones can be visualized.


2011 ◽  
Vol 50 (6S) ◽  
pp. 06GG14 ◽  
Author(s):  
Fujio Wakaya ◽  
Kunio Takamoto ◽  
Tsuyoshi Teraoka ◽  
Katsuhisa Murakami ◽  
Satoshi Abo ◽  
...  

2015 ◽  
Vol 6 ◽  
pp. 907-918 ◽  
Author(s):  
Brett B Lewis ◽  
Michael G Stanford ◽  
Jason D Fowlkes ◽  
Kevin Lester ◽  
Harald Plank ◽  
...  

Platinum–carbon nanostructures deposited via electron beam induced deposition from MeCpPt(IV)Me3 are purified during a post-deposition electron exposure treatment in a localized oxygen ambient at room temperature. Time-dependent studies demonstrate that the process occurs from the top–down. Electron beam energy and current studies demonstrate that the process is controlled by a confluence of the electron energy loss and oxygen concentration. Furthermore, the experimental results are modeled as a 2nd order reaction which is dependent on both the electron energy loss density and the oxygen concentration. In addition to purification, the post-deposition electron stimulated oxygen purification process enhances the resolution of the EBID process due to the isotropic carbon removal from the as-deposited materials which produces high-fidelity shape retention.


1987 ◽  
Vol 42 (11) ◽  
pp. 1372-1373
Author(s):  
A. Grzeszczak

Reflection electron energy loss spectra from polycrystalline beryllium for primary electron energies within 100-1000 eV are measured. The peak intensities increase with the primary energy. From this dependence the electron mean free path for volume plasmon excitation in beryllium is evaluated.


Author(s):  
Konrad Rykaczewski ◽  
Ben White ◽  
Jenna Browning ◽  
Andrew D. Marshall ◽  
Andrei G. Fedorov

Adsorbed species surface diffusion Electron beam induced deposition (EBID) of residuals carbon can be either a contamination problem or can provide a basis for 3-D nanofabrication and nanoscale metrology. In this process a solid deposit is formed at the point of impact of the electron beam due to the decomposition of residual hydrocarbon species adsorbed on the solid substrate. The first observation of EBID can be traced to miscroscopists who noticed the growth of thin films of carbon while imaging using an electron microscope. The process was referred to as "contamination" because of its adverse effects on the microscope's imaging quality. Later, it has been demonstrated that with appropriate control of the electron beam this problematic contamination can be exploited to deposit three dimensional nanostructures with the spatial resolution down to 10nm. Numerous researchers have experimentally explored various factors influencing EBID growth rate and geometry of the deposit. To date, the most comprehensive theoretical model predicting the shape of the deposit in EBID is due to Silvis-Cividjian[1]. However, this model accounts for electron transport only. A few, fairly rudimentary models have also been developed for mass transport in EBID, but usually limited to rather simplistic treatment of electron transport. To this end, we have developed a comprehensive dynamic model of EBID coupling mass transport, electron transport and scattering, and species decomposition to predict deposition of carbon nano-dots. The simulations predict the local species and electron density distributions, as well as the 3-D profile and the growth rate of the deposit. Since the process occurs in a high vacuum environment surface diffusion is considered as the primary transport mode of surface-adsorbed hydrocarbon precursor. Transport, scattering, and absorption of primary electron as well as secondary electron generation are treated using the Monte Carlo methods. Low energy secondary electrons (SE) are the major contributors to hydrocarbon decomposition due to their energy range matching peak dissociation reaction cross section energies for precursor molecules. The local SE flux at the substrate and at the free surface of the growing deposit is computed using the Fast Secondary Electron (FSE) model. When combined with the total dissociation reaction corssection and the local hydrocarbon surface concentration, this allows us to compute the local deposition rate. The deposition rates are then used to predict the shape profile evolution of the deposit. Simulation results are compared with an AFM imaging of carbon EBID.


Author(s):  
D. E. Speliotis

The interaction of electron beams with a large variety of materials for information storage has been the subject of numerous proposals and studies in the recent literature. The materials range from photographic to thermoplastic and magnetic, and the interactions with the electron beam for writing and reading the information utilize the energy, or the current, or even the magnetic field associated with the electron beam.


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