Assistive Systems for the Workplace

2015 ◽

pp. 121-135 ◽

Cited By ~ 10

Author(s):

Oliver Korn ◽

Markus Funk ◽

Albrecht Schmidt

Keyword(s):

Computer Science ◽

Real Time ◽

Generic Model ◽

Work Processes ◽

Repetitive Work ◽

Motion Recognition ◽

Real Time Analysis ◽

Work Routines ◽

Assistive Systems

Recent advances in motion recognition allow the development of Context-Aware Assistive Systems (CAAS) for industrial workplaces that go far beyond the state of the art: they can capture a user's movement in real-time and provide adequate feedback. Thus, CAAS can address important questions, like Which part is assembled next? Where do I fasten it? Did an error occur? Did I process the part in time? These new CAAS can also make use of projectors to display the feedback within the corresponding area on the workspace (in-situ). Furthermore, the real-time analysis of work processes allows the implementation of motivating elements (gamification) into the repetitive work routines that are common in manual production. In this chapter, the authors first describe the relevant backgrounds from industry, computer science, and psychology. They then briefly introduce a precedent implementation of CAAS and its inherent problems. The authors then provide a generic model of CAAS and finally present a revised and improved implementation.

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Real-Time Analysis Of In-Situ Spectroscopic Ellipsometric Data During Mbe Growth Of III-V Semiconductors

MRS Proceedings ◽

10.1557/proc-222-75 ◽

1991 ◽

Vol 222 ◽

Cited By ~ 10

Author(s):

B. Johs ◽

J. L. Edwards ◽

K. T. Shiralagi ◽

R. Droopad ◽

K. Y. Choi ◽

...

Keyword(s):

Real Time ◽

Optical Constants ◽

Growth Parameters ◽

Ex Situ ◽

Time Analysis ◽

Mbe Growth ◽

In Situ Data ◽

Real Time Analysis

ABSTRACTA modular spectroscopic ellipsometer, capable of both in-situ and ex-situ operation, has been used to measure important growth parameters of GaAs/AIGaAs structures. The ex-situ measurements provided layer thicknesses and compositions of the grown structures. In-situ ellipsometric measurements allowed the determination of growth rates, layer thicknesses, and high temperature optical constants. By performing a regression analysis of the in-situ data in real-time, the thickness and composition of an AIGaAs layer were extracted during the MBE growth of the structure.

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In-Situ and Real-Time Analysis of the Formation of Strains and Microstructure Defects during Solidification of Al-3.5 Wt Pct Ni Alloys

Metallurgical and Materials Transactions A ◽

10.1007/s11661-007-9449-2 ◽

2008 ◽

Vol 39 (4) ◽

pp. 865-874 ◽

Cited By ~ 79

Author(s):

G. Reinhart ◽

A. Buffet ◽

H. Nguyen-Thi ◽

B. Billia ◽

H. Jung ◽

...

Keyword(s):

Real Time ◽

Time Analysis ◽

Ni Alloys ◽

Real Time Analysis

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A New Method To Interpret Fracturing Pressure—Application to Frac Pack

SPE Journal ◽

10.2118/166132-pa ◽

2015 ◽

Vol 20 (03) ◽

pp. 508-517 ◽

Cited By ~ 1

Author(s):

Elias Pirayesh ◽

Mohamed Y. Soliman ◽

Mehdi Rafiee ◽

Ali Jamali

Keyword(s):

Real Time ◽

New Technique ◽

Logarithmic Scale ◽

Analysis Tool ◽

Real Time Analysis ◽

Pressure Application ◽

Invaluable Tool ◽

Theory Application ◽

Pressure Analysis

Summary Real-time analysis of fracturing data is an invaluable tool for determining whether a fracturing job is progressing as planned. Since early days, understanding of fracturing pressure was emphasized and practiced by the industry. The most well-known fracturing-pressure-analysis tool is the Nolte-Smith technique. To predict the geometry of a hydraulically induced fracture, the Nolte-Smith technique analyzes the pressure response of a formation during pumping. Extensive application of this technique has proved reliable to interpret fracturing events. However, the compression of data imposed by logarithmic scale may make the detection of some events difficult. In addition, the Nolte-Smith technique necessitates prior accurate knowledge of formation-closure pressure. In this paper, we present a real-time fracturing diagnostic. This method, which is based on a modification of the Nolte-Smith technique, has proved reliable in the interpretation of fracturing behavior while a fracturing job is being carried out. In addition, it eliminates the shortcomings of the original technique, meaning that while making the interpretation of fracturing pressure faster, the new technique does not require prior knowledge of formation in-situ stresses. This technique was reached by a new innovative moving-reference-point concept assembled with the power-law fracture-propagation theory. Application of the new technique in the analysis of a variety of field cases, including several frac-pack and regular fracturing treatments, proved successful.

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Molecular beam epitaxy III-nitride growth for polarization sensitive devices based on M-plane films with in situ real time analysis by spectroscopic ellipsometry

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ◽

10.1116/1.2830628 ◽

2008 ◽

Vol 26 (3) ◽

pp. 1049 ◽

Cited By ~ 3

Author(s):

C. Boney ◽

P. Misra ◽

R. Pillai ◽

D. Starikov ◽

A. Bensaoula

Keyword(s):

Molecular Beam Epitaxy ◽

Real Time ◽

Spectroscopic Ellipsometry ◽

Molecular Beam ◽

Time Analysis ◽

Real Time Analysis

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In situ and real-time analysis of TGZM phenomena by synchrotron X-ray radiography

Journal of Crystal Growth ◽

10.1016/j.jcrysgro.2008.01.041 ◽

2008 ◽

Vol 310 (11) ◽

pp. 2906-2914 ◽

Cited By ~ 64

Author(s):

H. Nguyen Thi ◽

G. Reinhart ◽

A. Buffet ◽

T. Schenk ◽

N. Mangelinck-Noël ◽

...

Keyword(s):

Real Time ◽

Time Analysis ◽

X Ray ◽

Real Time Analysis

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In Situ, Real-Time Analysis of the Growth of Ferroelectric and Conductive Oxide Heterostructures by a New Time-of-Flight Pulsed Ion Beam Surface Analysis Technique

MRS Proceedings ◽

10.1557/proc-341-385 ◽

1994 ◽

Vol 341 ◽

Cited By ~ 3

Author(s):

Orlando Auciello ◽

A. R. Krauss ◽

Y. Lin ◽

R. P. H. Chang ◽

D. M. Gruen

Keyword(s):

Real Time ◽

Surface Segregation ◽

Ion Beam ◽

Time Of Flight ◽

Ion Scattering ◽

Real Time Analysis ◽

Analysis Technique ◽

Conductive Oxide ◽

New Time

AbstractA new time-of-flight ion scattering and recoil spectroscopy (TOF-ISARS) technique has been developed and is now used to perform in situ, real-time analysis of ferroelectric and conductive oxide layers during growth. Initial results presented here show various major effects, namely: (a) RuO2 films on MgO substrates appear to be terminated in O atoms on the top layer located in between Ru atoms lying in the layer underneath (This effect may have major implications for the explanation of the elimination of polarization fatigue demonstrated for RuO2/PZT/RuO2 heterostructure capacitors); (b) deposition of a Ru monolayer on top of a Pb monolayer results in surface segregation of Pb until a complete Pb layer develops over the Ru monolayer; and (c) a Pb/Zr/Ti layered structure yields a top Pb layer with first evidence of the existence of Pb vacancies, which also may have major implications in relation to the electrical characteristics of PZT-based capacitors.

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In situ real-time analysis of the MBE growth of CdTe on Ge: A comparison of ellipsometry data analysis techniques

Journal of Crystal Growth ◽

10.1016/j.jcrysgro.2006.08.026 ◽

2006 ◽

Vol 296 (2) ◽

pp. 129-134 ◽

Cited By ~ 7

Author(s):

G. Badano ◽

P. Ballet ◽

X. Baudry ◽

J.P. Zanatta ◽

A. Million

Keyword(s):

Data Analysis ◽

Real Time ◽

Time Analysis ◽

Mbe Growth ◽

Analysis Techniques ◽

Real Time Analysis ◽

Ellipsometry Data

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Atmospheric Probe for Real Time Weather Monitoring

International Symposium on Microelectronics ◽

10.4071/isom-2017-wa45_133 ◽

2017 ◽

Vol 2017 (1) ◽

pp. 000280-000285

Author(s):

J. Craig Prather ◽

Michael Bolt ◽

Haley Harrell ◽

Tyler Horton ◽

John Manobianco ◽

...

Keyword(s):

Additive Manufacturing ◽

Relative Humidity ◽

Real Time ◽

Base Station ◽

Gps Receiver ◽

Time Analysis ◽

Atmospheric Measurements ◽

Real Time Analysis ◽

Manufacturing Techniques

Abstract This work outlines the development and testing of novel in-situ atmospheric sensors. The system is designed for deployment of the sensors en masse to increase the geospatial density of atmospheric measurements. This sensor system is being designed to replace the costly, larger atmospheric sensors currently in use. Improvement in sensor technologies, substrates, and additive manufacturing techniques have allowed for such a device to be realizable. The devices contain a sensor suite that gathers temperature, relative humidity, and pressure from microsensors as well as position, velocity, and heading from a compact GPS receiver. This data is then sent to a base station for analysis by atmospheric scientists, with the potential for real time analysis.

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