An Enhanced Common Path Interference Measurement Method for Optical Refractive Indices

2007 ◽  
pp. 86-91
Author(s):  
Cheng Chi Wang ◽  
Ming Jyi Jang ◽  
Yuan Hung Peng
Keyword(s):  
Measurement Method ◽  
Refractive Indices ◽  
Common Path ◽  
Interference Measurement

Parallel Measurement Based on Laue Effect

2014 ◽  
Vol 716-717 ◽  
pp. 928-931
Author(s):  
Mei He Yang
Keyword(s):  
Equilibrium Point ◽  
Measurement Method ◽  
Testing Effect ◽  
Test Results ◽  
Basic Principles ◽  
Interference Measurement ◽  
Parallel Measurement ◽  
Transparent Materials ◽  
Point Detection

In the paper, interference measurement method for end surface parallel measurement of transparent materials is described. Firstly, basic principles of optical plane template equilibrium point detection are analyzed, measurement algorithms and formulas for calculating optical parallelism are proposed, then possible error of algorithm is analyzed in details, concrete plan for correcting the error is proposed, overall method for testing parallelism is proposed on the basis, and finally related experiment is designed for testing and analyzing the method. Test results show that the method can prominently improve precision of testing parallelism with excellent testing effect.

Multi-Function Fusion Measurement Method for Surface Texture

2013 ◽  
Vol 456 ◽  
pp. 299-302
Author(s):  
Sheng Huai Wang ◽  
Feng Hua Xu ◽  
Yu Rong Chen ◽  
Tie Bang Xie
Keyword(s):  
White Light ◽  
Surface Texture ◽  
Measurement Method ◽  
Measurement Methods ◽  
Image Measurement ◽  
Light Interference ◽  
Microscopy Image ◽  
Interference Measurement ◽  
White Light Interference ◽  
Diamond Probe

The texture and characteristics of surface have been becoming the leading factors to achieve the designed function of products successfully. So the measurement of surface texture is more and more important. A kind of new multi-function fusion measurement method for surface texture is presented in the paper. Four kinds of different scale measurement methods such as microscopy image measurement, vertical scanning white light interference measurement, white light interference nanoprobe measurement and white light interference diamond-probe measurement are fused for the surface texture multi-function fusion measurement in this method.

scholarly journals Features and Functionality of the Optical Interference Meter for Measurement of Surface Displaсements of Control Objects

Coatings ◽  
2021 ◽  
Vol 11 (8) ◽  
pp. 989
Author(s):  
Igor P. Miroshnichenko ◽  
Ivan A. Parinov ◽  
Shun-Hsyung Chang ◽  
Chin-Feng Lin
Keyword(s):  
Measurement Method ◽  
Control Object ◽  
Optical Field ◽  
The State ◽  
Angle Of Incidence ◽  
Research Results ◽  
Optical Setup ◽  
Functional Capabilities ◽  
Interference Measurement ◽  
Experimental Works

This article presents in detail the methodology and results of test studies of the functionality of a prospective optical setup for measuring the surface linear displacements of control objects, developed on the basis of a new interference measurement method, namely the “luminous point” method. The dependencies of the changes in intensity of the optical field of interference patterns are obtained, characterizing the features of the functional capabilities of the setup. It is experimentally confirmed that with significant changes in the angle of incidence of radiation on the surface of the control object, the sensitivity of the investigated setup does not change. The noted research results are most appropriate for use in the development of new contactless optical setups for measuring the displacements of the surfaces of control objects, and for use in various experimental works in the processes of the creation and production of machines and equipment, as well as in the diagnosis of the state of structural materials and power elements of machines and equipment during operation.

The spindle stage: A powerful optical tool

1988 ◽  
Vol 46 ◽  
pp. 52-53
Author(s):  
Mickey E. Gunter ◽  
F. Donald Bloss
Keyword(s):  
Significant Error ◽  
Optical Data ◽  
Refractive Indices ◽  
Axis Of Rotation ◽  
Polarizing Microscope ◽  
Microscope Stage

A single, reasonably homogeneous, nonopaque 30-to-300 μm crystal, mounted on a spindle stage and studied by immersion methods under a polarizing microscope, yields optical data frequently sufficient to identify and characterize a substance unequivocally. The data obtainable include (1) the orientation of the crystal's principal vibration axes and (2) its principal refractive indices, to within 0.0002 if desired, for light vibrating along these principal vibration axes. Spindle stages tend to be simple and relatively inexpensive, some costing less than $50. They permit rotation of the crystal about a single axis which is parallel to the microscope stage. This spindle or S-axis is thus perpendicular to the M-axis, namely the microscope stage's axis of rotation.A spindle stage excels when studying anisotropic crystals. It orients uniaxial crystals within minutes and biaxial crystals almost as quickly so that their principal refractive indices - ɛ and ω (uniaxial); α, β and γ (biaxial) - can be determined without significant error from crystal misorientation.

Light microscopy of ceramics

1993 ◽  
Vol 51 ◽  
pp. 908-909
Author(s):  
Walter C. McCrone
Keyword(s):  
Refractive Index ◽  
Light Microscopy ◽  
Light Microscope ◽  
Polarized Light ◽  
Refractive Indices ◽  
Complete Coverage ◽  
The Subject ◽  
Lower Refractive Index

An excellent chapter on this subject by V.D. Fréchette appeared in a book edited by L.L. Hench and R.W. Gould in 1971 (1). That chapter with the references cited there provides a very complete coverage of the subject. I will add a more complete coverage of an important polarized light microscope (PLM) technique developed more recently (2). Dispersion staining is based on refractive index and its variation with wavelength (dispersion of index). A particle of, say almandite, a garnet, has refractive indices of nF = 1.789 nm, nD = 1.780 nm and nC = 1.775 nm. A Cargille refractive index liquid having nD = 1.780 nm will have nF = 1.810 and nC = 1.768 nm. Almandite grains will disappear in that liquid when observed with a beam of 589 nm light (D-line), but it will have a lower refractive index than that liquid with 486 nm light (F-line), and a higher index than that liquid with 656 nm light (C-line).

On electronic polarizabilities and refractive indices in SbSI crystal

1983 ◽  
Vol 44 (12) ◽  
pp. 349-359
Author(s):  
Wataru Kinase ◽  
Tadataka Morishita ◽  
Yutaka Hiyama ◽  
Tomoo Maeda
Keyword(s):  
Refractive Indices
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