Magnetization Chirality of Ni-Fe and Ni-Fe/Mn-Ir Asymmetric Ring Dots for High-Density Memory Cells

2006 ◽  
pp. 171-176
Author(s):  
Isao Sasaki ◽  
Ryoichi Nakatani ◽  
Tetsuo Yoshida ◽  
Keiichi Otaki ◽  
Yasushi Endo ◽  
...  
Keyword(s):  
High Density ◽  
Memory Cells

High-density static ESFI MOS memory cells

1974 ◽  
Vol 9 (5) ◽  
pp. 234-238 ◽  
Author(s):  
K. Goser ◽  
M. Pomper ◽  
J. Tihanyi
Keyword(s):  
High Density ◽  
Memory Cells

High-density one-device dynamic MOS memory cells

1983 ◽  
Vol 130 (3) ◽  
pp. 127 ◽  
Author(s):  
B.S. Kiyoo Itoh ◽  
B.S. Hideo Sunami
Keyword(s):  
High Density ◽  
Memory Cells

scholarly journals Electrical Screening Method of VNAND Flash Channel Hole Bending Defects

2021 ◽  
Author(s):  
Dooyeun Jung ◽  
Youngha Choi ◽  
Jae In Lee ◽  
Bu-il Nam ◽  
Ki-Young Dong ◽  
...  
Keyword(s):  
Leakage Current ◽  
Flash Memory ◽  
Mass Production ◽  
Storage Systems ◽  
Screening Method ◽  
High Density ◽  
Horizontal Direction ◽  
Memory Cells ◽  
Adjacent Channel

Abstract A novel electrical screening method of channel hole bending (ChB) defects is proposed for the implementation of high-density vertical NAND (VNAND) flash memory. The ChB defects induces the leakage current between the two adjacent channel holes, which leads to fatal failure in storage systems. Thus, it is one of the key requirements for VNAND mass production to screen ChB defects electrically in advance. In the proposed screening method, a 3D checkerboard (CKBD) pattern is introduced, which consists of alternating programed (‘0’) and inhibited (‘1’) memory cells in a diagonal and horizontal direction. By measuring the leakage current between the channel holes, ChB defects can be successfully detected electrically.

High Performance Shallow Trench Isolation for High Density Flash Memory Cells

1996 ◽  
Author(s):  
S. Deleonibus ◽  
M. Heitzmann ◽  
Y. Gobil ◽  
F. Martin ◽  
O. Demolliens ◽  
...  
Keyword(s):  
Flash Memory ◽  
High Performance ◽  
High Density ◽  
Memory Cells ◽  
Shallow Trench Isolation ◽  
Trench Isolation

High-Density Image Storage Using Approximate Memory Cells

2016 ◽  
Vol 44 (2) ◽  
pp. 413-426 ◽  
Author(s):  
Qing Guo ◽  
Karin Strauss ◽  
Luis Ceze ◽  
Henrique S. Malvar
Keyword(s):  
High Density ◽  
Memory Cells ◽  
Image Storage ◽  
Density Image

Magnetization chirality due to asymmetrical structure in Ni-Fe annular dots for high-density memory cells

2004 ◽  
Vol 95 (11) ◽  
pp. 6714-6716 ◽  
Author(s):  
Ryoichi Nakatani ◽  
Tetsuo Yoshida ◽  
Yasushi Endo ◽  
Yoshio Kawamura ◽  
Masahiko Yamamoto ◽  
...  
Keyword(s):  
High Density ◽  
Memory Cells ◽  
Asymmetrical Structure
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