Prediction of Logic Product Failure Due To Thin-Gate Oxide Breakdown
2007 ◽
Vol 7
(1)
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pp. 74-83
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2010 ◽
Vol 57
(9)
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pp. 2296-2305
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2001 ◽
Vol 40
(Part 2, No. 12A)
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pp. L1286-L1289
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2014 ◽
Vol 696
◽
pp. 57-61
2002 ◽
Vol 42
(9-11)
◽
pp. 1753-1757
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Keyword(s):
2002 ◽
Vol 12
(3)
◽
pp. 57-60
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