Effect of Speed on Silica Antireflective Coatings by Dipping Coating

2012 ◽  
Vol 512-515 ◽  
pp. 1597-1600
Author(s):  
Rui Min Jin ◽  
Zhi Duan Cai ◽  
Li Min Cang ◽  
Tao Yan ◽  
Shu Zeng Li
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Sol Gel ◽  
Refractive Index Change ◽  
Tetraethyl Orthosilicate ◽  
Experimental Results ◽  
Antireflective Coatings ◽  
Index Change ◽  
Coating Technique

Sol-gel thin films prepared by dipping coating technique, sol–gel derived bulk were prepared from constant water (H2O)/tetraethyl-orthosilicate (TEOS) ratio, dipping coating were carried out at different dipping speed 100mm/min, 200mm/min, 300mm/min, 400mm/min, 500mm/min respectively. The films are characterized by ellipsometer and SEM respectively. The experimental results show the thickness of films are become bigger and bigger with the dipping speed increasing.The refractive index change is not obvious.

Effect of Rotating Speed on Properties of Antireflective Coatings

2011 ◽  
Vol 181-182 ◽  
pp. 443-446
Author(s):  
Rui Min Jin ◽  
Xin Feng Guo ◽  
Zhi Duan Cai ◽  
Li Min Cang ◽  
Yan Tao ◽  
...  
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
High Speed ◽  
Sol Gel ◽  
Tetraethyl Orthosilicate ◽  
Experimental Results ◽  
Antireflective Coatings ◽  
Low Speed ◽  
Rotating Speed ◽  
Coating Technique

Sol-gel thin films prepared by rotating coating technique, sol–gel derived bulk was prepared from constant water (H2O)/tetraethyl-orthosilicate (TEOS) ratio, rotating coating was carried out at different rotating speed 1000r/min (high speed) and 800r/min (low speed), 1500r/min (high speed) and 800r/min (low speed),2000r/min (high speed) and 800r/min (low speed),2500r/min (high speed) and 800r/min (low speed) respectively. The films were characterized by ellipsometer and SEM respectively. The experimental results show the thickness and refractive index of films are become smaller and smaller with the rotating speeds increasing.

Study of the refractive index change in a-Si:H thin films patterned by 532nm laser radiation for photovoltaic applications

2010 ◽  
Vol 518 (18) ◽  
pp. 5331-5339 ◽  
Author(s):  
M. Colina ◽  
C. Molpeceres ◽  
M. Holgado ◽  
J. Gandia ◽  
O. Nos ◽  
...  
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Laser Radiation ◽  
Refractive Index Change ◽  
Index Change ◽  
Photovoltaic Applications

OPTICAL NONLINEARITY OF A TRIPHENYLMETHANE DYE AS STUDIED BY Z-SCAN AND SELF-DIFFRACTION TECHNIQUES

2006 ◽  
Vol 20 (15) ◽  
pp. 887-897 ◽  
Author(s):  
R. MADHANA SUNDARI ◽  
P. K. PALANISAMY
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Refractive Index Change ◽  
Optical Nonlinearity ◽  
Organic Dye ◽  
The Self ◽  
Index Change ◽  
Thermally Induced ◽  
Dye Sensitized ◽  
Phase Differences

The optical nonlinearity of an organic dye from a triphenylmethane group is measured using the Z-scan technique. The sample under study is found to exhibit the negative nature of nonlinearity, which is mainly due to the thermally induced refractive index change. Since this thermally induced refractive index change can lead to self-diffraction, the self-diffraction properties of the sample is studied by using thin films of a dye-sensitized gelatin. A He-Ne laser (633 nm) is used for both the Z-scan and self-diffraction studies. In the self-diffraction studies, it is also found that the different diffracted orders exhibit varying phase differences.

Refractive Index and Extinction Coefficient of ZnO:Al Thin Films Derived by Sol-Gel Dip Coating Technique

2013 ◽  
Vol 334-335 ◽  
pp. 290-293 ◽  
Author(s):  
N. Baydogan ◽  
T. Ozdurmusoglu ◽  
Huseyin Cimenoglu ◽  
A.B. Tugrul
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Extinction Coefficient ◽  
Annealing Temperature ◽  
Sol Gel ◽  
Dip Coating ◽  
Optical Parameters ◽  
Coating Technique ◽  
Glass Substrates ◽  
Dip Coating Technique

Doped ZnO:Al thin films were deposited on glass substrates by the solgel dip technique. Optical parameters such as the refractive index and the extinction coefficient tend to change with increasing annealing temperature.

scholarly journals Refractive index change dominates the transient absorption response of metal halide perovskite thin films in the near infrared

2019 ◽  
Vol 21 (27) ◽  
pp. 14663-14670 ◽  
Author(s):  
Hannu P. Pasanen ◽  
Paola Vivo ◽  
Laura Canil ◽  
Antonio Abate ◽  
Nikolai Tkachenko
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Near Infrared ◽  
Transient Absorption ◽  
Refractive Index Change ◽  
Metal Halide ◽  
Index Change ◽  
Metal Halide Perovskite ◽  
Halide Perovskite

Perovskite films have an uncommon, previously unreported transient absorption response in the NIR, which is caused by a change in the refractive index.

Photo- and thermo-induced refractive index change of GeO 2 -B 2 O 3 -SiO 2 thin films fabricated by PECVD

2003 ◽  
Author(s):  
Hiroaki Nishiyama ◽  
Isamu Miyamoto ◽  
Kenji Kintaka ◽  
Junji Nishii
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Refractive Index Change ◽  
Index Change

Photoinduced Changes in Sn-Doped Sol-Gel Silica Glass Films

2005 ◽  
Vol 475-479 ◽  
pp. 3705-3708
Author(s):  
Aiwu Li ◽  
Hua Xing ◽  
Cuiling Zhou ◽  
Jian Shen ◽  
Letian Zhang ◽  
...  
Keyword(s):  
Refractive Index ◽  
Photoelectron Spectroscopy ◽  
Sol Gel ◽  
Refractive Index Change ◽  
Uv Laser ◽  
Index Change ◽  
X Ray ◽  
Si Substrates ◽  
Variable Angle Spectroscopic Ellipsometry ◽  
Photoinduced Changes

Sn-doped SiO2 thin films were fabricated on Si substrates by the Sol-Gel method. Permanent refractive index change was found using ultraviolet (UV) laser radiation at 248 nm. The photoinduced refractive index change increased after radiation and variety in the contents of Tin. The optical and surface properties of the films were characterized using X-ray photoelectron spectroscopy (XPS) and variable angle spectroscopic ellipsometry (VASE).

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