Failure Analysis of High Pressure Container using Fractography and Material Morphology

2018 ◽  
Vol 773 ◽  
pp. 287-291
Author(s):  
Eui Soo Kim
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Pressure ◽  
Failure Analysis ◽  
Large Scale ◽  
Chemical Properties ◽  
Accurate Analysis ◽  
Internal Pressures ◽  
Scanning Electron ◽  
And Chemical Properties

High-pressure gas containers must be able to withstand high internal pressures because they store compressed gases. Otherwise, cracks or defects may lead to an explosion, which may in turn lead to a large-scale disaster. Therefore, accurate analysis of the causes of cracks or defects and various techniques for detecting cracks or defects are needed. In this research, we analyzed the failure mechanism of a high-pressure gas container through fractography using scanning electron microscopy and optical microscopy and through measurements of their mechanical and chemical properties.

Scattering of Electrons at High - Pressure and Restoration of Image Contrast in High Pressure Scanning Electron Microscopy

1990 ◽  
Vol 48 (1) ◽  
pp. 384-385
Author(s):  
J. S. Shah ◽  
R. Durkin ◽  
A. N. Farley
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Pressure ◽  
Cross Sections ◽  
Single Scattering ◽  
Image Contrast ◽  
Experimental Scheme ◽  
Medium Resolution ◽  
Scattering Approximation ◽  
Scanning Electron

It is now possible to perform High Pressure Scanning Electron Microscopy (HPSEM) in the range 10 to 2000 Pa. Here the effect of scattering on resolution has been evaluated by calculating the profile of the beam in high pressure and assessing its effect on the image contrast . An experimental scheme is presented to show that the effect of the primary beam ionization is to reduce image contrast but this effect can be eliminated by a novel use of specimen current detection in the presence of an electric field. The mechanism of image enhancement is discussed in terms of collection of additional carriers generated by the emissive components.High Pressure SEM (HPSEM) instrumentation is establishing itself as commercially viable. There are now a number of manufacturers, such as JEOL, ABT, ESCAN, DEBEN RESEARCH, selling microscopes and accessories for HPSEM. This is because high pressure techniques have begun to yield high quality micrographs at medium resolution.To study the effect of scattering on the incident electron beam, its profile - in a high pressure environment - was evaluated by calculating the elastic and inelastic scattering cross sections for nitrogen in the energy range 5-25 keV. To assess the effect of the scattered beam on the image contrast, the modification of a sharp step contrast function due to scattering was calculated by single scattering approximation and experimentally confirmed for a 20kV accelerated beam.

XRPD and Scanning Electron Microscopy of Alloys of the CuAlS2 – CuFeS2 System Prepared by Thermobaric Treatment

MRS Advances ◽  
2018 ◽  
Vol 3 (56) ◽  
pp. 3323-3328
Author(s):  
Barys Korzun ◽  
Anatoly Pushkarev
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Pressure ◽  
Unit Cell Volume ◽  
Unit Cell ◽  
Unit Cell Parameters ◽  
X Ray ◽  
Cell Parameters ◽  
Lattice Constants ◽  
Scanning Electron

ABSTRACTAlloys of the CuAlS2 – CuFeS2 system were prepared by thermobaric treatment at high pressure of 5.5 GPa and temperatures ranging from 573 to 1573 K and phase formation in the system was investigated using X-ray powder diffraction, optical microscopy and scanning electron microscopy equipped with energy dispersive spectroscopy. The unit-cell parameters (the lattice constants and the unit-cell volume) were computed as a function of the composition. Absence of complete solubility in the (CuAlS2)1-x-(CuFeS2)x system was established. Formation of solid solutions with the tetragonal structure of chalcopyrite was detected for compositions with the molar part of CuFeS2 x not exceeding 0.10.

The Fracture Failure Analysis of Precision Centrifuge Spindle

2014 ◽  
Vol 971-973 ◽  
pp. 802-805
Author(s):  
Wei Feng Zhang ◽  
Li Yan ◽  
Fu Xia Zhang
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Chemical Composition ◽  
Fracture Mechanics ◽  
Failure Analysis ◽  
Fatigue Failure ◽  
High Speed ◽  
Experimental Results ◽  
Fracture Failure ◽  
Scanning Electron

For the problem of high-speed rotating centrifuge spindle fracture failures, relevant analyses are conducted from the perspective of microstructure, chemical composition and fracture mechanics by using scanning electron microscopy and related instruments. Experimental results and analyses indicate that the spindle fracture is fatigue failure, mainly caused by cold cracks generated on the journal surfacing. Based on the analysis results, improvements and measures are suggested to better solve the spindle weld fracture failure problems.

Failure analysis of microcircuitry by scanning electron microscopy

1967 ◽  
Vol 6 (1) ◽  
pp. 9-16 ◽  
Author(s):  
P.R. Thornton ◽  
K.A. Hughes ◽  
Htin Kyaw ◽  
C. Millward ◽  
D.V. Sulway
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Failure Analysis ◽  
Scanning Electron

Morphology of the lateral fields of the infective juvenile of the entomopathogenic family Steinernematidae (Nematoda) using high pressure freezing (HPF)

Nematology ◽  
2019 ◽  
Vol 22 (1) ◽  
pp. 69-74
Author(s):  
Zdeněk Mráček ◽  
Jiří Nermut’ ◽  
Martina Tesařová ◽  
Vladimír Půža
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Pressure ◽  
Infective Juvenile ◽  
Field Pattern ◽  
Taxonomic Character ◽  
High Pressure Freezing ◽  
Lateral Field ◽  
Transmission Electron ◽  
Scanning Electron

Summary The lateral field pattern of infective juveniles of the nematode family Steinernematidae is an important taxonomic character. Scanning electron microscopy (SEM) shows the number of ridges and lines or incisures clearly, but does not provide other details. In the present study, ten species from six clades of Steinernematidae have been studied for their lateral field morphology using SEM and high pressure freezing (HPF) with transmission electron microscopy (TEM). Both methods indicated the same number of ridges and lines, although HPF/TEM resulted in a more detailed morphology with differences between the species. The tips of the ridges are either finely rounded or pointed and the lines are V-shaped or have a broadened bottom. These characters represent an additional pattern that may be characteristic for some species within the phylogenetic clades. Further studies of the lateral field morphology of other species is needed to ascertain whether each pattern is clade specific and phylogenetically valuable.

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