The Effect of Deformation Strain on Texture Uniformity in Tantalum Sheet during Asymmetric Cross Rolling

2021 ◽  
Vol 1016 ◽  
pp. 1765-1769
Author(s):  
Jia Lin Zhu ◽  
Shi Feng Liu ◽  
Dou Dou Long ◽  
Ya Hui Liu ◽  
Shi Yuan Zhou ◽  
...  
Keyword(s):  
High Purity ◽  
Crystallographic Texture ◽  
Texture Gradient ◽  
X Ray Diffraction ◽  
Center Layer ◽  
Deformation Strain ◽  
Cross Rolling ◽  
X Ray

Microstructure and crystallographic texture play an important role in the sputtering target properties. The effect of asymmetric cross rolling (ACR) and deformation strain during ACR on texture homogeneity is not clear. Thus, high-purity tantalum (Ta) plates were ACR to 60% and 87% reduction in thickness. Texture of the rolled Ta sheets in the surface and center layer are characterized via X-ray diffraction (XRD). The XRD results indicate that ACR is effective to weaken the texture gradient existing in the as-received Ta plate. Besides, more homogeneous texture distribution along the thickness can be obtained with the increasing strain during ACR process.

scholarly journals An Explanation of Microstructures in the Tantalum-Carbon System

1963 ◽  
Vol 7 ◽  
pp. 126-135 ◽  
Author(s):  
G. Santoro ◽  
H. B. Probst
Keyword(s):  
Chemical Analysis ◽  
High Purity ◽  
Unknown Origin ◽  
Conclusive Evidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Characteristic Appearance ◽  
Precipitation Model ◽  
Micro Structures ◽  
Carbon System

AbstractCompositions in the tantalum-carbon system were prepared by carburizing high-purity tantalum wires. The microstructures so produced exhibit regions of a characteristic striated structure identical to those observed by earlier investigators. There are disparities in the literature as to the origin of such structures in the tantalum—carbon system. They have been variously described as “twins,” “striated structure,” “precipitate,” and “structure of unknown origin.” This paper presents conclusive evidence that the structures in question are the result of precipitation on cooling. In addition, a coherent precipitation model is applied in which it is shown that the lattice relationship {0001}Ta2C‖{Klll}TaC can exist with less than 0.5% misfit. This relationship is shown to completely explain the occurrence and characteristic appearance of the observed micro structures. Correlations between chemical analysis, X-ray diffraction results, metallography, and microhardness measurements confirm the proposed precipitation model.

Crystal Structure and Colorimetric Behavior of Low Melting Point Ternary Alloy

2020 ◽  
Vol 1002 ◽  
pp. 12-20
Author(s):  
Tarik T. Issa ◽  
Sadeer M. Majeed ◽  
Duha S. Ahmed
Keyword(s):  
Crystal Structure ◽  
Melting Point ◽  
Mechanical Alloying ◽  
Ternary Alloy ◽  
High Purity ◽  
Milling Time ◽  
X Ray Diffraction ◽  
X Ray ◽  
Before And After

Elements of high purity (99.999) ,were used to prepare the alloy , Bi ,Sn,Zn and Cu .Two types alloy Bi – Sn – Zn and Bi – Sn – Cu were prepared by mechanical alloying technique (MA) .Annealing at 100 °Cfor 8 hours was applied for the resulting alloys . X-ray diffraction and differential scanning colorimetriy were tested for the two types of alloy before and after annealing. The best results was noticed in the ternary alloythat prepared at 4 hours milling time ,and annelid at 100 °C, for 8 hours ,under static air.

A Novel Technique of Flyash Utilization: Preparation of Silica from Flyash by Alkali Leaching

2010 ◽  
Vol 434-435 ◽  
pp. 814-815
Author(s):  
An Ran Guo ◽  
Jia Chen Liu ◽  
Yi Bing Sun ◽  
Wen Jun Lian ◽  
Lu Yang
Keyword(s):  
High Purity ◽  
Sodium Hydroxide Solution ◽  
X Ray Diffraction ◽  
X Ray ◽  
Novel Technique ◽  
Reinforcing Agent ◽  
Alkali Leaching ◽  
A New Technique ◽  
Fluorescence Spectrometer ◽  
Scanning Electron

A new technique of flyash utilization was presented and high-purity silica was prepared by alkali leaching. The flyash was added into sodium hydroxide solution, and then the suspension was heated to 115 °C for 30 min. After filtrated, the filtrate was collected and carbon dioxide was imported into the solution. Finally, the silica would precipitate from the solution. The silica was characterized by scanning electron microscopy, X-ray diffraction and X-ray fluorescence spectrometer. The high-purity silica prepared from flyash was qualified for the rubber reinforcing agent used in shoemaking.

scholarly journals Effects of Annealing Temperature on Recrystallization Texture and Microstructure Uniformity of High Purity Tantalum

Metals ◽  
2019 ◽  
Vol 9 (1) ◽  
pp. 75 ◽  
Author(s):  
Jialin Zhu ◽  
Chao Deng ◽  
Yahui Liu ◽  
Nan Lin ◽  
Shifeng Liu
Keyword(s):  
Low Temperature ◽  
Electron Backscatter Diffraction ◽  
Stored Energy ◽  
X Ray Diffraction ◽  
Center Layer ◽  
X Ray ◽  
Texture Intensity ◽  
Low Temperature Annealing ◽  
Transmission Electron ◽  
Backscatter Diffraction

One hundred and thirty-five degree clock rolling significantly improves the texture homogeneity of tantalum sheets along the thickness, but a distinctly fragmented substructure is formed within {111} (<111>//normal direction (ND)) and {100} (<100>//ND) deformation grains, which is not suitable to obtain a uniform recrystallization microstructure. Thus, effects of different annealing temperatures on the microstructure and texture heterogeneity of tantalum sheets along the thickness were investigated by X-ray diffraction (XRD), electron backscatter diffraction (EBSD) and transmission electron microscopy (TEM). Results show that the texture distribution along θ-fiber and γ-fiber is irregular and many large grains with {111} orientation develop during annealing at high temperature. However, low-temperature annealing can not only weaken the texture intensity in the surface and the center layer but also introduce a more uniform grain size distribution. This result can be attributed to the subgrain-nucleation-dominated recrystallization mechanism induced by recovery at low temperature, and moreover, a considerable decline of recrystallization driving force resulting from the release of stored energy in the deformation matrix.

Stress and Texture Analysis in Thin Films and Coatings by X-Ray Diffraction

2006 ◽  
Vol 514-516 ◽  
pp. 1613-1617
Author(s):  
J.C.P. Pina ◽  
Maria José Marques ◽  
J.M.M. dos Santos ◽  
A. Morão Dias
Keyword(s):  
Thin Films ◽  
Crystallographic Texture ◽  
Fiber Texture ◽  
X Ray Diffraction ◽  
X Ray ◽  
Tensile Stresses ◽  
Aluminum Coatings ◽  
Annealing Temperatures ◽  
Diffraction Geometry ◽  
Chromium Films

The thin and textured coatings present a double difficulty for characterization by conventional X-ray diffraction. Their shallow depth reduces the diffracted intensity and allows the interference of the underlying material. Frequently they present a crystallographic texture which limits the number of orientations that provide good intensity and induces anisotropy effects on their mechanical behavior. Reliable results can be determined using diffraction geometry of lowincidence angle. This paper describes the application of the technique to several films, characterized by thicknesses of the order of 1 μm and crystallographic textures. Examples are proposed of chromium films applied by PVD on molybdenum substrates, decorative electroplated coatings, and aluminum coatings used for interconnections in microelectronic circuits. The Cr films are 1.5 μm thick and exhibit a strong <100> fiber texture. The decorative coatings were studied both on the nickel undercoat and in the Cr top layer. Results are presented for chromium where tensile stresses and a <110> fiber texture were observed. The Al films are 1.0 μm thick. Some samples were heattreated at different annealing temperatures. Tensile stresses were always observed, which increase in the annealed samples.

Synthesis of Source Powder for SiC Crystal Growth Using High Purity Silicon and Carbon Powder

2012 ◽  
Vol 529 ◽  
pp. 64-68
Author(s):  
H. Wang ◽  
C.F. Yan ◽  
H.K. Kong ◽  
J.J. Chen ◽  
J. Xin ◽  
...  
Keyword(s):  
Crystal Growth ◽  
Lattice Constant ◽  
High Purity ◽  
Synthesis Temperature ◽  
Carbon Powder ◽  
X Ray Diffraction ◽  
Prepared Powder ◽  
X Ray ◽  
High Purity Silicon

This work focused on the synthesis of source powder for SiC crystal growth. SiC powder was prepared using high purity silicon and carbon powder. Broad ranges of temperature and Ar pressure were studied on the property of the as-prepared powder. X-ray diffraction (XRD) results show that SiC polytypes were determined by synthesis temperature, while not related to the variation of Ar pressure. The lattice constant of SiC would expand when Ar pressure decreased. Raman results revealed that the variation of Ar pressure would influence SiC crystallization. It was found that the concentrations of free C, free Si and nitrogen all varied with the variation of temperature or Ar pressure.

X-ray diffraction study on proton-irradiated high-purity aluminum

1989 ◽  
Vol 8 (11-12) ◽  
pp. 477-480 ◽  
Author(s):  
E. Bonetti ◽  
E. Fuschini ◽  
R. Montanari ◽  
M. Servidori ◽  
A. Uguzzoni
Keyword(s):  
Diffraction Study ◽  
High Purity ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Purity Aluminum

X-ray diffraction characterization of stress and crystallographic texture in thin film media

1993 ◽  
Vol 29 (1) ◽  
pp. 300-306 ◽  
Author(s):  
J.A. Bain ◽  
B.M. Clemens ◽  
S.M. Brennan ◽  
H. Kataoka
Keyword(s):  
Thin Film ◽  
Crystallographic Texture ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystals

2020 ◽  
Vol 53 (4) ◽  
pp. 880-884 ◽  
Author(s):  
Kevin-P. Gradwohl ◽  
Andreas N. Danilewsky ◽  
Melissa Roder ◽  
Martin Schmidbauer ◽  
József Janicskó-Csáthy ◽  
...  
Keyword(s):  
Single Crystals ◽  
High Purity ◽  
Direct Evidence ◽  
X Ray Diffraction ◽  
Structural Perfection ◽  
X Ray ◽  
High Purity Germanium ◽  
High Structural Perfection ◽  
Diffraction Imaging ◽  
General Method

White-beam X-ray topography has been performed to provide direct evidence of micro-voids in dislocation-free high-purity germanium single crystals. The voids are visible because of a dynamical diffraction contrast. It is shown that voids occur only in dislocation-free parts of the crystal and do not show up in regions with homogeneous and moderate dislocation density. It is further suggested that the voids originate from clustering of vacancies during the growth process. A general method is proposed to verify the presence of voids for any crystalline material of high structural perfection.

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