Thermal Stability of Electrodeposited Ni and Ni-Co Layers; an EBSD-Study
2004 ◽
Vol 467-470
◽
pp. 1345-1352
◽
Keyword(s):
X Ray
◽
The influence of heat treatment on the microstructure and the microtexture of electrodeposited Ni and Ni-Co layers was investigated with Electron Backscatter Diffraction (EBSD) with high resolution. Samples were annealed for 1 hour at 523 K and 673 K, the temperature region wherein recrystallisation occurs. The results are discussed in relation to the resolution of EBSD for the very fine grained electrodeposits and previous X-ray diffraction investigations.
2016 ◽
Vol 858
◽
pp. 147-150
◽
2019 ◽
Vol 52
(2)
◽
pp. 415-427
◽
2008 ◽
Vol 59
◽
pp. 86-91
◽
2016 ◽
Vol 49
(2)
◽
pp. 632-635
◽