Microstrain distributions in polycrystalline thin films measured by X-ray microdiffraction

2016 ◽  
Vol 49 (2) ◽  
pp. 632-635 ◽  
Author(s):  
N. Schäfer ◽  
G. A. Chahine ◽  
A. J. Wilkinson ◽  
T. Schmid ◽  
T. Rissom ◽  
...  
Keyword(s):  
Thin Films ◽  
Solar Cell ◽  
High Resolution ◽  
Electron Backscatter Diffraction ◽  
Model System ◽  
X Ray ◽  
Distribution Maps ◽  
Polycrystalline Thin Films ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Microstrain distributions were acquired in functional thin films by high-resolution X-ray microdiffraction measurements, using polycrystalline CuInSe2 thin films as a model system. This technique not only provides spatial resolutions at the submicrometre scale but also allows for analysis of thin films buried within a complete solar-cell stack. The microstrain values within individual CuInSe2 grains were determined to be of the order of 10−4. These values confirmed corresponding microstrain distribution maps obtained on the same CuInSe2 layer by electron backscatter diffraction and Raman microspectroscopy.

Thermal Stability of Electrodeposited Ni and Ni-Co Layers; an EBSD-Study

2004 ◽  
Vol 467-470 ◽  
pp. 1345-1352 ◽  
Author(s):  
A.A. Rasmussen ◽  
Ali Gholinia ◽  
Patrick W. Trimby ◽  
Marcel A.J. Somers
Keyword(s):  
Heat Treatment ◽  
Thermal Stability ◽  
High Resolution ◽  
Electron Backscatter Diffraction ◽  
X Ray Diffraction ◽  
X Ray ◽  
Fine Grained ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Thermal Stability Of

The influence of heat treatment on the microstructure and the microtexture of electrodeposited Ni and Ni-Co layers was investigated with Electron Backscatter Diffraction (EBSD) with high resolution. Samples were annealed for 1 hour at 523 K and 673 K, the temperature region wherein recrystallisation occurs. The results are discussed in relation to the resolution of EBSD for the very fine grained electrodeposits and previous X-ray diffraction investigations.

Cross Section Analysis of Cu Filled TSVs Based on High Throughput Plasma-FIB Milling

2012 ◽  
Author(s):  
Frank Altmann ◽  
Jens Beyersdorfer ◽  
Jan Schischka ◽  
Michael Krause ◽  
German Franz ◽  
...  
Keyword(s):  
High Resolution ◽  
Cross Section ◽  
High Throughput ◽  
Cross Sections ◽  
Electron Backscatter Diffraction ◽  
Grain Structure ◽  
Electron Backscatter ◽  
Section Surface ◽  
Backscatter Diffraction ◽  
Section Analysis

Abstract In this paper the new Vion™ Plasma-FIB system, developed by FEI, is evaluated for cross sectioning of Cu filled Through Silicon Via (TSV) interconnects. The aim of the study presented in this paper is to evaluate and optimise different Plasma-FIB (P-FIB) milling strategies in terms of performance and cross section surface quality. The sufficient preservation of microstructures within cross sections is crucial for subsequent Electron Backscatter Diffraction (EBSD) grain structure analyses and a high resolution interface characterisation by TEM.

scholarly journals Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison between the sin2ψ and cosα methods

2019 ◽  
Vol 52 (4) ◽  
pp. 828-843 ◽  
Author(s):  
Dorian Delbergue ◽  
Damien Texier ◽  
Martin Lévesque ◽  
Philippe Bocher
Keyword(s):  
Residual Stress ◽  
Grain Size ◽  
Tilt Angle ◽  
Measurement Errors ◽  
Electron Backscatter Diffraction ◽  
Measurement Techniques ◽  
Single Exposure ◽  
X Ray ◽  
Electron Backscatter ◽  
Backscatter Diffraction

X-ray diffraction (XRD) is a widely used technique to evaluate residual stresses in crystalline materials. Several XRD measurement methods are available. (i) The sin2ψ method, a multiple-exposure technique, uses linear detectors to capture intercepts of the Debye–Scherrer rings, losing the major portion of the diffracting signal. (ii) The cosα method, thanks to the development of compact 2D detectors allowing the entire Debye–Scherrer ring to be captured in a single exposure, is an alternative method for residual stress measurement. The present article compares the two calculation methods in a new manner, by looking at the possible measurement errors related to each method. To this end, sets of grains in diffraction condition were first identified from electron backscatter diffraction (EBSD) mapping of Inconel 718 samples for each XRD calculation method and its associated detector, as each method provides different sets owing to the detector geometry or to the method specificities (such as tilt-angle number or Debye–Scherrer ring division). The X-ray elastic constant (XEC) ½S 2, calculated from EBSD maps for the {311} lattice planes, was determined and compared for the different sets of diffracting grains. It was observed that the 2D detector captures 1.5 times more grains in a single exposure (one tilt angle) than the linear detectors for nine tilt angles. Different XEC mean values were found for the sets of grains from the two XRD techniques/detectors. Grain-size effects were simulated, as well as detector oscillations to overcome them. A bimodal grain-size distribution effect and `artificial' textures introduced by XRD measurement techniques are also discussed.

Comparison of Workability of ZK60A Alloy Depending on Casting Methods

2012 ◽  
Vol 630 ◽  
pp. 35-40
Author(s):  
K.H. Jung ◽  
B. Ahn ◽  
S. Lee ◽  
D.S. Choi ◽  
Y.S. Lee ◽  
...  
Keyword(s):  
Magnesium Alloy ◽  
Continuous Casting ◽  
Elevated Temperatures ◽  
Electron Backscatter Diffraction ◽  
Die Casting ◽  
Inspection System ◽  
Compression Tests ◽  
X Ray ◽  
Electron Backscatter ◽  
Backscatter Diffraction

In this research, the effect of casting methods on the workability of magnesium alloy ZK60A was investigated by comparing two different billets, fabricated by semi-continuous casting and die casting. To determine the workability of the materials, uniaxial compression tests were conducted at different elevated temperatures and strain rate of 0.01/s. In addition, the X-ray inspection system and electron backscatter diffraction (EBSD) were employed to compare their internal defects and microstructures, respectively. The workability of ZK60A depending on the casting methods is discussed based on the obtained experimental results.

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