Investigation of Aluminum Content on the Properties of Sol-Gel-Derived Zinc Oxide Thin Films

2007 ◽  
Vol 561-565 ◽  
pp. 1173-1176
Author(s):  
Shu Wen Xue ◽  
Xiao Tao Zu
Keyword(s):  
Sol Gel ◽  
Optical Transmittance ◽  
Atomic Ratio ◽  
Zno Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Al Content ◽  
Glass Substrates ◽  
Wide Range ◽  
Sol Gel Process

This paper reports that ZnO:Al films were deposited onto glass substrates by sol-gel process. Al/Zn atomic ratio varied in a wide range from 0 ~ 20%. The structural and optical properties were investigated by X-ray diffraction (XRD) and optical transmittance, respectively. X-ray photoemission spectroscopy (XPS) was used to investigate the elemental compositions. XRD results showed that ZnO films remained c-axis-orientated when Al/Zn atomic ratio was below 20% and the grain size decreased with increasing Al content. The optical transmittance showed that the optical bandgap of ZnO films blueshifted with increasing Al/Zn atomic ratio from 0-20%. XPS measurements showed that the binding energy of O1s increased with increasing Al content.

Effects of Annealing on Properties of (Na,Mg):ZnO Thin Films Deposited by Sol-Gel Method

2014 ◽  
Vol 898 ◽  
pp. 33-36 ◽  
Author(s):  
Cai Zhen Zhang ◽  
Yong Gang Chen ◽  
Su Liu
Keyword(s):  
Annealing Temperature ◽  
Sol Gel ◽  
Zno Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
Coating Method ◽  
Method Effects ◽  
Structural Surface ◽  
Co Doped

Na/Mg co-doped (Na,Mg):ZnO films were fabricated on pyrex glass substrates by sol-gel spin-coating method. Effects of annealing on properties of the films were particularly investigated using X-ray diffraction (XRD), scanning electron microscopy (SEM) and transmittance spectra. The internal stress of the films annealed at different temperature was calculated. Experimental and analytical results show that some NaCl freeze-out derivatives will appear on films when the annealing temperature is too low, with the increasing annealing temperature, the c-axis tensile stress is sharply decreased first, then the c-axis stress was changed into press stress and its value is increased continuously, so the structural, surface and the optical properties of the films improve first and deteriorate afterwards.

scholarly journals Effect of the Incorporation of Titanium on the Optical Properties of ZnO Thin Films: From Doping to Mixed Oxide Formation

Coatings ◽  
2019 ◽  
Vol 9 (3) ◽  
pp. 180 ◽  
Author(s):  
Miriam Yuste ◽  
Ramon Escobar-Galindo ◽  
Noelia Benito ◽  
Carlos Palacio ◽  
Oscar Martínez ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Mixed Oxides ◽  
Energy Gap ◽  
Amorphous Structure ◽  
Zno Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
Wide Range ◽  
Ti Content

ZnO films with Ti atoms incorporated (TZO) in a wide range (0–18 at.%) have been grown by reactive co-sputtering on silicon and glass substrates. The influence of the titanium incorporation in the ZnO matrix on the structural and optical characteristics of the samples has been determined by Rutherford backscattering spectroscopy (RBS), X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD). The results indicate that the samples with low Ti content (<4 at.%) exhibit a wurtzite-like structure, with the Ti4+ ions substitutionally incorporated into the ZnO structure, forming Ti-doped ZnO films. In particular, a very low concentration of Ti (<0.9 at.%) leads to a significant increase of the crystallinity of the TZO samples. Higher Ti contents give rise to a progressive amorphization of the wurtzite-like structure, so samples with high Ti content (≥18 at.%) display an amorphous structure, indicating in the XPS analysis, a predominance of Ti–O–Zn mixed oxides. The energy gap obtained from absorption spectrophotometry increases from 3.2 eV for pure ZnO films to 3.6 eV for those with the highest Ti content. Ti incorporation in the ZnO samples <0.9 at.% raises both the blue (380 nm) and green (approx. 550 nm) bands of the photoluminescence (PL) emission, thereby indicating a significant improvement of the PL efficiency of the samples.

Effect of N and P codoping on ZnO properties

2013 ◽  
Vol 645 ◽  
pp. 64-67 ◽  
Author(s):  
Jin Zhong Wang ◽  
Elangovan Elamurugu ◽  
Hong Tao Li ◽  
Shu Jie Jiao ◽  
Lian Cheng Zhao ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Atomic Ratio ◽  
Zno Films ◽  
X Ray Diffraction ◽  
Nitrogen And Phosphorus ◽  
X Ray ◽  
Co Doping ◽  
Glass Substrates ◽  
Doped Zno ◽  
Co Doped

Nitrogen and Phosphorus co-doped (N+P)- zinc oxide (ZnO) films were RF sputtered on corning glass substrates at 350 °C and comparatively studied with undoped, N-, and P- doped ZnO. X-ray diffraction spectra confirmed that the ZnO structure with a preferred orientation along direction. Scanning electron microscope analysis showed different microstructure for the N+P co-doping, and thus probably confirming the co-existence of both the dopants. X-ray photoelectron spectroscopy spectra revealed that the chemical composition in N+P co-doped ZnO are different from that found in undoped, N-, and P- doped ZnO. The atomic ratio of N and P in N+P co-doped ZnO is higher than that in single N or P doped ZnO. One broad ZnO emission peak around 420 nm is observed in photoluminescence spectra. The relative intensity of the strongest peak obtained from co-doped ZnO films is about twice than the P- doped and thrice than the pure and N- doped films.

scholarly journals Modulating light absorption and multiferroic properties of BiFeO3-based ferroelectric films by the introduction of ZnO layer

2021 ◽  
Author(s):  
Kexin Li ◽  
Wanyun Zhang ◽  
Kaixin Guo ◽  
Ruirui Cui ◽  
Chaoyong Deng ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Morphology ◽  
Remanent Polarization ◽  
Bismuth Ferrite ◽  
Sol Gel ◽  
Magnetization Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
Sol Gel Process

Abstract Pure bismuth ferrite (BiFeO3, BFO) and ZnO thin films, as well as BFO/ZnO and ZnO/BFO composite thin films were successfully deposited by a sol-gel process on Pt/Ti/SiO2/Si and FTO/glass substrates, respectively. The chemical composition, surface morphology, optical properties, and multiferroicity were systematically investigated. X-ray diffraction and electron microscopy measurements were used to determine the crystalline phase and to analyze the surface morphology. Evidently, the absorption edges of both BFO/ZnO and ZnO/BFO films show a redshift, broadening the absorption range. The leakage current density decreases with the introduction of ZnO, and the ferroelectricity was significantly improved of the bilayers. Thereinto, BFO/ZnO and ZnO/BFO show the highest saturate polarization (2P s) of 46.7 μc/cm2 and the maximum remanent polarization (2P r) of 18.5 μc/cm2, respectively. Meanwhile, the magnetization measurement revealed that both BFO/ZnO and ZnO/BFO exhibiting an enhanced magnetization, especially, BFO/ZnO displays the highest saturation magnetization (2M s, 68.87 emu/cm3) and remanent magnetization (2M r, 4.87 emu/cm3).

scholarly journals Synthesis of Core–Double Shell Nylon-ZnO/Polypyrrole Electrospun Nanofibers

Nanomaterials ◽  
2020 ◽  
Vol 10 (11) ◽  
pp. 2241
Author(s):  
Mihaela Beregoi ◽  
Nicoleta Preda ◽  
Andreea Costas ◽  
Monica Enculescu ◽  
Raluca Negrea ◽  
...  
Keyword(s):  
Sol Gel ◽  
Electrospun Nanofibers ◽  
Spectroscopic Techniques ◽  
X Ray Diffraction ◽  
Zno Film ◽  
X Ray ◽  
Wide Range ◽  
Sol Gel Process ◽  
Sol Gel Synthesis ◽  
Inorganic Layers

Core–double shell nylon-ZnO/polypyrrole electrospun nanofibers were fabricated by combining three straightforward methods (electrospinning, sol–gel synthesis and electrodeposition). The hybrid fibrous organic–inorganic nanocomposite was obtained starting from freestanding nylon 6/6 nanofibers obtained through electrospinning. Nylon meshes were functionalized with a very thin, continuous ZnO film by a sol–gel process and thermally treated in order to increase its crystallinity. Further, the ZnO coated networks were used as a working electrode for the electrochemical deposition of a very thin, homogenous polypyrrole layer. X-ray diffraction measurements were employed for characterizing the ZnO structures while spectroscopic techniques such as FTIR and Raman were employed for describing the polypyrrole layer. An elemental analysis was performed through X-ray microanalysis, confirming the expected double shell structure. A detailed micromorphological characterization through FESEM and TEM assays evidenced the deposition of both organic and inorganic layers. Highly transparent, flexible due to the presence of the polymer core and embedding a semiconducting heterojunction, such materials can be easily tailored and integrated in functional platforms with a wide range of applications.

STRUCTURE AND CHARACTERIZATION OF ZnO THIN FILM PREPARED BY SPIN COATING

2006 ◽  
Vol 13 (01) ◽  
pp. 13-15 ◽  
Author(s):  
GUANGPENG MA ◽  
JIANRU HAN ◽  
CHANGHONG YANG ◽  
HONGYAN XU ◽  
DONGMEI YANG ◽  
...  
Keyword(s):  
Spin Coating ◽  
Silica Glass ◽  
Sol Gel ◽  
Zno Films ◽  
Ultraviolet Region ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
High Temperature Process

ZnO thin films were prepared on silica glass substrates by a sol–gel spin coating technique. The thickness of the films was about 200 nm. At 370 nm in the ultraviolet region, there is a sharp absorption edge that corresponds to the ZnO intrinsic band gap of 3.30 eV. The structural properties of the films were examined by X-ray diffraction, which demonstrates that the ZnO films were c-axis oriented. From the infrared spectrum, we conclude that ZnO was deposited on silica glass substrates through a high temperature process at 700°C.

Investigation of the Structural, Optical and Electrical Properties of Gadolinium-Doped Zinc Oxide Films Prepared by Sol-Gel Method

2016 ◽  
Vol 1133 ◽  
pp. 424-428 ◽  
Author(s):  
Norhidayah Che Ani ◽  
Mohd Zainizan Sahdan ◽  
Nayan Nafarizal ◽  
Siti Nooraya Mohd Tawil
Keyword(s):  
Zinc Oxide ◽  
Sol Gel ◽  
Visible Region ◽  
Hexagonal Wurtzite Structure ◽  
Optical Transmittance ◽  
Zno Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Zinc Oxide Films ◽  
Resistance Decrease

Thin films of undoped and gadolinium-doped zinc oxide (Gd-doped ZnO) with different Gd concentration (1-8 at. %) were deposited onto a glass substrate by sol–gel spin-coating technique. X-ray diffraction (XRD, Bruker D8 Advance) studies confirmed the nature of the films as polycrystalline, with typical hexagonal wurtzite structure. The film also showed variation in crystallite size and change in relative intensities, upon different Gd concentrations. Besides, the influence of Gd concentration on the optical transmittance of ZnO films was studied using ultraviolet-visible spectrophotometer (UV-Vis, Shimadzu UV 1800) in the wavelength range 300-800 nm. The optical transmittance of all films is higher than ~95% in the visible region, and doped films become more transparent. The electrical resistance was measured by two point probe (Keithley-2400). The resistance decrease with increasing Gd concentration up to 2 at.% and it increased for further increase Gd concentrations.

scholarly journals Effect of the Incorporation of Titanium on the Optical Properties of ZnO Thin Films: From Doping to Mixed Oxide Formation

2018 ◽  
Author(s):  
Miriam Yuste ◽  
Ramon Escobar-Galindo ◽  
Noelia Benito ◽  
Carlos Palacio ◽  
Oscar Martinez ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Mixed Oxides ◽  
Energy Gap ◽  
Amorphous Structure ◽  
Zno Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
Wide Range ◽  
Ti Content

ZnO films with Ti atoms incorporated (TZO) in a wide range (0-18 at. %) have been grown by reactive co-sputtering on silicon and glass substrates. The influence of the titanium incorporation in the ZnO matrix on the structural and optical characteristics of the samples has been determined by Rutherford backscattering spectroscopy (RBS), X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD). The results indicate that the samples with low Ti content (&lt; 4 at. %) exhibit the wurtzite-like structure, with the Ti+4 ions substitutionally incorporated into the ZnO structure, forming Ti-doped ZnO films. In particular, very low concentration of Ti (&lt;0.9 at. %) leads to a significant increase of the crystallinity of the TZO samples. Higher Ti contents give rise to a progressive amorphization of the wurtzite-like structure so samples with high Ti content (&ge;18at. %), displays an amorphous structure indicating the XPS analysis a predominance of Ti-O-Zn mixed oxides. The energy gap, obtained from absorption spectrophotometry, increases from 3.2 eV for pure ZnO films to 3.6 eV for those with the highest Ti content. Ti incorporation in the ZnO samples below 0.9 at. % rises both, the blue (380 nm) and green (550 nm) bands of the photoluminescence (PL) emission, thereby indicating a significant improvement of PL efficiency of the samples.

Luminescent Properties of Zn2SiO4:Eu3+,Dy3+ Phosphors via Sol-Gel Process

2012 ◽  
Vol 217-219 ◽  
pp. 733-736
Author(s):  
Xiu Mei Han ◽  
Shu Ai Hao ◽  
Ying Ling Wang ◽  
Gui Fang Sun ◽  
Xi Wei Qi
Keyword(s):  
Thermal Analysis ◽  
Ir Spectra ◽  
Sol Gel ◽  
Luminescent Properties ◽  
Photoluminescence Spectra ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sol Gel Process ◽  
Ft Ir

Zn2SiO4:Eu3+, Dy3+ phosphors have been prepared through the sol-gel process. X-ray diffraction (XRD), thermogravimetric and ddifferential thermal analysis (TG-DTA), FT-IR spectra and photoluminescence spectra were used to characterize the resulting phosphors. The results of XRD indicated that the phosphors crystallized completely at 1000oC. In Zn2SiO4:Eu3+,Dy3+ phosphors, the Eu3+ and Dy3+ show their characteristic red(613nm, 5D0-7F2), blue (481nm, 4F9/2–6H15/2) and yellow (577nm, 4F9/2–6H13/2) emissions.

Sol-Gel derived Bi4-xNdxTi3O12 Thin Films and Their Characterization

2002 ◽  
Vol 737 ◽  
Author(s):  
R.E. Melgarejo ◽  
M.S. Tomar ◽  
A. Hidalgo ◽  
R.S. Katiyar
Keyword(s):  
Thin Films ◽  
Spin Coating ◽  
Bismuth Titanate ◽  
Sol Gel ◽  
X Ray Diffraction ◽  
X Ray ◽  
Complete Solid Solution ◽  
Sol Gel Process ◽  
Ferroelectric Memory ◽  
Initial Results

ABSTRACTNd substituted bismuth titanate Bi4-xNdxTi3O12 were synthesized by sol-gel process and thin films were deposited on Pt substrate (Pt/TiO2/SiO2/Si) by spin coating. Thin films, characterized by X-ray diffraction and Raman spectroscopy, shows complete solid solution up to the composition x < 1. Initial results indicate that the ferroelectric polarization increases with increasing Nd content in the film with 2Pr = 50μC/cm2 for x = 0.46, which may have application in non-volatile ferroelectric memory devices.

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