Analysis of Lead in SnAg Based Solders Using X-Ray Fluorescence

2013 ◽  
Vol 752 ◽  
pp. 37-41
Author(s):  
Dániel Koncz-Horváth ◽  
Zoltán Gácsi

This paper reports the results of ED-XRF method for the determination of low-level contaminated solders. The method was calibrated for the analysis of part-per-million (ppm) levels of Pb and major levels of other elements. In this work, two types of Sn-Ag based solder alloys are used; the ternary Sn-3.0wt%Ag-0.5wt%Cu (SAC305) and the 6-part Sn-3.5wt%Ag-3.2wt%Bi-1.6wt%Sb-0.5wt%Cu-0.15wt%Ni were examined. Empirical calibration and fundamental parameter calibration were used to analyze samples. The results of this study demonstrate the differences between the applied calibration methods for detection of Pb. Screening analysis of bulk samples from variant production lines were also discussed.

2010 ◽  
Vol 66 (6) ◽  
pp. 579-584 ◽  
Author(s):  
Kevin Robertson ◽  
David Bish

X-ray powder diffraction (XRD) data were used to solve the crystal structures of phases in the magnesium perchlorate hydrate system, Mg(ClO4)2·nH2O (n = 4, 2). A heating stage and humidity generator interfaced to an environmental cell enabled in-situ XRD analyses of dehydration reactions under controlled temperatures and partial pressures of H2O (P_{{\rm H}_2{\rm O}}). The crystal structures were determined using an ab initio charge-flipping method and were refined using fundamental-parameter Rietveld methods. Dehydration of magnesium perchlorate hexahydrate to tetrahydrate (348 K) results in a decrease in symmetry (space group = C2), where isolated Mg2+ cations are equatorially coordinated by four H2O molecules with two [ClO4]− tetrahedra at the apices. Further dehydration to the dihydrate (423 K) leads to bridging of the isolated packets to form double corner-sharing chains of octahedra and polyhedra (space group = C2/m).


1993 ◽  
Vol 37 ◽  
pp. 689-696 ◽  
Author(s):  
I. Szalóki ◽  
B. Magyar

Several calibration methods and empirical formulae have been developed so far for analyzing materials quantitatively in XRF spectrometry. Many of them require reference samples to determine the relationship between the characteristic intensities of the elements and their concentrations. In order to eliminate empirical and semiempirical procedures, the fundamental parameter method (FPM) has been developed, which is one of the most helpful evaluating tools in quantitative XRF analysis. Some interpretations of this approach have the advantage that no standard samples are needed. The simultaneous application of FPM and polychromatic excitation demand an exact mathematical description of the primary spectral distribution as well as the efficiency function of the detector system.


1973 ◽  
Vol 27 (6) ◽  
pp. 450-453 ◽  
Author(s):  
J. E. Pearson

The x-ray spectrum emitted from a tritided erbium film as a result of the beta decay is used to determine areal density and tritium content of the film. A Si (Li) detector and a dedicated minicomputer are used for detection, acquisition, and data reduction. The technique is suitable for areal densities of erbium from 0.01 mg/cm2 to as high as 10 mg/cm2. The occluded tritium can be measured from less than one to several hundred microliters. Precision is generally determined by counting errors and is typically less than 1% for a 5-min count while accuracy depends upon the empirical calibration technique.


1982 ◽  
Vol 36 (1) ◽  
pp. 19-22 ◽  
Author(s):  
J. A. Keenan ◽  
D. Holmes

The computer program NRLXRF has been applied to the determination of minor and trace constituents in aluminum alloys and several National Bureau of Standards certified standard reference materials. Limitations arising from energy dispersive x-ray analysis and the fundamental-parameter method used by NRLXRF are illustrated.


2018 ◽  
Vol 72 (11) ◽  
pp. 1661-1673 ◽  
Author(s):  
Karen Daly ◽  
Anna Fenelon

Conventional methods for the determination of major nutrients and trace elements in grass rely on acid digestion followed by analysis using inductively coupled plasma optical emission spectrometry (ICP-OES), which can be both time consuming and costly. Energy dispersive X-ray fluorescence (EDXRF) spectrometry offers a rapid alternative that can determine multiple elements in a single scan. Copper, Mn, Zn, and S in grass samples were determined using EDXRF with a number of different calibration approaches using both empirical standards and the theoretical relationships between concentrations and intensities. Using an existing archive of 467 grass samples of known concentrations, a suite of 30 samples was selected as empirical grass standards to build a calibration set between sample concentrations and EDXRF intensities. The theoretical or standardless approach used the fundamental parameters method to determine element concentrations. To validate the two calibration methods, 59 samples were randomly selected from the same archive and database and analyzed by EDXRF. The measurements of Cu, Mn, Zn, and S were compared with the ICP-OES values using agreement statistics. An excellent correlation was observed between the concentrations determined by EDXRF and ICP-OES ( R > 0.90) regardless of the calibration approach. However, agreement and closeness to the true value varied and were assessed using agreement statistics. Across all elements, the empirically calibrated samples were in excellent agreement with the values determined by ICP-OES. The theoretical calibrations provided excellent agreement for Mn and Zn, but a degree of fixed and proportional bias was observed in the Cu and S values. Fixed bias was corrected by subtracting the computed bias from the EDXRF concentrations and improved the overall agreement. Similarly, proportional bias was corrected using the linear regression model to predict the corrected EDXRF values. This improved the overall agreement with the ICP-OES values for both Cu and S using corrected fundamental parameters calibrations. This study provides a practical basis for the use of EDXRF to determine Cu, Mn, Zn, and S in grass samples to monitor forage quality in grazed systems without the need for sample digestion. The observed fixed and proportional bias in the theoretical calibrations can be corrected provided that a good correlation exists between EDXRF and conventional methods.


1986 ◽  
Vol 30 ◽  
pp. 97-104 ◽  
Author(s):  
Michael Mantler

The fundamental-parameter technique is an important tool for quantitative x-ray chemical analysis and is routinely applied for the quantification of bulk specimens and single layer films. A method extending it to multiple film layers has recently been introduced by Mantler and results from such applications have been reported by Huang and Parrish. In addition, fundamental-parameter methods can be employed to predict intensity ratios of fluorescent lines as well as the spectral distribution of radiation scattered by the specimen (shape of the background in the vicinity of emission, lines). This is useful for accurate quantitative analysis in the case of a poor peak-to-background ratio, where the precise determination of net intensities is difficult.


Sign in / Sign up

Export Citation Format

Share Document