EBSD Analysis of SmCoFeCuZr Alloys

2016 ◽  
Vol 869 ◽  
pp. 608-613
Author(s):  
Sergio Antonio Romero ◽  
Christien G. Hauegen ◽  
Fernando J.G. Landgraf ◽  
Marcos Flavio de Campos
Keyword(s):  
Texture Analysis ◽  
Crystalline Structure ◽  
Ebsd Analysis ◽  
Phase Identification ◽  
X Ray Diffraction ◽  
Complementary Technique ◽  
X Ray ◽  
Kikuchi Lines

In the present study, EBSD was used for the characterization of alloys used for production of SmFeCoCuZr magnets. EBSD is adequate for texture analysis, but may give misleading results for phase identification. EBSD is not suitable for identifying phases with very similar crystalline structure, especially when the phases are crystallographically coherent, due to the superposition of Kikuchi lines. As consequence, for phase identification EBSD should be considered a complementary technique to other methods, as for example x-ray diffraction (XRD).

EM of hot-dip zinc-iron (galvannealed) coatings

1990 ◽  
Vol 48 (4) ◽  
pp. 1036-1037
Author(s):  
J.D.L 'Ecuyer ◽  
M. Gagné ◽  
C.C. Cheng ◽  
G.L. 'Espérance
Keyword(s):  
Automotive Industry ◽  
Phase Identification ◽  
X Ray Diffraction ◽  
Steel Product ◽  
X Ray ◽  
Steel Sheets ◽  
Coating Microstructure ◽  
The Individual ◽  
Zinc Coatings

Galvannealed coatings have superior weldability and paintability characteristics than conventional zinc coatings. As a result, the market for galvannealed steel sheets is steadily increasing especially in the automotive industry. The formation of the brittle intermetallic Zn-Fe phases, Γ, Γ1, δ, and Z also affects the for- mability properties of the coated steel product. In order to minimize powdering and flaking, the microstructure of the coating must be closely controlled.The characterization of the galvannealed coating microstructure is essential but has proven to be quite difficult. The individual phases cannot be resolved using optical microscopy. X-ray diffraction appears promising, however some of the intermetallic phases are too thin to produce a detectable signal. Electrochemical stripping has been used, but phase identification is ambiguous. Direct observation of the phases using electron microscopy appears to be the best method for characterizing these coatings.

Preparation and Characterization of Kenaf and Oil Palm Nanocellulose by Acid Hydrolysis Method

2020 ◽  
Vol 1010 ◽  
pp. 495-500
Author(s):  
Nurfarah Aini Mocktar ◽  
Mohammad Khairul Azhar Abdul Razab ◽  
An'amt Mohamed Noor ◽  
Nor Hakimin Abdullah
Keyword(s):  
Surface Morphology ◽  
Acid Hydrolysis ◽  
Oil Palm ◽  
Crystallinity Index ◽  
Phase Identification ◽  
X Ray Diffraction ◽  
X Ray ◽  
Hydrolysis Method ◽  
High Degree

Acid hydrolysis method become one of the attention among researcher to produce high degree nanocellulose. Integration of sonication process was used to stir and mix particles in an element for different stages. This paper revealed the surface morphology and crystallinity index of two organic plant that were kenaf and oil palm nanocellulose. Characterization of the nanocellulose were identified by 2 techniques; (1) field emission scanning electron microscope (FESEM) that provides surface morphology and elemental information of the element, (2) x-ray diffraction (XRD) for phase identification of materials crystallinity. The result showed that the properties of nanocellulose increase after sonication method have been integrated.

Preparation and characterization of a novel solid solution of aluminum in tungsten carbide by mechanically activated high-temperature reaction

2006 ◽  
Vol 21 (7) ◽  
pp. 1700-1703 ◽  
Author(s):  
Junmin Yan ◽  
Xianfeng Ma ◽  
Wei Zhao ◽  
Huaguo Tang ◽  
Changjun Zhu ◽  
...  
Keyword(s):  
Solid Solution ◽  
High Temperature ◽  
Substitutional Solid Solution ◽  
Phase Identification ◽  
Temperature Reaction ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cell Parameters ◽  
High Temperature Reaction

In this work, a novel substitutional solid solution (W0.8Al0.2)C was synthesized by mechanically activated high-temperature reaction. X-ray diffraction was used for phase identification during the whole reaction process. Environment scanning electronic microscopy–field emission gun and energy dispersive x-ray were used to investigate the microstructure and the quantitative material composition of the specimen. (W0.8Al0.2)C was found to crystallize in the WC-type, and the cell parameters were a = 2.907(1) Å and c = 2.837(1) Å. The hardness of (W0.8Al0.2)C was tested to be 19.3 ± 1 GPa, and the density was 13.19 ± 0.05 g cm−3.

X-ray diffraction characterization of MOVPE ZnSe films deposited on (100) GaAs using conventional and high-resolution diffractometers

2009 ◽  
Vol 24 (2) ◽  
pp. 78-81 ◽  
Author(s):  
T. N. Blanton ◽  
C. L. Barnes ◽  
M. Holland ◽  
K. B. Kahen ◽  
S. K. Gupta ◽  
...  
Keyword(s):  
High Resolution ◽  
Phase Identification ◽  
Pin Diode ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Sample Throughput ◽  
Gaas Substrates ◽  
Deposition Parameters

ZnSe-based heterostructures grown on GaAs substrates have been investigated for use in pin-diode LED applications. In this study, a conventional Bragg-Brentano diffractometer (BBD) has been used to screen samples for phase identification, crystallite size, presence of polycrystalline ZnSe, and initial rocking curve (RC) analysis. A limitation of the conventional diffractometer is that the smallest RC full width at half maximum (FWHM) that can be achieved is 500 to 600 arc sec. As deposition parameters are optimized and the RC limit of the conventional diffractometer is reached, analysis is moved to a four-bounce high-resolution diffractometer (HRD). Although more time for analysis is required, using the HRD has a RC resolution advantage, where RCs of <20 arc sec are obtained for neat GaAs wafers. Combining the BBD and HRD instruments for analysis of ZnSe films grown on GaAs substrates allows for an efficient means of high sample throughput combined with an accurate measurement of film alignment.

Crystallinity Studies of GaN/Si Films Grown by MOCVD at Various Substrate Temperatures Using XRD

2006 ◽  
Vol 517 ◽  
pp. 69-72
Author(s):  
Sha Shiong Ng ◽  
Hassan Zainuriah ◽  
Abu Hassan Haslan ◽  
M.E. Kordesch
Keyword(s):  
Crystalline Structure ◽  
Growth Temperature ◽  
Structure Type ◽  
X Ray Diffraction ◽  
General Picture ◽  
X Ray ◽  
Si Films ◽  
Substrate Temperatures ◽  
Deposited Films

In this paper, we report on the characterization of a set of MOCVD grown GaN samples with a variety of structural or crystalline quality. X-ray diffraction (XRD) was used to observe the change of the crystalline structure with deposition temperature. All results show that the structure type of the GaN deposited films is sensitive to the growth temperature. Our results also revealed that a good crystalline structure of GaN films could be grown at temperatures higher than 600°C. Finally, a general picture on the correlations between the growth temperature and the GaN deposited films crystalline is reported.

scholarly journals The Characterization Of Cast Fe-Cr-C Alloy

2015 ◽  
Vol 60 (2) ◽  
pp. 779-782 ◽  
Author(s):  
K. Wieczerzak ◽  
P. Bała ◽  
M. Stępień ◽  
G. Cios ◽  
T. Kozieł
Keyword(s):  
Volume Fraction ◽  
Microstructural Characterization ◽  
High Volume ◽  
Phase Identification ◽  
Arc Furnace ◽  
X Ray Diffraction ◽  
Cast State ◽  
X Ray ◽  
Average Hardness

AbstractThe paper presents the results of the characterization of alloy from Fe-Cr-C (carbon content 0.79 wt.%) system including the microstructure, phase analysis, morphology and hardness in as cast state. The chemical composition was designed to create chromium-rich ferritic matrix with high volume fraction of carbides in form of interdendritic eutectics. The research was carried out on the cross section of the ingot, synthesized in an arc furnace under high purity argon atmosphere and crystallized on water-cooled copper mould. Microstructural characterization was carried out by light microscopy and scanning electron microscopy (SEM). Phase identification was performed by X-Ray diffraction (XRD). The microstructure of the investigated alloy is composed of primary and secondary dendrites Fe-Cr solid solution and complex M23C6and M7C3carbides in interdendritic areas. Segregation of Cr and C during crystallization causes precipitation of M7C3carbides. The average hardness of the alloy is 205±12 HV10.

Complex XRD and XRF Characterization of TiN-TiCN-TiC Surface Coatings for Medical Applications

2014 ◽  
Vol 225 ◽  
pp. 159-168 ◽  
Author(s):  
Katarzyna Banaszek ◽  
Bartłomiej Januszewicz ◽  
Emilia Wołowiec ◽  
Leszek Klimek
Keyword(s):  
Diffraction Method ◽  
Fiber Texture ◽  
Surface Coatings ◽  
Phase Identification ◽  
X Ray Diffraction ◽  
Joint Replacements ◽  
X Ray ◽  
Compressive Stresses ◽  
Careful Preparation

Article presents results of measurements of vital parameters of PVD coatings of potential application in medicine (joint replacements or medical tools). The phase identification, level of residual stresses and texture were determined for various coatings by X-ray diffraction method. Chemical composition of coatings was verified by means of XRF. A set of measurements reveled the existence of advantageous compressive stresses in coatings, the texture determination showed undesirable fiber texture in TiN coating and advantageous uniformity of TiCN ones. XRF analysis pointed out the necessity of careful preparation of samples during PVD process during which phenomena of inhomogeneity in chemical can be present as it is presented in the paper.

ZnO1-xTexthin films deposited by reactive magnetron co-sputtering: composition, structure and optical properties

MRS Advances ◽  
2017 ◽  
Vol 2 (53) ◽  
pp. 3111-3116
Author(s):  
O. Sánchez ◽  
A. Climent ◽  
M. Fernández Barcia ◽  
O. Martínez Sacristán ◽  
M. Hernández-Vélez
Keyword(s):  
Crystalline Structure ◽  
Broad Band ◽  
Zno Films ◽  
Reactive Magnetron ◽  
X Ray Diffraction ◽  
Atomic Concentration ◽  
X Ray ◽  
Cathode Substrate ◽  
Composition Structure

ABSTRACTZnO1-xTexthin films were deposited by DC reactive magnetron co-sputtering using pure Zn and Te targets. Te atomic concentration in the films ranged from x=0 to 0.33 by adjusting the applied power on the targets or varying the cathode-substrate distance. Chemical composition and crystalline structure were determined by RBS experiments and X-ray Diffraction, respectively. For low Te atomic concentrations (x≤0.04) the deposited ZnO1-xTexfilms showed a crystalline structure ZnO wurtzite type however, for increasing Te concentration significant broadening and decreasing intensities of the main peaks belonging to pure ZnO films together with some weak peaks characteristic of crystalline Trizinc Tellurate salt have appeared. For the highest x values some non-identified weak peaks beside to some others peaks corresponding to the crystalline phases mentioned above as well as, a broad band probably associated to amorphous TeO2phase were observed. A preliminary optical characterization of the samples point out the possibility of different electronic transitions within the ZnO band gap.

X-ray Diffraction Analysis of High Tc Superconducting Thin Films

1988 ◽  
Vol 32 ◽  
pp. 269-278
Author(s):  
T. C. Huang ◽  
A. Segmuller ◽  
W. Lee ◽  
V. Lee ◽  
D. Bullock ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Analysis ◽  
Powder Diffraction ◽  
Grazing Incidence ◽  
Structure Characterization ◽  
Phase Identification ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bulk Superconductors

AbstractX-ray diffraction techniques have been used for the structure characterization of Y-Ba-Cu-O and Tl-Ca-Ba-Cu-O thin films. A powder diffraction analysis of Y-Ba-Cu-O films showed that the films deposited at 650°C on Si are polycrystalline and have an orthorhambic structure similar to that of the YBa2Cu3O7 bulk superconductors. In addition to the conventional powder diffraction technique, both the rocking curve and the grazing incidence diffraction methods were used to characterize a YBa2Cu3O7 film on (110) SrTiO3 substrate. Results showed that the film was epitaxially grown and aligned with its substrate in a true epitaxy. Phase identification and line broadening analyses of Tl-Ca-Ba-Cu-O films showed that the films are comprised of one or more superconducting phases and probably contain stacking faults.

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