scholarly journals Preparation and Characterisation of Metallorganic Precursors Derived Iron Oxides on Porous Silicon Layers

2020 ◽  
Vol 995 ◽  
pp. 63-68
Author(s):  
Sivakumar Balakrishnan ◽  
Yurii K. Gun’ko ◽  
Gerhard F. Swiegers ◽  
Tatiana S. Perova
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Magnetic Nanoparticles ◽  
Porous Silicon ◽  
Iron Oxides ◽  
Silicon Surface ◽  
Scientific Community ◽  
Magnetic Measurements ◽  
Chemical Functionalization ◽  
Scanning Electron

Porous silicon has generated interest in scientific community after its photoluminescence discovery and thereafter, research was focused on to the chemical functionalization of silicon and subsequent anchoring of nanoparticles onto silicon surface. In the present work, the porous silicon has been effectively modified with magnetic nanoparticles which were prepared through metallorganic approach. The as-fabricated magnetic-porous silicon composites were characterised using FTIR and Raman spectroscopies, Scanning Electron Microscopy (SEM) as well as magnetic measurements.

STUDY OF Y-Ba-Cu-O SUPERCONDUCTORS PREPARED WITH THE OXALATE PRECIPITATION/EVAPORATION METHOD

1990 ◽  
Vol 04 (19) ◽  
pp. 1237-1244 ◽  
Author(s):  
TH. LEVENTOURI ◽  
E. LIAROKAPIS ◽  
L. MARTINEZ ◽  
F.D. MEDINA ◽  
M. MORENO ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Raman Spectroscopy ◽  
Magnetic Measurements ◽  
Preparation Procedure ◽  
X Rays ◽  
Evaporation Method ◽  
Preparation Conditions ◽  
Oxalate Precipitation ◽  
Scanning Electron

A study is presented on a series of Y-Ba-Cu-O superconductors prepared with the Oxalate Precipitation/Evaporation method. The effect of the preparation conditions on the properties of these superconductors has been studied with X-rays, scanning electron microscopy, Raman spectroscopy, and magnetic measurements. The experiments show that good quality superconductors can be fabricated with this preparation procedure and also indicate that the properties of these materials are very sensitive to the preparation conditions.

Synthesis of Fe2O3/CNTs for the Fast Removal of Tetracycline from Aqueous Solutions

2014 ◽  
Vol 915-916 ◽  
pp. 933-941 ◽  
Author(s):  
Zhong Jie Zhang ◽  
Chang Yu Lu ◽  
Wei Huang ◽  
Wei Sheng Guan ◽  
Yue Xin Peng
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Magnetic Measurements ◽  
Ferrite Nanoparticles ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Wide Range ◽  
Fast Removal ◽  
Scanning Electron

The effective remove to tetracycline still remains a big challenge for scientists. In this work, we used a new method for preparing functional magnetic CNTS with ferrite nanoparticles. A wide range of techniques, such as X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), and magnetic measurements were applied to characterize the obtained Fe2O3/CNTs. Moreover, we have also studied the properties of adsorbent to tetracycline. In addition, we have found that the Fe2O3/CNTs are better reusable adsorbent than other traditional adsorbents by magnetic separation recycling method.

AFM Integrated with SEM and FIB: A Synergistic Union

2013 ◽  
Vol 21 (6) ◽  
pp. 26-31
Author(s):  
Aaron Lewis ◽  
A. Komissar ◽  
A. Ignatov ◽  
Oleg Fedoroyov ◽  
E. Maayan ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Research And Development ◽  
Scientific Community ◽  
Ion Beam ◽  
Basic Research ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scanning Electron

Scanning electron microscopy (SEM) and ion beam milling techniques are mature nanoscale measurement technologies, whereas atomic force microscopy (AFM) is a developing technology generating intense interest in the scientific community for basic research and development. These techniques have generally existed in separate worlds. This article discusses a capability that marries these technologies through an instrument recently introduced by Nanonics, the 3TB4000.

Synthesis of Nanophase Noble Metal Systems Utilizing Porous Silicon

1996 ◽  
Vol 457 ◽  
Author(s):  
I. Coulthard ◽  
T. K. Sham
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Porous Silicon ◽  
Noble Metal ◽  
Photoelectron Spectroscopy ◽  
Room Temperature ◽  
Visible Range ◽  
X Ray ◽  
Metallic Salt ◽  
Scanning Electron

ABSTRACTApart from its well known ability to luminesce very intensely at room temperature in the visible range, porous silicon is also an effective reducing agent. We report the formation of several noble metal (Pd, Ag, Au, Pt) nanostructures by reductive dispersion of metal ions from aqueous solutions onto the surface of porous silicon. The nanophase systems produced by reductive deposition vary with the element deposited and the metallic salt utilized in the process. The resulting nanophase systems were studied using a variety of techniques including: scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), and spectroscopie methods using synchrotron radiation.

scholarly journals Effect of Zinc Oxide on the Efficiency Enhancement of Al/Li2O/PSi/Si/Al solar cell

2021 ◽  
Author(s):  
Shahlaa M. Abd Al-Hussan ◽  
Nabeel A. Bakr ◽  
Ahmed N. Abd
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Zinc Oxide ◽  
Porous Silicon ◽  
Lithium Oxide ◽  
Precipitation Method ◽  
Oxide Nanoparticles ◽  
Casting Method ◽  
P Type ◽  
Scanning Electron

Abstract In this paper, electrochemical etching of the p-type silicon wafer is used to prepare p-type porous silicon with current density of 10 mA.cm− 2 for 10 minutes. Field Emission Scanning Electron Microscopy (FESEM) has been used to study porous silicon layer surface morphology. Zinc oxide and lithium oxide nanoparticles are prepared separately by chemical precipitation method and simple precipitation method, respectively and deposited on glass substrates by drop casting method. Moreover,, the structural properties of the films were analyzed by using XRD and SEM. The XRD results showed that the ZnO and Li2O films are polycrystalline with hexagonal wurtzite structure and cubic structure, and preferred orientation along (101) and (003) planes, respectively. Using Scherrer's formula, the crystallite size was measured and it was found that ZnO and Li2O thin films have a crystallite size of 22.04 and 45.6 nm respectively. Surface topography of the prepared thin films is studied by using Scanning Electron Microscopy (SEM). Later, certain proportions of both materials were mixed and deposited on porous silicon using drop casting method at thickness of 1.4 µm. After that, the characteristics of the solar cell were investigated. Mixing zinc oxide nanoparticles in particular proportions with lithium oxide played a major role in increasing the solar cell's performance. The highest prepared film efficiency was obtained at mixing ratio (0.5: 0.5) for (ZnO: Li2O) and its value was (11.09 %).

Magnetic and Structural Properties of Nanocomposite ZnO-Fe3O4 Films Prepared by Solid-State Synthesis

2014 ◽  
Vol 215 ◽  
pp. 158-162
Author(s):  
Liudmila E. Bykova ◽  
V.G. Myagkov ◽  
I.A. Tambasov ◽  
O.A. Bayukov ◽  
Victor S. Zhigalov ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Solid State ◽  
Photoelectron Spectroscopy ◽  
Magnetic Measurements ◽  
X Ray Diffraction ◽  
Simple Method ◽  
Physical Methods ◽  
X Ray ◽  
Scanning Electron

A simple method for obtaining ZnO-Fe3O4 nanocomposites using solid-state reaction Zn + 3Fe2O3 ZnO + 2Fe3O4 is suggested. An analysis of the characteristics and properties of ZnO-Fe3O4 nanocomposites was carried out by a combination of structural and physical methods (X-ray diffraction, scanning electron microscopy, photoelectron spectroscopy, Mössbauer measurements, X-ray fluorescent analysis, and magnetic measurements). The magnetization of the hybrid ZnO-Fe3O4 films is equal to 440 emu/cm3. The resulting Fe3O4 nanoparticles are surrounded by a ZnO shell and have sizes ranging between 20 and 40 nm.

Cathodoluminescence and writing of optical patterns on porous silicon by scanning electron microscopy

1996 ◽  
Vol 68 (17) ◽  
pp. 2378-2379 ◽  
Author(s):  
A. Bruska ◽  
A. Chernook ◽  
St. Schulze ◽  
M. Hietschold
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Porous Silicon ◽  
Scanning Electron
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