Void Formation and Bond Strength Investigated for Wafer-Level Cu-Sn Solid-Liquid Interdiffusion (SLID) Bonding

2014 ◽  
Vol 11 (1) ◽  
pp. 1-6
Author(s):  
Astrid-Sofie B. Vardøy ◽  
H. J. van de Wiel ◽  
Stian Martinsen ◽  
Greg R. Hayes ◽  
Hartmut R. Fischer ◽  
...  

Hermetic wafer-level Cu-Sn solid-liquid interdiffusion (SLID) bonding was investigated to explore the sensitivity of selected process parameters with regard to voiding and possible reduction of strength. Little or no variation was observed in the void density as a result of modifying the plated Sn thickness, the storage time between plating and bonding, the bonding tool pressure, or the thermal budget during bonding. All shear tested samples showed excellent shear strength, with an average value within 110–164 MPa. Some statistically significant differences in shear strength were found due to the variations of the process parameters. However, the differences were too small to be critical for the application. Analysis of fracture surfaces showed that the shear strengths in the lower range corresponded to fracture between the adhesion layer (TiW) and the silicon cap, while shear strengths in the higher range corresponded to fracture in the Cu3Sn formed during the bonding. The results indicate that the investigated bonding process is robust with regard to the studied process parameters.

2013 ◽  
Vol 2013 (1) ◽  
pp. 000717-000722
Author(s):  
Astrid-Sofie B. Vardøy ◽  
H.J. van de Wiel ◽  
Stian Martinsen ◽  
Greg R. Hayes ◽  
Hartmut R. Fischer ◽  
...  

A hermetic wafer-level Cu-Sn solid-liquid interdiffusion (SLID) bonding was investigated to explore the sensitivity of selected process parameters with regard to voiding and possible reduction of strength. Little or no variation was observed in the void density as a result of modifying the plated Sn-thickness, the storage time between plating and bonding, the bonding tool pressure, or the thermal budget during bonding. All shear tested samples showed excellent shear strength, with an average of 110 - 164 MPa. Some statistically significant differences in shear strength were found between the varied process parameters. However, the differences were too small to be critical for the application. Analysis of fracture surfaces showed that shear strengths in the lower range corresponded to fracture between the adhesion layer (TiW) and the silicon cap, while shear strengths in the higher range corresponded to fracture in the Cu3Sn formed during the bonding. The results indicate that the bonding process is robust with regard to the studied process parameters.


Author(s):  
Hwa-Teng Lee ◽  
Ching-Yuan Ho ◽  
Chao Chin Lee

Abstract Effects of Ag content (0 ~ 3 wt.%) in Sn-xAgCu0.7 solders on microstructure characteristics and low cycling fatigue at different temperature conditions are overall investigated. To increase Ag content, the solidus point 228.8 ? of Sn-Cu0.7 gradually decreases to 218.5 ? and temperature range of solid-liquid coexistence phase is also decrease. The Sn-Cu0.7 matrix consisted of small particles of Cu6Sn5 within ß-Sn equiaxial grains and did not significantly influence solder hardness. Moreover, much intermetallic compound of plate-like Ag3Sn and rod-like Cu6Sn5 existed in Sn-xAgCu0.7 solders enables to enhance the hardness due to dense network of Ag3Sn precipitation and near eutectic point. As a result of plastic displacement decreases with higher Ag additions, better fatigue lifetime could be achieved at Ag content to 1.5 wt.%. Besides, crack stemmed from thicker IMC layer in Sn-3.0Ag-Cu0.7 solder interface will decrease fatigue performance especially for 80 ? and 120 ?.


2021 ◽  
Vol 116 ◽  
pp. 78-85
Author(s):  
Aneta Gumowska ◽  
Grzegorz Kowaluk

The quality of the wood bonding depending on the method of applying the selected thermoplastic biopolymers. The aim of the research was to determine the effect of the method of applying the biopolymer on the surface of bonding solid wood elements on the quality of the obtained adhesive connection. The results of conducted mechanical research show that the highest average value of shear strength was observed for birch lamellas bonded with PLA, both with the first and second method of application. In case of estimating the quality of the bonding of wooden elements, better results were achieved for PLA and the second method of application the "green" adhesive.


2002 ◽  
Vol 729 ◽  
Author(s):  
Lauren E. S. Rohwer ◽  
Andrew D. Oliver ◽  
Melissa V. Collins

AbstractA wafer level packaging technique that involves anodic bonding of Pyrex wafers to released surface micromachined wafers is demonstrated. Besides providing a hermetic seal, this technique allows full wafer release, provides protection during die separation, and offers the possibility of integration with optoelectronic devices. Anodic bonding was performed under applied voltages up to 1000 V, and temperatures ranging from 280 to 400°C under vacuum (10-4Torr). The quality of the bonded interfaces was evaluated using shear strength testing and leak testing. The shear strength of Pyrex-to-polysilicon and aluminum bonds was ∼10-15 MPa. The functionality of surface micromachined polysilicon devices was tested before and after anodic bonding. 100% of thermal actuators, 94% of torsional ratcheting actuators, and 70% of microengines functioned after bonding. The 70% yield was calculated from a test sample of 25 devices.


Author(s):  
Santi Pumkrachang

The ultraviolet (UV) curing of slider-suspension attachment is going to change from a manual to an automated process. As a result, the bonding parameters of adhesive between slider and suspension needs to be optimized. This paper aims to study two output responses of the UV curable epoxy adhesive i.e., shear strength force and pitch static attitude (PSA) of the joint between slider and suspension in a head gimbal assembly (HGA). Four process parameters were investigated using response surface methodology (RSM) based on face-centered central composite design (FCCD). The RSM was applied to establish a mathematical model to correlate the significance of process parameters and the responses. Then the based multi-objective was applied to determine a quadratic model and obtained the output maximization at 224 g of shear strength force and PSA value close to the target at 1.8 degrees. The input process parameters were optimized at 0.7 s of UV bottom cure time, 120 °C of UV dual side temperature, 5.0 s of UV dual side cure time, and 230 μm of adhesive dot size. The validation experiment showed a prediction response error of less than 7% of the actual value.


2017 ◽  
Vol 2017 (1) ◽  
pp. 000569-000575 ◽  
Author(s):  
André Cardoso ◽  
Raquel Pinto ◽  
Elisabete Fernandes ◽  
Steffen Kroehnert

Abstract Due to its versatility for high density, heterogeneous integration, Wafer Level Fan Out (WLFO) packaging has recently seen a tremendous growth in a broad array of applications, from telecommunications and automotive, to optical and environmental sensing, while addressing the challenges of the next big wave of the Internet of Things (IoT). In this context, WLFO is continuously being challenged to include new families of MEMS/NEMS/MOEMS sensors, low thermal budget devices and biochips with microfluidics for biomedical applications. Recent developments in WLFO technology by NANIUM [1] demonstrated the implementation of a keep-out-zone (KOZ) mechanism intended to 1st) protect sensitive sensor areas during the backend processing of WLFO wafers and 2nd) create open zones on the Re-Distribution Layers (RDL). This way, the KOZ mechanism provides a physical, direct path from the embedded device to the environment. This is a necessary feature for environment sensing (e.g., pressure) or to create optical paths free of dielectric and protected from the harsh chemistry steps of the WLFO process. This paper describes new developments on KOZ, implemented with SU-8 photoresist as a WLFO dielectric, whose application is a novelty in the WLFO platform. The use of SU-8 and the KOZ with it, addresses some gaps of the current WLFO technology towards the integration of chips with bio-sensitive areas and sensors with low thermal budget. Due to its well-known bio-compatibility and inert behavior, SU-8 can be used as a neutral dielectric to be in direct contact to target fluids (e.g., sera, blood). Also, due to its low curing temperature, SU-8 allows a very low temperature WLFO process and thus the embedding of temperature-limited devices that have been outside the WLFO realm, for example, magneto-resistive or magnetic-spin sensor chips, which degrades its performance above 160°C. More interestingly, SU-8 exhibits a particular non-conformal behavior, which creates very smooth surfaces even over the mildly rough mold compound area of a fan-out package. Adding to this, SU-8 is readily available in the market in a wide range of thicknesses, spanning from 0.5 μm to >100 μm, and further allowing multiple spin coatings to build thick layers. Thus, SU-8 can provide smooth and deep enough channels for microfluidic flow over the chip sensing areas and, at the same time, provide the necessary layer thickness discrimination for the KOZ mechanism. Combining these features, the SU-8 layers in WLFO can play the triple role of 1) RDL dielectric insulation, 2) KOZ mechanism and 3) embedded microfluidic channels as part of the RDL. In summary, besides the unprecedented use of SU-8 in WLFO packaging, KOZ implementation on SU-8 provides a true, attainable bridge between WLFO and integrated microfluidic applications, for biosensing and biomedical applications in general. Outlooking the potentialities of such a merge, a Fan-Out package can embed several chips interconnected by RDL lines, as it currently allows, and also connected by microfluidic channel for multi-point, multi-function biosensing, constituting a true Lab-on-Package, cost-effective solution. Instead of building all sensing areas and microfluidic channels over a large silicon (Si) chip, this solution builds the feed-in, feed-out areas of the microfluidic channel over the inexpensive fan-out area, minimizing the sensing chip area, with the consequent front-end cost reduction.


Materials ◽  
2020 ◽  
Vol 13 (17) ◽  
pp. 3770
Author(s):  
Olutayo Adegoke ◽  
Joel Andersson ◽  
Håkan Brodin ◽  
Robert Pederson

The manufacturing of parts from nickel-based superalloy Alloy 247LC by laser powder bed fusion (L-PBF) is challenging, primarily owing to the alloy’s susceptibility to cracks. Apart from the cracks, voids created during the L-PBF process should also be minimized to produce dense parts. In this study, samples of Alloy 247LC were manufactured by L-PBF, several of which could be produced with voids and crack density close to zero. A statistical design of experiments was used to evaluate the influence of the process parameters, namely laser power, scanning speed, and hatch distance (inherent to the volumetric energy density) on void formation, crack density, and microhardness of the samples. The window of process parameters, in which minimum voids and/or cracks were present, was predicted. It was shown that the void content increased steeply at a volumetric energy density threshold below 81 J/mm3. The crack density, on the other hand, increased steeply at a volumetric energy density threshold above 163 J/mm3. The microhardness displayed a relatively low value in three samples which displayed the lowest volumetric energy density and highest void content. It was also observed that two samples, which displayed the highest volumetric energy density and crack density, demonstrated a relatively high microhardness; which could be a vital evidence in future investigations to determine the fundamental mechanism of cracking. The laser power was concluded to be the strongest and statistically most significant process parameter that influenced void formation and microhardness. The interaction of laser power and hatch distance was the strongest and most significant factor that influenced the crack density.


2012 ◽  
Vol 445 ◽  
pp. 454-459 ◽  
Author(s):  
M.R. Nakhaei ◽  
N.B. Mostafa Arab ◽  
F. Kordestani

Laser welding of plastic materials has a wide range of applications in the packaging, medical, electronics and automobile industries provided it can predict high quality welds compared with other joining methods. Laser welding process parameters can affect the quality of welds. In this paper, Artificial Neural Network (ANN) is used to model the effects of laser power, welding speed, clamp pressure and stand-off distance on weld lap-shear strength in laser transmission welding (LTW) of acrylic (polymathy methacrylate). A set of experimental data on diode laser weld lap-shear strengths was used to train and test the ANN from which the neurons relations were gradually extracted to develop a model. The developed ANN model can be used for the analysis and prediction of the complex relationships between the above mentioned process parameters and weld lap-shear strength. The results indicated that increase in laser power and clamp pressure increases the weld lap-shear strength whereas welding speed and stand off distance had a decreasing affect on shear strength at high value.


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