Thick Film Process Characterization for Thin Film Metallized LTCC

2016 ◽  
Vol 13 (3) ◽  
pp. 136-142 ◽  
Author(s):  
M. A. Girardi ◽  
K. A. Peterson ◽  
P. T. Vianco

Low temperature cofired ceramic (LTCC) technology has proven to be invaluable in military/space electronics, wireless communication, microsystems, medical and automotive electronics, and sensors. The use of LTCC for high-frequency applications is appealing due to its low losses, design flexibility, and packaging and integration capability. The LTCC thick film process is summarized, including some unconventional process steps such as feature machining in the unfired state and thin film definition of outer layer conductors. The LTCC thick film process was characterized to optimize process yields by focusing on the following factors: (1) print location, (2) print thickness, (3) drying of tapes and panels, (4) shrinkage upon firing, and (5) via topography. Statistical methods were used to analyze critical process and product characteristics to achieve the optimization goal.

2016 ◽  
Vol 2016 (CICMT) ◽  
pp. 000142-000150 ◽  
Author(s):  
M. A. Girardi ◽  
K. A. Peterson ◽  
P. T. Vianco

Abstract Low temperature cofired ceramic (LTCC) technology has proven itself in military/space electronics, wireless communication, microsystems, medical and automotive electronics, and sensors. The use of LTCC for high frequency applications is appealing due to its low losses, design flexibility and packaging and integration capability. The LTCC thick film process is summarized including some unconventional process steps such as feature machining in the unfired state and thin film definition of outer layer conductors. The LTCC thick film process was characterized to optimize process yields by focusing on these factors: 1) Print location, 2) Print thickness, 3) Drying of tapes and panels, 4) Shrinkage upon firing, and 5) Via topography. Statistical methods were used to analyze critical process and product characteristics in the determination towards that optimization goal.


2000 ◽  
Vol 39 (Part 2, No. 12A) ◽  
pp. L1209-L1212 ◽  
Author(s):  
Yukiharu Uraoka ◽  
Tomoaki Hatayama ◽  
Takashi Fuyuki ◽  
Tetsuya Kawamura ◽  
Yuji Tsuchihashi

2019 ◽  
Vol 23 (3) ◽  
pp. 746-754
Author(s):  
Dinar Dilshatovich Fazullin ◽  
Gennady Vitalievich Mavrin ◽  
Vladislav Olegovich Dryakhlov ◽  
Ildar Gilmanovich Shaikhiev ◽  
Irek Rashatovich Nizameyev

1983 ◽  
Vol 10 (2-3) ◽  
pp. 81-85 ◽  
Author(s):  
S. Demolder ◽  
A. Van Calster ◽  
M. Vandendriessche

In this paper a sensitive measuring circuit is described for the measurement of current noise on high quality thin and thick film resistors. Measured data on resistors are presented and analysed.


2021 ◽  
Vol 138 ◽  
pp. 111241
Author(s):  
Boseon Yun ◽  
Tan Tan Bui ◽  
Paul Lee ◽  
Hayeong Jeong ◽  
Seung Beom Shin ◽  
...  

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