Sorption of cadmium on humic acid: Mechanistic and kinetic studies with atomic force microscopy and X-ray absorption fine structure spectroscopy

2001 ◽  
Vol 81 (3) ◽  
pp. 337-348 ◽  
Author(s):  
C. Liu ◽  
A I Frenkel ◽  
A. Vairavamurthy ◽  
P M Huang

Humic acids (HA) constitute a major fraction of the organic matter in soils and sediments. Little is known about the kinetics and mechanisms of Cd sorption by HAs, especially those pertaining to the surface features and structure of the Cd-humate complexes. We investigated Cd sorption by HA using the conventional batch method, N2-BET method, atomic force microscopy (AFM), and extended X-ray absorption fine structure (EXAFS) spectroscopy to gain a better understanding of the kinetics and mechanisms. Cadmium sorption by HA can be described by the parabolic diffusion equation. The increase in the apparent diffusion coefficient with an increase in the initial Cd concentration was less pronounced at higher initial Cd concentrations, apparently due to an enhancement in aggregation of the Cd-humate complexes. The HA before and after Cd sorption at Cd concentrations ≤ 10–6 M in different reaction times was spheroidal in shape. The Cd-humate complexes formed at 10–4 and 10–3 M Cd gradually changed to resemble the shape of a bean with increasing reaction time, thereby substantially decreasing their specific surface. Cadmium ions raveled the spheroidal HA particles into a bean-like structure by coordinating to six O atoms from the functional groups of HA, with a Cd-O distance of 2.297(2) Å. The Cd-O bond strength decreased with increasing initial Cd concentration. Key words: Cadmium, humate complexes, conformation, atomic force microscopy, EXAFS

2013 ◽  
Vol 28 (2) ◽  
pp. 68-71 ◽  
Author(s):  
Thomas N. Blanton ◽  
Debasis Majumdar

In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive.


2009 ◽  
Vol 610-613 ◽  
pp. 175-178 ◽  
Author(s):  
Namsrai Javkhlantugs ◽  
Enkhbaatar Ankhbayar ◽  
Khishigjargal Tegshjargal ◽  
Damdin Enkhjargal ◽  
Chimed Ganzorig

The morphological surface change of untreated and treated fibers of the Mongolian goat cashmere was investigated by atomic force microscopy (AFM) at ambient conditions. The cuticle scale heights of the Mongolian goat cashmere fibers were measured by the AFM for the fibers before and after treatment. The experimental results showed that the difference between the fine structure of the cuticle and surface roughness of untreated and treated fibers. We found that the surface morphological change of the cashmere fibers was strongly degraded after the bleaching process.


2000 ◽  
Vol 61 (15) ◽  
pp. 10383-10387 ◽  
Author(s):  
M. M. García ◽  
I. Jiménez ◽  
O. Sánchez ◽  
C. Gómez-Aleixandre ◽  
L. Vázquez

1998 ◽  
Vol 517 ◽  
Author(s):  
Simone Anders ◽  
Thomas Stammler ◽  
C. Singh Bhatia ◽  
Joachim Stöhr ◽  
Walton Fong ◽  
...  

AbstractX-ray Photo Emission Electron Microscopy (X-PEEM) and Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy were applied to study the properties of amorphous hard carbon overcoats on disks and sliders, and the properties of the lubricant. The modification of lubricants after performing thermal desorption studies was measured by NEXAFS, and the results are compared to thermal desorption data. The study of lubricant degradation in wear tracks is described. Sliders were investigated before and after wear test, and the modification of the slider coating as well as the transfer of lubricant to the slider was studied. The studies show that the lubricant is altered chemically during the wear. Fluorine is removed and carboxyl groups are formed.


Author(s):  
Z. Zhang ◽  
E. S. Yamaguchi ◽  
M. Kasrai ◽  
G. M. Bancroft

The growth and morphology of tribofilms, generated from zinc dialkyldithiophosphate (ZDDP) and an ashless dialkyldithiophosphate (DDP) over a wide range of rubbing times (10 seconds to 10 hours) and concentrations (0.1 to 5 wt % ZDDP), have been examined using atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), and X-ray absorption near edge structure (XANES) spectroscopy at the O, P and S K-edges, and the P, S, and Fe L-edges. The physical aspects of the growth and morphology of the tribofilms will be presented here (Part I) and the chemistry of the films will be discussed in (Part II).


2001 ◽  
Author(s):  
M. GIRASOLE ◽  
A. CRICENTI ◽  
A. CONGIU-CASTELLANO ◽  
A. MARCONI ◽  
C. DAVOLI ◽  
...  

2004 ◽  
Vol 19 (7) ◽  
pp. 2049-2056 ◽  
Author(s):  
K. Hänel ◽  
S. Söhnchen ◽  
S. Lukas ◽  
G. Beernink ◽  
A. Birkner ◽  
...  

The growth of the polycyclic aromatic hydrocarbon perylene on (110) oriented copper substrates has been studied by means of x-ray photoelectron spectroscopy, near-edge x-ray absorption spectroscopy, and atomic force microscopy. In the monolayer regime, the molecules are orientated with their molecular plane parallel to the substrate, whereas they adopt a tilted arrangement in multilayer films. For multilayers with thicknesses exceeding 10 nm, the molecules grow in a bulk-like structure with their long axes orientated upright to the substrate surface.


1995 ◽  
Vol 386 ◽  
Author(s):  
S. Vijayalakshmi ◽  
K.-T. Chen ◽  
M. A. George ◽  
A. Burger ◽  
W. E. Collins

ABSTRACTZnxCd1-xTe is a widely used substrate for the epitaxial growth of HgCdTe, which is used in infrared detectors. Results of the effect of sputtering of ZnxCd1-xTe single crystals with low energy Ar beam are reported in this paper. X-ray photoelectron spectroscopy (XPS) and photoluminescence (PL) techniques were used to measure the concentration of Zn in these crystals. Selective sputtering of Zn atoms has been observed from freshly cleaved crystals using XPS studies. Sputtering is a common method of cleaning ZnxCd1-xTe crystals in their device preparation and our studies show that this method of cleaning alters the surface which may introduce lattice mismatch on the surface. Surface morphology before and after cleaving the crystals is studied using Atomic Force Microscopy (AFM).


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