Synthesis and Photophysical Study of Divalent Complexes of Chelating Schiff Base

2020 ◽  
Vol 1 (01) ◽  
pp. 5-16
Author(s):  
Alaa A. Rashad ◽  
Farah Muaiad ◽  
Ahmed Ahmed ◽  
EkhlasA. Salman ◽  
Evon Akram
Keyword(s):  
Schiff Base ◽  
Surface Morphology ◽  
Theoretical Study ◽  
Energy Gap ◽  
Photophysical Properties ◽  
Schiff Base Complex ◽  
Tetrahedral Geometry ◽  
Force Microscopy ◽  
Atomic Force ◽  
Square Planar

 Background: Schiff base compounds derivative from1,2,4-triazole, and their transition metal complexes play an essential role in coordination and bioinorganic chemistry due to biological and industrial applications. Objective: The work aims to prepare and characterize of 1, 2, 4-triazole Schiff base and its complexes with a theoretical study using  PM3 calculation and HyperChem program, photophysical properties, and surface morphology for these complexes. Methods: 1, 2, 4-triazole Schiff base prepared by condensation reaction between  4-Amino-3-mercapto-5-phenyl-4H-1,2,4-triazole and 2-hydroxy-1-naphthaldehyde, then Schiff base reacted with Co2+, Ni2+,  and Cu2+ ions,   the synthesized 1, 2, 4-triazole Schiff base, and its complexes were characterized by infrared spectra, magnetic susceptibility, conductivity measurements, photophysical properties, and surface morphology measured by atomic force microscopy. The practical results were reinforced with a theoretical study for these Schiff base complexes. Then the proposed structures of the prepared complexes. Results: 1, 2, 4-triazole Schiff base act as a chelate ligand. The coordination has occurred through the oxygen of the phenolic group O-H and the nitrogen of the imine group N=C of Schiff base with divalent metal ions. Cobalt complex has a tetrahedral geometry, while the nickel and copper complexes have square planar geometries. The stability of all compounds was studied by calculating the energy gap by diffuse reflectance spectroscopy and theoretical calculations. Copper Schiff base is a more stable complex due to the lower value of the energy gap, and the copper Schiff base complex is more semiconductivity than the other complexes. Surface morphology, properties of chelating  Schiff base ligand and its complexes measured by atomic force microscopy, cobalt Schiff base complex is higher roughness. The bond length of (-C=N-), (-C-O-),(M-O), and (M-N)  are affected in the coordination with metal ions, the bond length of the square planar geometry more affected than tetrahedral geometry. Conclusion: All compounds were prepared successfully, characterized, and photophysical properties were studied.  

scholarly journals Synthesis and Photophysical Study of Divalent Complexes of Chelating Schiff Base

2020 ◽  
Vol 1 (01) ◽  
pp. 5-16
Author(s):  
Alaa A. Rashad ◽  
Farah Muaiad ◽  
Ahmed Ahmed ◽  
Ekhlas A. Salman ◽  
Evon Akram
Keyword(s):  
Schiff Base ◽  
Surface Morphology ◽  
Theoretical Study ◽  
Energy Gap ◽  
Photophysical Properties ◽  
Schiff Base Complex ◽  
Tetrahedral Geometry ◽  
Force Microscopy ◽  
Atomic Force ◽  
Square Planar

 Background: Schiff base compounds derivative from1,2,4-triazole, and their transition metal complexes play an essential role in coordination and bioinorganic chemistry due to biological and industrial applications. Objective: The work aims to prepare and characterize of 1, 2, 4-triazole Schiff base and its complexes with a theoretical study using  PM3 calculation and HyperChem program, photophysical properties, and surface morphology for these complexes. Methods: 1, 2, 4-triazole Schiff base prepared by condensation reaction between  4-Amino-3-mercapto-5-phenyl-4H-1,2,4-triazole and 2-hydroxy-1-naphthaldehyde, then Schiff base reacted with Co2+, Ni2+,  and Cu2+ ions,   the synthesized 1, 2, 4-triazole Schiff base, and its complexes were characterized by infrared spectra, magnetic susceptibility, conductivity measurements, photophysical properties, and surface morphology measured by atomic force microscopy. The practical results were reinforced with a theoretical study for these Schiff base complexes. Then the proposed structures of the prepared complexes. Results: 1, 2, 4-triazole Schiff base act as a chelate ligand. The coordination has occurred through the oxygen of the phenolic group O-H and the nitrogen of the imine group N=C of Schiff base with divalent metal ions. Cobalt complex has a tetrahedral geometry, while the nickel and copper complexes have square planar geometries. The stability of all compounds was studied by calculating the energy gap by diffuse reflectance spectroscopy and theoretical calculations. Copper Schiff base is a more stable complex due to the lower value of the energy gap, and the copper Schiff base complex is more semiconductivity than the other complexes. Surface morphology, properties of chelating  Schiff base ligand and its complexes measured by atomic force microscopy, cobalt Schiff base complex is higher roughness. The bond length of (-C=N-), (-C-O-),(M-O), and (M-N)  are affected in the coordination with metal ions, the bond length of the square planar geometry more affected than tetrahedral geometry. Conclusion: All compounds were prepared successfully, characterized, and photophysical properties were studied.

Etching Treatment Effect on Surface Morphology of Dental Structures

2017 ◽  
Vol 68 (11) ◽  
pp. 2700-2703 ◽  
Author(s):  
Kamel Earar ◽  
Vasile Iulian Antoniac ◽  
Sorana Baciu ◽  
Simion Bran ◽  
Florin Onisor ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Surface Morphology ◽  
Phosphoric Acid ◽  
Human Teeth ◽  
Strong Bond ◽  
Force Microscopy ◽  
Atomic Force ◽  
Human Dentine ◽  
Dental Surface ◽  
Scanning Electron

This study examined and compared surface of human dentine after acidic etching with hydrogen peroxide, phosphoric acid liquid and gel. Surface demineralization of dentin is necessary for a strong bond of adhesive at dental surface. Split human teeth were used. After application of mentioned substances at dentin level measures of the contact angle and surface morphology were employed. Surface morphology was analyzed with the help of scanning electron microscopy and atomic force microscopy. Liquid phosphoric acid yielded highest demineralization showing better hydrophobicity than the rest, thus having more contact surface. Surface roughness are less evident and formed surface micropores of 4 �m remained open after wash and air dry providing better adhesive canalicular penetration and subsequent bond.

Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy

1992 ◽  
Author(s):  
Mark R. Kozlowski ◽  
Michael C. Staggs ◽  
Mehdi Balooch ◽  
Robert J. Tench ◽  
Wigbert J. Siekhaus
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Dielectric Mirror ◽  
Atomic Force

Surface morphology studies on sublimation grown GaN by atomic force microscopy

1999 ◽  
Vol 200 (3-4) ◽  
pp. 348-352 ◽  
Author(s):  
R.S Qhalid Fareed ◽  
S Tottori ◽  
K Nishino ◽  
S Sakai
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Atomic Force

Stress Relaxation in Uniquely Oriented SiGe/Si Epitaxial Layers

1999 ◽  
Vol 594 ◽  
Author(s):  
M. E. Ware ◽  
R. J. Nemanich
Keyword(s):  
Stress Relaxation ◽  
Surface Morphology ◽  
Strain Relaxation ◽  
Epitaxial Layers ◽  
Misfit Dislocations ◽  
Strained Layers ◽  
Force Microscopy ◽  
Si Substrates ◽  
Atomic Force ◽  
Deposited Films

AbstractThis study explores stress relaxation of epitaxial SiGe layers grown on Si substrates with unique orientations. The crystallographic orientations of the Si substrates used were off-axis from the (001) plane towards the (111) plane by angles, θ = 0, 10, and 22 degrees. We have grown 100nm thick Si(1−x) Ge(x) epitaxial layers with x=0.3 on the Si substrates to examine the relaxation process. The as-deposited films are metastable to the formation of strain relaxing misfit dislocations, and thermal annealing is used to obtain highly relaxed films for comparison. Raman spectroscopy has been used to measure the strain relaxation, and atomic force microscopy has been used to explore the development of surface morphology. The Raman scattering indicated that the strain in the as-deposited films is dependent on the substrate orientation with strained layers grown on Si with 0 and 22 degree orientations while highly relaxed films were grown on the 10 degree substrate. The surface morphology also differed for the substrate orientations. The 10 degree surface is relatively smooth with hut shaped structures oriented at predicted angles relative to the step edges.

Chromic Polydiacetylene Single Crystals: Atomic Force Microscopy Studies

1995 ◽  
Vol 413 ◽  
Author(s):  
V. Shivshankar ◽  
C. Sung ◽  
J. Kumar ◽  
S. K. Tripathy ◽  
D. J. Sandman
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Single Crystals ◽  
Ambient Conditions ◽  
Free Standing ◽  
Force Microscopy ◽  
Sensor Performance ◽  
Atomic Force ◽  
Variable Surface

ABSTRACTWe have studied the surface morphology of free standing single crystals of thermochromic polydiacetylenes (PDAs), namely, ETCD and IPUDO (respectively, the ethyl and isopropyl urethanes of 5,7-dodecadiyn-1,12-diol), by Atomic Force Microscopy (AFM) under ambient conditions. Micron scale as well as molecularly resolved images were obtained. The micron scale images indicate a variable surface, and the molecularly resolved images show a well defined 2-D lattice that is interpreted in terms of molecular models and known crystallographic data. Thereby information about surface morphology, which is crucial to potential optical device or chromic sensor performance is available. We also report the observation of a “macroscopic shattering” of the IPUDO monomer crystal during in-situ UV polymerization studies.

scholarly journals Photothermal Deflection Spectroscopy Study of Nanocrystalline Si (nc-Si) Thin Films Deposited on Porous Aluminum with PECVD

2012 ◽  
Vol 2012 ◽  
pp. 1-5 ◽  
Author(s):  
S. Ktifa ◽  
M. Ghrib ◽  
F. Saadallah ◽  
H. Ezzaouia ◽  
N. Yacoubi
Keyword(s):  
Optical Properties ◽  
Energy Gap ◽  
Chemical Vapor ◽  
Nanocrystalline Silicon ◽  
Porous Aluminum ◽  
Force Microscopy ◽  
Photothermal Deflection Spectroscopy ◽  
Atomic Force ◽  
Photothermal Deflection ◽  
Morphology Characterization

We have studied the optical properties of nanocrystalline silicon (nc-Si) film deposited by plasma enhancement chemical vapor deposition (PECVD) on porous aluminum structure using, respectively, the Photothermal Deflection Spectroscopy (PDS) and Photoluminescence (PL). The aim of this work is to investigate the influence of anodisation current on the optical properties of the porous aluminum silicon layers (PASL). The morphology characterization studied by atomic force microscopy (AFM) technique has shown that the grain size of (nc-Si) increases with the anodisation current. However, a band gap shift of the energy gap was observed.

scholarly journals The effect of replacing iron atoms instead of zinc of the quaternary compound CZTS

2021 ◽  
Vol 2114 (1) ◽  
pp. 012033
Author(s):  
Abubaker.S. Mohammed
Keyword(s):  
Full Width Half Maximum ◽  
Energy Gap ◽  
Film Surface ◽  
X Ray Diffraction ◽  
Quaternary Compound ◽  
Force Microscopy ◽  
Atomic Force ◽  
Coating Method ◽  
Degree Of Crystallization ◽  
High Degree

Abstract In this article, the quaternary compound Cu2MSnS4 was prepared in a simple and inexpensive approach, where M is the iron (Fe) and zinc (Zn) atoms by the spin coating method on a glass substrate at room temperature (RT), as a result of replacing Zn atoms by Fe. Quaternary Cu2ZnSnS4 (CZTS) and Cu2FeSrS4 (CFTS) structural and optical properties have been studied successfully. The material has been identified by X-ray diffraction, and it was discovered that CZTS has a polycrystalline Tetragonal (kesterite) structure, whereas CFTS has a Tetragonal (stannite) structure. A reduction in the full width half maximum (FWHM) of the preferred plane implies a high degree of crystallization. The structural properties of the film surface, such as grain size and roughness, were studied by Atomic force microscopy (AFM). The results explain an increase in nanoparticle size and surface roughness when Fe is substituted by Zn in the CZTS structure. The absorption coefficient values of all designed compounds in visible regions are greater than 104/cm, and the results show that the absorbance coefficient increases with Fe add. The CZTS films showed an energy gap of 1.88 eV, and this value became 1.69 eV with substituted Fe instead of Zn.

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