An Auger Depth Profile Study of Corrosion-Inhibiting Films Formed Under Cooling Water Conditions

CORROSION ◽  
1989 ◽  
Vol 45 (5) ◽  
pp. 420-428 ◽  
Author(s):  
J. Schreifels ◽  
P. Labine ◽  
R. Gailey ◽  
S. Goewert ◽  
M. O'Brien ◽  
...  
Keyword(s):  
Depth Profile ◽  
Cooling Water ◽  
Auger Depth Profile ◽  
Water Conditions ◽  
Profile Study

Low‐temperature Auger depth profile study of HgCdTe double‐layer heterojunction

1988 ◽  
Vol 6 (4) ◽  
pp. 2637-2639 ◽  
Author(s):  
Eun‐Hee Cirlin ◽  
Steve Buckingham ◽  
Philip Ireland ◽  
Joe Rosbeck ◽  
Carol Crosson
Keyword(s):  
Low Temperature ◽  
Double Layer ◽  
Depth Profile ◽  
Auger Depth Profile ◽  
Profile Study

Depth profile study of polyaniline films by photoacoustic spectroscopy

2005 ◽  
Vol 125 ◽  
pp. 63-65 ◽  
Author(s):  
J. E. de Albuquerque ◽  
D. T. Balogh ◽  
R. M. Faria
Keyword(s):  
Depth Profile ◽  
Photoacoustic Spectroscopy ◽  
Polyaniline Films ◽  
Profile Study

An X-ray photoelectron spectroscopy depth profile study on the InGeNi/(110) cleaved GaAs structure

2018 ◽  
Vol 82 ◽  
pp. 62-66 ◽  
Author(s):  
Constantin Catalin Negrila ◽  
Mihail Florin Lazarescu ◽  
Constantin Logofatu ◽  
Rodica V. Ghita ◽  
Costel Cotirlan
Keyword(s):  
Depth Profile ◽  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Gaas Structure ◽  
Profile Study

A depth profile study of the structure and strain distribution in chemically grown Cu films on AlN

1999 ◽  
Vol 12 (5-8) ◽  
pp. 653-656 ◽  
Author(s):  
L.J. Martínez-Miranda ◽  
Yiqun Li ◽  
G.M. Chow ◽  
L.K. Kurihara
Keyword(s):  
Depth Profile ◽  
Strain Distribution ◽  
Cu Films ◽  
Profile Study

YBa2Cu3O7−x THIN FILMS GROWN ON SAPPHIRE WITH EPITAXIAL YTTRIA-STABILIZED ZrO2 BUFFER LAYER

1993 ◽  
Vol 07 (27) ◽  
pp. 1741-1746
Author(s):  
S.F. XU ◽  
Y.J. TIAN ◽  
H.B. LÜ ◽  
Y.L. ZHOU ◽  
Z.H. CHEN ◽  
...  
Keyword(s):  
Thin Films ◽  
Buffer Layer ◽  
Depth Profile ◽  
Ybco Film ◽  
Ybco Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
Auger Depth Profile ◽  
Zero Resistance ◽  
Influence Of Substrate

We have successfully fabricated high-quality YBa 2 Cu 3 O 7−x (YBCO) thin films grown on sapphire with epitaxial Yttria-Stabilized ZrO 2 (YSZ) buffer layer by pulsed laser deposition. X-ray diffraction and Auger depth profile were used to characterize these thin films. The values of zero-resistance temperature Tco and critical current density J c (at 77 K) of c-axis oriented YBCO thin film with 500 Å-YSZ buffer layer were 91 K and 2.2×106 A/cm 2, respectively. The Auger depth profile showed that no obvious diffusion occurred between the buffer layer and the YBCO film. The influence of substrate temperature and thickness of buffer layer has been investigated.

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