scholarly journals Elimination of Potential Pathogenic Microorganisms in Sewage Sludge Using Electron Beam Irradiation

10.5772/62705 ◽  
2016 ◽  
Author(s):  
Jean Engohang-Ndong ◽  
Roberto M. Uribe
Keyword(s):  
Electron Beam ◽  
Sewage Sludge ◽  
Electron Beam Irradiation ◽  
Pathogenic Microorganisms ◽  
Beam Irradiation

Effect of electron beam irradiation on bacterial and Ascaris ova loads and volatile organic compounds in municipal sewage sludge

2015 ◽  
Vol 112 ◽  
pp. 6-12 ◽  
Author(s):  
Jean Engohang-Ndong ◽  
R.M. Uribe ◽  
Roger Gregory ◽  
Mahinda Gangoda ◽  
Mike G. Nickelsen ◽  
...  
Keyword(s):  
Electron Beam ◽  
Volatile Organic Compounds ◽  
Sewage Sludge ◽  
Organic Compounds ◽  
Electron Beam Irradiation ◽  
Municipal Sewage ◽  
Municipal Sewage Sludge ◽  
Beam Irradiation ◽  
Volatile Organic

scholarly journals Irradiation of Sewage Sludge

2021 ◽  
Author(s):  
Roberto M. Uribe ◽  
Jean Engohang-Ndong
Keyword(s):  
Electron Beam ◽  
Sewage Sludge ◽  
Environmental Protection Agency ◽  
Electron Beam Irradiation ◽  
Current Status ◽  
Municipal Sewage ◽  
Municipal Sewage Sludge ◽  
Beam Irradiation ◽  
Typical Sample ◽  
Quality Control Techniques

A review of the current status of sewage sludge decontamination using electron beam irradiation at industrial scale is presented. The chapter includes a historical development of the technology using both gamma and electron beam sources, a description of a facility using an electron accelerator, a discussion of the quality control techniques used to certify that satisfactory decontamination levels for safe use of treated sludge have been achieved, the effect of electron beam irradiation on the bacteria and virus present in a typical sample of municipal sewage sludge, and an analysis of the costs of decontaminating sewage sludge using electron beam irradiation compared to traditional and more routine technologies. Finally, the chapter concludes by emphasizing on the fact that electron accelerators described in this chapter are capable to decontaminate a typical municipal sewage sludge at competitive costs which are shown to be comparable and/or lower than routinely used technologies to achieve class A biosolids by the Environmental Protection Agency standards.

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

Development and Characteristics of Pulsed Radiation Source Generated by Electron Beam Irradiation using Intense Pulsed Power Generator

2019 ◽  
Vol 139 (10) ◽  
pp. 435-436
Author(s):  
Kenji Kashine ◽  
Fumihiro Tamura ◽  
Takashi Kikuchi ◽  
Weihua Jiang
Keyword(s):  
Electron Beam ◽  
Radiation Source ◽  
Electron Beam Irradiation ◽  
Pulsed Power ◽  
Beam Irradiation ◽  
Power Generator ◽  
Pulsed Power Generator

A Study of Electron Beam Irradiation Influence on Device Contact Junction Characteristics of Advanced DRAM Using Atomic Force Probing

2013 ◽  
Author(s):  
Wei-Chih Wang ◽  
Jian-Shing Luo
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Forward Bias ◽  
Irradiation Damage ◽  
Beam Irradiation ◽  
Excess Current ◽  
Atomic Force ◽  
Order Of Magnitude ◽  
Voltage Contrast ◽  
Acceleration Voltage

Abstract In this paper, we revealed p+/n-well and n+/p-well junction characteristic changes caused by electron beam (EB) irradiation. Most importantly, we found a device contact side junction characteristic is relatively sensitive to EB irradiation than its whole device characteristic; an order of magnitude excess current appears at low forward bias region after 1kV EB acceleration voltage irradiation (Vacc). Furthermore, these changes were well interpreted by our Monte Carlo simulation results, the Shockley-Read Hall (SRH) model and the Generation-Recombination (G-R) center trap theory. In addition, four essential examining items were suggested and proposed for EB irradiation damage origins investigation and evaluation. Finally, by taking advantage of the excess current phenomenon, a scanning electron microscope (SEM) passive voltage contrast (PVC) fault localization application at n-FET region was also demonstrated.

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