Investigation on Solid Phase Crystallization of Silicon films Deposited on Different Substrates

Author(s):  
Qingdong Chen
1998 ◽  
Vol 135 (1-4) ◽  
pp. 205-208 ◽  
Author(s):  
Yongqian Wang ◽  
Xianbo Liao ◽  
Zhixun Ma ◽  
Guozhen Yue ◽  
Hongwei Diao ◽  
...  

2011 ◽  
Vol 287-290 ◽  
pp. 1352-1355
Author(s):  
Qing Dong Chen ◽  
Jun Ping Wang ◽  
Yu Xiang Zhang

Porous silicon were prepared by electrochemical corrosion. Undoped and boron doped silicon films were deposited on quartz substrate、porous silicon and silicon substrate by PECVD,and were solid phase crystallized at different temperature and different hours. The microstructure of films before and after annealing were studied by Raman and XRD. The results show that:the crystallization of films deposited on porous silicon and monocrystalline silicon substrate are better than quartz substrate; The substrate which has silicon crystal lattice play an important role of seed crystal in the solid phase crystallization, the same grain orientation film can be grown on certain condition.


Author(s):  
Curtis Anderson ◽  
Lin Cui ◽  
Uwe Kortshagen

This paper describes the rapid formation of polycrystalline silicon films through seeding with silicon nanocrystals. The incorporation of seed crystals into amorphous silicon films helps to eliminate the crystallization incubation time observed in non-seeded amorphous silicon films. Furthermore, the formation of several tens of nanometer in diameter voids is observed when cubic silicon nanocrystals with around 30 nm in size are embedded in the amorphous films. These voids move through the amorphous film with high velocity, pulling behind them a crystallized “tail.” This mechanism leads to rapid formation of polycrystalline films.


1984 ◽  
Vol 38 ◽  
Author(s):  
T. D. Moustakas ◽  
D. A. Weitz ◽  
E. B. Prestridge ◽  
R. Friedman

AbstractA number of microcrystalline silicon films have been deposited by RF sputtering and their structure was investigated by Raman spectroscopy, X-ray scattering, SEM, TEM and IR spectroscopy. The interpretation of these results suggests that the film growth proceeds initially via amorphous island formation and that the degree of crystallization of the final film depends on subsequent solid phase crystallization during the time of growth. The size and the preferred orientation of the crystallites correlates with the columnar growth habit of the films while the rest of the amorphous matrix is shown to exhibit a considerable degree of order.


1989 ◽  
Vol 40 (11) ◽  
pp. 7655-7662 ◽  
Author(s):  
R. Bisaro ◽  
J. Magariño ◽  
Y. Pastol ◽  
P. Germain ◽  
K. Zellama

2021 ◽  
Vol 121 ◽  
pp. 105357
Author(s):  
Hoa Thi Khanh NGUYEN ◽  
Hiroaki Hanafusa ◽  
Yuri Mizukawa ◽  
Shohei Hayashi ◽  
Seiichiro Higashi

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