Mobility Degradation Induced by Substrate-Hot-Electron Generated Interface Traps at Different Stress Voltages and Temperatures
2013 ◽
Vol 740-742
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pp. 533-536
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2017 ◽
Vol 17
(2)
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pp. 422-431
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2002 ◽
Vol 5
(4)
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pp. G26
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Keyword(s):
1995 ◽
Vol 38
(1)
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pp. 105-113
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2004 ◽
Vol 51
(9)
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pp. 1496-1503
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1987 ◽
Vol 8
(12)
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pp. 566-568
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2014 ◽
Vol 61
(12)
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pp. 4282-4290
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Keyword(s):
Keyword(s):