Visualizing nanometric structures with sub-millimeter waves

The resolution along the propagation direction of far field imagers can be much smaller than the wavelength by exploiting coherent interference phenomena. We demonstrate a height profile precision as low as 31 nm using wavelengths between 0.375 mm and 0.5 mm (corresponding to 0.6 THz–0.8 THz) by evaluating the Fabry-Pérot oscillations within surface-structured samples. We prove the extreme precision by visualizing structures with a height of only 49 nm, corresponding to 1:7500 to 1:10000 vacuum wavelengths, a height difference usually only accessible to near field measurement techniques at this wavelength range. At the same time, the approach can determine thicknesses in the centimeter range, surpassing the dynamic range of any near field measurement system by orders of magnitude. The measurement technique combined with a Hilbert-transform approach yields the (optical) thickness extracted from the relative phase without any extraordinary wavelength stabilization.

Visualizing nanometric structures with sub-millimeter waves

The resolution along the propagation direction of far field imagers can be much smaller than the wavelength by exploiting coherent interference phenomena. We demonstrate a height profile precision as low as 31 nm using wavelengths between 0.375 mm and 0.5 mm (corresponding to 0.6 THz-0.8 THz) by evaluating the Fabry-Pérot oscillations within surface-structured samples. We prove the extreme precision by visualizing structures with a height of only 49 nm, corresponding to 1:7500 to 1:10000 vacuum wavelengths, a height difference usually only accessible to near field measurement techniques at this wavelength range. This precision surpasses the state-of-the-art by 1-2 orders of magnitude. At the same time, the approach can determine thicknesses in the centimeter range, surpassing the dynamic range of any near field measurement system by orders of magnitude. The measurement technique combined with a Hilbert-transform approach yields the (optical) thickness extracted from the relative phase without any extraordinary wavelength stabilization.

Real-Time Correction and Stabilization of Laser Diode Wavelength in Miniature Homodyne Interferometer for Long-Stroke Micro/Nano Positioning Stage Metrology

A low-cost miniature homodyne interferometer (MHI) with self-wavelength correction and self-wavelength stabilization is proposed for long-stroke micro/nano positioning stage metrology. In this interferometer, the displacement measurement is based on the analysis of homodyne interferometer fringe pattern. In order to miniaturize the interferometer size, a low-cost and small-sized laser diode is adopted as the laser source. The accuracy of the laser diode wavelength is real-time corrected by the proposed wavelength corrector using a modified wavelength calculation equation. The variation of the laser diode wavelength is suppressed by a real-time wavelength stabilizer, which is based on the principle of laser beam drift compensation and the principle of automatic temperature control. The optical configuration of the proposed MHI is proposed. The methods of displacement measurement, wavelength correction, and wavelength stabilization are depicted in detail. A laboratory-built prototype of the MHI is constructed, and experiments are carried out to demonstrate the feasibility of the proposed wavelength correction and stabilization methods.