Non-perpendicular incidence angle of cold atmospheric-pressure plasma treatment for fabrication of silver-based surface plasmon resonance biosensor for detection of Escherichia coli in water

In this study, for the first time, to our knowledge, a biosensor was produced using cold atmospheric plasma (CAP) treatment of silver thin film surface with non-perpendicular incidence angle for identification of Escherichia coli in the distilled water. Field emission scanning electron microscopy (FESEM) exhibits that before deposition, non-perpendicular CAP treatment of glass surface substrate leads to the production of pinhole-free silver thin film. The results of atomic force microscopy (AFM), and curve fitting show that non-perpendicular CAP treatment of this pinhole-free silver thin film indicates to the appearance of Ag NPs with smaller size and larger surface area compared to untreated silver film deposited on the untreated glass substrate. The silver-based pinhole-free SPR biosensor produced with non-perpendicular CAP treatment of both glass substrate and silver film shows E. coli detection in the distilled water in the range of 104 Colony forming unit (CFU/ml) to 108 CFU/ml with better sensitivity compared to the untreated silver-based SPR biosensor.

THz-TDS Reflection Measurement of Coating Thicknesses at Non-Perpendicular Incidence: Experiment and Simulation

Time-domain spectroscopy (TDS) in the terahertz (THz) frequency range is gaining in importance in nondestructive testing of dielectric materials. One application is the layer thickness measurement of a coating layer. To determine the thickness from the measurement data, the refractive index of the coating layer must be known in the surveyed frequency range. For perpendicular incidence of the radiation, methods exist to extract the refractive index from the measurement data themselves without prior knowledge. This paper extends these methods for non-perpendicular incidence, where the polarization of the radiation becomes important. Furthermore, modifications considering effects of surface roughness of the coating are introduced. The new methods are verified using measurement data of a sample of Inconel steel coated with yttria-stabilized zirconia (YSZ) and with COMSOL simulations of the measurement setup. To validate the thickness measurements, scanning electron microscopy (SEM) images of the layer structure are used. The results show good agreement with an average error of 1% for the simulation data and under 4% for the experimental data compared to reference measurements.

THz-TDS Reflection Measurement of Coating Thicknesses at Non-Perpendicular Incidence: Experiment and Simulation

Time-domain spectroscopy (TDS) in the Terahertz (THz) frequency range is gaining in importance in nondestructive testing of dielectric materials. One application is the layer thickness measurement of a coating layer. To determine the thickness from the measurement data, the refractive index of the coating layer must be known in the surveyed frequency range. For perpendicular incidence of the radiation, methods exist to extract the refractive index from the measurement data itself without prior knowledge. This paper extends these methods for non-perpendicular incidence, where the polarization of the radiation becomes important. Furthermore, modifications considering effects of surface roughness of the coating are introduced. The new methods are verified using measurement data of a sample of Inconel steel coated with yttria-stabilized zirconia (YSZ) and with COMSOL simulations of the measurement setup. To validate the thickness measurements, scanning electron microscopy (SEM) images of the layer structure are used. The results show good agreement with an average error of 1% for the simulation data and under 4% for the experimental data compared to reference measurements.

The Infrared Optical Properties of Al0.5In0.5Sb Alloy With Nano Coatings

In this article, the SiC/Nano GaAs and SiC/Nano InP coatings on Al0.5In0.5Sb alloy are investigated in a theoretical framework. A Special program code written by MATLAB version 10 was performed to describe the reflectivity of coatings as a function of the nano-particles sizes, refractive index, and energy gap. This program is based on the Brus model and the Characteristic Matrix Theory. The results connected with nano-particle size of 3.6 nm in multilayer coatings indicate that our designs achieve high reflectivity. Such as, with six layers, the Air/SiC/Nano GaAs/Al0.5In0.5Sb design gives the reflectivity for S-Polarization Rs=99.9% and for P-Polarization Rp=98.0% for oblique incidence of ????=45° and R=99.9% for the perpendicular incidence. Similarly, the Air/SiC/Nano InP/Al0.5In0.5Sb gives Rs=99.9% and Rp=98.5% for oblique incidence of ????=45° and R=99.8% for the perpendicular incidence. This study set out with the aim of assessing the importance of Air/SiC/Nano GaAs/Al0.5In0.5Sb composition in industrial applications as a highly reflective coating for CO2 laser resonators in the far infrared region.

Performance of the CAPRICE94 RICH Detector during the 1994 Balloon Flight

A RICH detector capable of detecting unit charged particles, e.g. antiprotons and positrons, was in 1994 used successfully for the first time in a balloon borne magnet spectrometer. The thin and compact CAPRICE94 RICH detector uses a NaF solid radiator, TMAE vapor as photo-converter and cathode pad readout in the photosensitive MWPC operated at low gain. 15 photoelectrons are detected per ring for ß = 1, perpendicular incidence particles giving a resolution on the Cherenkov angle of 8 mrad, increasing to 14 mrad at 20oC incidence angle. Besides particle identification on an event-by-event basis it efficiently rejects multiparticle events and albedo particles (Barbiellini, 1996).

Characteristics Analysis of Solar Radiation Distribution in Hefei Region

The paper analyzes the hourly variation of total solar radiation, total perpendicular incidence and radiation intensity of Hefei region in typical years. The change characteristics of total solar radiation and total perpendicular incidence in Hefei region are discussed in the paper. Chose seven cities in different resource areas and Hefei region and compared with the resource situation of solar energy, the paper discovers the distribution regularity of solar radiation intensity in Hefei region, then points out the solar resources are relatively rich in spite of Hefei is located in common solar resource belt area.