scholarly journals Three Dimensional X-ray Diffraction Contrast Tomography Reconstruction of Polycrystalline Strontium Titanate during Sintering and Electron Backscatter Diffraction Validation

Author(s):  
M. Syha ◽  
W. Rheinheimer ◽  
B. Loedermann ◽  
A. Graff ◽  
A. Trenkle ◽  
...  
2008 ◽  
Vol 41 (2) ◽  
pp. 310-318 ◽  
Author(s):  
Greg Johnson ◽  
Andrew King ◽  
Marcelo Goncalves Honnicke ◽  
J. Marrow ◽  
Wolfgang Ludwig

By simultaneous acquisition of the transmitted and the diffracted beams, the applicability of the previously introduced diffraction contrast tomography technique [Ludwig, Schmidt, Lauridsen & Poulsen (2008).J. Appl. Cryst.41, 302–309] can be extended to the case of undeformed polycrystalline samples containing more than 100 grains per cross section. The grains are still imaged using the occasionally occurring diffraction contribution to the X-ray attenuation coefficient, which can be observed as a reduction in the intensity of the transmitted beam when a grain fulfils the diffraction condition. Automating the segmentation of the extinction spot images is possible with the additional diffracted beam information, even in the presence of significant spot overlap. By pairing the corresponding direct (`extinction') and diffracted beam spots a robust sorting and indexing approach has been implemented. The analysis procedure is illustrated on a real data set and the result is validated by comparison with a two-dimensional grain map obtained by electron backscatter diffraction.


2013 ◽  
Vol 46 (4) ◽  
pp. 1145-1150 ◽  
Author(s):  
Melanie Syha ◽  
Andreas Trenkle ◽  
Barbara Lödermann ◽  
Andreas Graff ◽  
Wolfgang Ludwig ◽  
...  

Microstructure reconstructions resulting from diffraction contrast tomography data of polycrystalline bulk strontium titanate were reinvestigated by means of electron backscatter diffraction (EBSD) characterization. Corresponding two-dimensional grain maps from the two characterization methods were aligned and compared, focusing on the spatial resolution at the internal interfaces. The compared grain boundary networks show a remarkably good agreement both morphologically and in crystallographic orientation. Deviations are critically assessed and discussed in the context of diffraction data reconstruction and EBSD data collection techniques.


Metals ◽  
2020 ◽  
Vol 10 (3) ◽  
pp. 406
Author(s):  
Samiha Saad ◽  
Zakaria Boumerzoug ◽  
Anne Laure Helbert ◽  
François Brisset ◽  
Thierry Baudin

The objective of this work is to study, on a copper wire, the effect of TiO2-nanoparticles on electrodeposited nickel. Both the microstructure and surface morphology (texture) of the coating were investigated. This deposit is obtained from baths of sulfated electroplating Watts. The Ni-TO2 composite coating is deposited at a temperature of 45 °C. The composite deposit is prepared by adding nanoparticles of TiO2 to the electrolyte. The characterization has been carried out by X-ray diffraction, scanning electron microscopy, microhardness measurements, and electron backscatter diffraction (EBSD). Vickers microhardness was used to characterize the mechanical properties of the electrodeposited nickel. The results showed the effects of the TiO2 on the composition, the surface morphology, and the hardness of the deposited layer. However, there was not an effect of TiO2 nanoparticles on texture.


2011 ◽  
Vol 11 (10) ◽  
pp. 4660-4666 ◽  
Author(s):  
Wolfgang Wisniewski ◽  
Carlos André Baptista ◽  
Matthias Müller ◽  
Günter Völksch ◽  
Christian Rüssel

2021 ◽  
Vol 7 (2) ◽  
Author(s):  
D. Marušáková ◽  
C. Aparicio ◽  
R. Fukač

Abstract Alloy 800H is a candidate material for supercritical water-cooled reactors (SCWR), specifically for in-core components in Canadian-type SCWR, that will operate at a pressure of 25 MPa and a core temperature from 350 °C to 625 °C. To evaluate this, several exposures to supercritical water took place at 395 °C and 25 MPa in a supercritical water loop (SCWL). The duration of each exposure was 500, 150, and 1000 h. Scanning electron microscopy (SEM) with electron backscatter diffraction (EBSD), in combination with Raman spectroscopy (RS) and X-ray diffraction (XRD), was used to evaluate the microstructure of alloy 800H after the exposures to supercritical water. All these methods confirmed the presence of magnetite and trevorite/chromite crystals, with a thickness of less than 1 μm, on the surface after each exposure. No significant change occurred after the second and third exposures. The matrix crystallography did not change during the exposures and demonstrated grain twinning with a grain size of 100–400 μm.


2016 ◽  
Vol 858 ◽  
pp. 147-150 ◽  
Author(s):  
Mojmír Meduňa ◽  
Thomas Kreiliger ◽  
Ivan Prieto ◽  
Marco Mauceri ◽  
Marco Puglisi ◽  
...  

The stacking faults (SFs) in 3C-SiC epitaxially grown on ridges deeply etched into Si (001) substrates offcut towards [110] were quantitatively analyzed by electron microscopy and X-ray diffraction. A significant reduction of SF density with respect to planar material was observed for the {111} planes parallel to the ridges. The highest SF density was found in the (-1-11) plane. A previously observed defect was identified as twins by electron backscatter diffraction.


2019 ◽  
Vol 52 (2) ◽  
pp. 415-427 ◽  
Author(s):  
T. Skippon ◽  
L. Balogh ◽  
M. R. Daymond

Two methods for measuring dislocation density were applied to a series of plastically deformed tensile samples of Zircaloy-2. Samples subjected to plastic strains ranging from 4 to 17% along a variety of loading paths were characterized using both electron backscatter diffraction (EBSD) and synchrotron X-ray line profile analysis (LPA). It was found that the EBSD-based method gave results which were similar in magnitude to those obtained by LPA and followed a similar trend with increasing plastic strain. The effects of microscope parameters and post-processing of the EBSD data on dislocation density measurements are also discussed. The typical method for estimating uncertainty in dislocation density measured via EBSD was shown to be overly conservative, and a more realistic method of determining uncertainty is presented as an alternative.


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