The Role of Liquid Molding Compounds in the Success of Fan-Out Wafer-Level Packaging Technology

Author(s):  
Katsushi Kan ◽  
Michiyasu Sugahara ◽  
Markus Cichon
2012 ◽  
Vol 132 (8) ◽  
pp. 246-253 ◽  
Author(s):  
Mamoru Mohri ◽  
Masayoshi Esashi ◽  
Shuji Tanaka

2013 ◽  
Vol 21 (1) ◽  
pp. 215-219 ◽  
Author(s):  
M. Han ◽  
S. F. Wang ◽  
G. W. Xu ◽  
Le Luo

Author(s):  
Kavin Senthil Murugesan ◽  
Mykola Chernobryvko ◽  
Sherko Zinal ◽  
Marco Rossi ◽  
Ivan Ndip ◽  
...  

2017 ◽  
Vol 2017 (1) ◽  
pp. 000325-000330 ◽  
Author(s):  
Wei Zhao ◽  
Mark Nakamoto ◽  
Karthikeyan Dhandapani ◽  
Brian Henderson ◽  
Ron Lindley ◽  
...  

Abstract Electrical Chip Board Interaction (e-CBI) has emerged as a new risk in chip design as silicon die can directly interact with printed circuit board (PCB) in substrate-less wafer level packaging technology. To assess this risk Qualcomm Technologies, Inc. has converted an existing test chip to wafer level packaging technology. Both the measured data and simulation results show that e-CBI risk is significant and must be carefully managed.


Author(s):  
Marion Volpert ◽  
Abdenacer Aitmani ◽  
Adrien Gasse ◽  
Brigitte Soulier ◽  
Patrick Peray ◽  
...  

Author(s):  
P. Chang-Chien ◽  
X. Zeng ◽  
K. Tornquist ◽  
M. Nishimoto ◽  
M. Battung ◽  
...  

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