Technique for preparing cross-section transmission electron microscope specimens from ion-irradiated ceramics

1991 ◽  
Vol 19 (4) ◽  
pp. 452-460 ◽  
Author(s):  
S. J. Zinkle ◽  
C. P. Haltom ◽  
L. C. Jenkins ◽  
C. K. H. DuBose
2011 ◽  
Vol 17 (6) ◽  
pp. 889-895 ◽  
Author(s):  
Lynne M. Gignac ◽  
Surbhi Mittal ◽  
Sarunya Bangsaruntip ◽  
Guy M. Cohen ◽  
Jeffrey W. Sleight

AbstractThe ability to prepare multiple cross-section transmission electron microscope (XTEM) samples from one XTEM sample of specific sub-10 nm features was demonstrated. Sub-10 nm diameter Si nanowire (NW) devices were initially cross-sectioned using a dual-beam focused ion beam system in a direction running parallel to the device channel. From this XTEM sample, both low- and high-resolution transmission electron microscope (TEM) images were obtained from six separate, specific site Si NW devices. The XTEM sample was then re-sectioned in four separate locations in a direction perpendicular to the device channel: 90° from the original XTEM sample direction. Three of the four XTEM samples were successfully sectioned in the gate region of the device. From these three samples, low- and high-resolution TEM images of the Si NW were taken and measurements of the NW diameters were obtained. This technique demonstrated the ability to obtain high-resolution TEM images in directions 90° from one another of multiple, specific sub-10 nm features that were spaced 1.1 μm apart.


1994 ◽  
Vol 65 (20) ◽  
pp. 2553-2555 ◽  
Author(s):  
Takayuki Shibata ◽  
Atsushi Ono ◽  
Kenji Kurihara ◽  
Eiji Makino ◽  
Masayuki Ikeda

2003 ◽  
Vol 11 (1) ◽  
pp. 29-32 ◽  
Author(s):  
R. Beanland

AbstractCross-section transmission electron microscope (TEM) specimen preparation of Ill-V materials using conventional methods can be a painful and time-consuming activity, with a day or more from receipt of a sample to examination in the TEM being the norm. This article describes the cross-section TEM specimen preparation technique used at Bookham Caswell. The usual time from start to finish is <1 hour. Up to 10 samples can be prepared at once, depending upon sample type. Most of the tools used are widely available and inexpensive, making the technique ideal for use in institutions with limited resources.


Author(s):  
M. E. Twigg ◽  
E. D. Richmond

It is well established that microtwins play an important role in accommodating stresses that accompany the growth of Si on sapphire (SOS) for the (001)Si/(1012)sapphire hetero-epitaxial system. When examined in cross section along the <110> direction by the transmission electron microscope (TEM), microtwins corresponding to two of the four twinning systems are clearly visible. It is also apparent that one of the two twinning systems dominates. For the [110] beam direction, the (111) twinning system accounts for the majority of visible microtwins, whereas the (111) twinning system accounts for the minority. It is thought that the abundance of (111) twins is due to a coincidence between the (111) planes of the Si matrix and the (1232) planes of the sapphire substrate; there is also a coincidence between the (113) planes of the majority twinning system and the (0112) sapphire planes. There are no such coincidences, however, between the minority twinning system in Si and the sapphire substrate.


1992 ◽  
Vol 268 ◽  
Author(s):  
Mauro P. Otero ◽  
Charles W. Allen

ABSTRACTA special technique is described for in situ transmission electron microscope (TEM) experiments involving simultaneous ion irradiation, in which the resultant phenomena are observed as in a cross-section TEM specimen. That is, instead of ion-irradiating the film or foil specimen normal to the major surfaces and observing in plan view (i.e., in the same direction), the specimen is irradiated edge-on (i.e., parallel to the major surfaces) and is observed normal to the depth direction with respect to the irradiation. The results of amorphization of Si, irradiated in this orientation by 1 or 1.5 MeV Kr, are presented and briefly compared with the usual plan view observations. The limitations of the technique are discussed and several experiments which might profitably employ this technique are suggested.


Author(s):  
Russell L. Chapman ◽  
Margaret C. Henk

Transmission electron microscope studies of the quadriflagellate zoospores of the parasitic, subaerial green alga Cephaleuros virescens Kunze have provided a basis for comparison between these motile cells and biflagellate gametes previously examined.1 As seen in cross-section (Fig. 1), the four basal bodies form a trapezoid in which the two upper basal bodies are closer together than the two lower basal bodies. The basal bodies are parallel, overlapping, and interdigitated. Two flagella are inserted into either side of the apical papilla and terminate in diagonally opposed basal bodies. The bilaterally keeled flagella (Fig. 2) are often closely appressed thereby creating a biflagellate appearance. Each of the four basal bodies is associated with a microtubular spline which extends posteriorly beneath the plasmalemma. A densely stained flagellar cap is present at the end of each basal body and together with the terminal region of its spline, forms a multilayered structure (MLS). Although the MLSs associated with the two lower basal bodies (Fig. 3) are virtually identical to those found in the gametes, those associated with the upper basal bodies are morphologically different or positioned in such a manner that “typical” sectional views cannot be obtained. The observations reveal that although minor differences exist, the zoospores of Cephaleuros are similar to those of Phycopeltis,2 a related genus.


1991 ◽  
Vol 254 ◽  
Author(s):  
L. A. Giannuzzi ◽  
P. R. Howell ◽  
H. W. Pickering ◽  
W. R. Bidter

AbstractA preparation technique for the production of cross-sectional transmission electron microscope (TEM) samples from the interdiffusion regions of Fe-Zn binary couples is described. To alleviate the problem of unequal ion milling rates between the Fe and Zn, a 0.75mm thick Fe sheet has been double plated with a thick electrodeposited Zn coating to achieve a total couple thickness of ˜3mm. After slicing the couple in cross-section, the Fe region of the sample is dimpled to perforation near the Fe-Zn interface. Final thinning for TEM analysis is obtained by ion milling using a liquid nitrogen cold stage and sector speed control. The ion milling procedure is stopped when the perforated hole in the Fe-side of the couple extends through the faster eroding Zn-side of the interface. This technique, in modified form, is expected to be suitable for commercial steels coated with Zn-based alloys.


2013 ◽  
Vol 395-396 ◽  
pp. 179-183 ◽  
Author(s):  
Tsan Chu Lin ◽  
Y.C. Wang ◽  
Zhen Wang ◽  
Shou Yang Wang ◽  
Dau Chung Wang

For nanopore drilling in a membrane by transmission electron microscope, a straight through-pore is in general not the case of the fabrication result. For instance, a silicon nitride nanopore with an hourglass profile and a silicon oxide nanopore with a pyramid cross-section were reported in recent researches. The reason for not getting a straight through-pore by the electron drilling was analyzed. A hypothesis, which improving heat conduction property of the membrane would lead to a straight nanopore drilling, was proposed. And the hypothesis was confirmed true.


2003 ◽  
Vol 11 (6) ◽  
pp. 8-13 ◽  
Author(s):  
Nestor J. Zaluzec

Imaging of sub-micron , sub-surface features of thick optically dense materials at high resolution has always been a difficult and/or time consuming task in materials research. For the most part this role has been relegated to technologically complex and expensive instrumentation having highly penetrating radiation, such as the synchrotron- based Scanning Transmission X-ray Microscope (STXM) or involves the careful preparation of thin cross-section slices for study using the Transmission/Scanning Transmission Electron Microscope (TEM/STEM).


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